Method for forming a via in a substrate and substrate with a via
    1.
    发明申请
    Method for forming a via in a substrate and substrate with a via 有权
    在具有通孔的基板和基板中形成通孔的方法

    公开(公告)号:US20110048788A1

    公开(公告)日:2011-03-03

    申请号:US12583949

    申请日:2009-08-28

    Abstract: The present invention relates to a method for forming a via in a substrate and a substrate with a via. The method includes the following steps: (a) providing a substrate having a first surface and a second surface; (b) forming a groove that has a side wall and a bottom wall on the first surface of the substrate; (c) forming a conductive metal on the side wall and the bottom wall of the groove so as to form a central groove; (d) forming an annular groove that surrounds the conductive metal on the first surface of the substrate; (e) forming an insulating material in the central groove and the annular groove; and (f) removing part of the second surface of the substrate to expose the conductive metal and the insulating material.

    Abstract translation: 本发明涉及一种用于在基板和具有通孔的基板上形成通孔的方法。 该方法包括以下步骤:(a)提供具有第一表面和第二表面的基底; (b)在所述基板的第一表面上形成具有侧壁和底壁的凹槽; (c)在槽的侧壁和底壁上形成导电金属,以形成中心槽; (d)形成围绕所述基板的第一表面上的所述导电金属的环形槽; (e)在所述中央槽和所述环形槽中形成绝缘材料; 和(f)去除衬底的第二表面的一部分以暴露导电金属和绝缘材料。

    Method for forming a via in a substrate and substrate with a via
    3.
    发明授权
    Method for forming a via in a substrate and substrate with a via 有权
    在具有通孔的基板和基板中形成通孔的方法

    公开(公告)号:US08471156B2

    公开(公告)日:2013-06-25

    申请号:US12583949

    申请日:2009-08-28

    Abstract: The present invention relates to a method for forming a via in a substrate and a substrate with a via. The method includes the following steps: (a) providing a substrate; (b) forming a groove on a first surface of the substrate; (c) forming a conductive metal on the groove so as to form a central groove; (d) forming an annular groove that surrounds the conductive metal; (e) forming an insulating material in the central groove and the annular; groove; and (f) removing part of the substrate to expose the conductive metal and the insulating material.

    Abstract translation: 本发明涉及一种用于在基板和具有通孔的基板上形成通孔的方法。 该方法包括以下步骤:(a)提供衬底; (b)在所述基板的第一表面上形成凹槽; (c)在槽上形成导电金属以形成中心槽; (d)形成围绕所述导电金属的环形槽; (e)在中央槽和环形中形成绝缘材料; 槽; 和(f)去除衬底的一部分以暴露导电金属和绝缘材料。

    Method for forming vias in a substrate
    6.
    发明授权
    Method for forming vias in a substrate 有权
    在基板中形成通孔的方法

    公开(公告)号:US08524602B2

    公开(公告)日:2013-09-03

    申请号:US12876721

    申请日:2010-09-07

    Applicant: Meng-Jen Wang

    Inventor: Meng-Jen Wang

    CPC classification number: H01L21/76898

    Abstract: The present invention relates to a method for forming vias in a substrate, including the following steps: (a) providing a substrate having a first surface and a second surface; (b) forming a groove on the substrate; (c) filling the groove with a conductive metal; (d) removing part of the substrate which surrounds the conductive metal, wherein the conductive metal is maintained so as to form an accommodating space between the conductive metal and the substrate; (e) forming an insulating material in the accommodating space; and (f) removing part of the second surface of the substrate to expose the conductive metal and the insulating material. In this way, thicker insulating material can be formed in the accommodating space, and the thickness of the insulating material in the accommodating space is even.

    Abstract translation: 本发明涉及一种在衬底中形成通孔的方法,包括以下步骤:(a)提供具有第一表面和第二表面的衬底; (b)在基板上形成凹槽; (c)用导电金属填充凹槽; (d)去除围绕所述导电金属的所述衬底的一部分,其中所述导电金属被保持以在所述导电金属和所述衬底之间形成容纳空间; (e)在容纳空间中形成绝缘材料; 和(f)去除衬底的第二表面的一部分以暴露导电金属和绝缘材料。 以这种方式,可以在容纳空间中形成更厚的绝缘材料,并且容纳空间中的绝缘材料的厚度是均匀的。

    Package process of stacked type semiconductor device package structure
    9.
    发明授权
    Package process of stacked type semiconductor device package structure 有权
    封装工艺堆叠式半导体器件封装结构

    公开(公告)号:US08338235B2

    公开(公告)日:2012-12-25

    申请号:US12766549

    申请日:2010-04-23

    Applicant: Meng-Jen Wang

    Inventor: Meng-Jen Wang

    Abstract: A package process is provided. The package process includes: disposing a semiconductor substrate on a carrier, wherein the semiconductor substrate has plural contacts at a side facing the carrier; thinning the semiconductor substrate from a back side of the semiconductor substrate and then forming plural through silicon vias in the thinned semiconductor substrate; forming plural first pads on the semiconductor substrate, wherein the first pads respectively connected to the through silicon vias; bonding plural chips to the semiconductor substrate, wherein the chips are electrically connected to the corresponding pads; forming a molding compound on the semiconductor substrate to cover the chips and the first pads; separating the semiconductor substrate and the carrier and then forming plural solder balls on the semiconductor substrate; and sawing the molding compound and the semiconductor substrate.

    Abstract translation: 提供包装过程。 封装工艺包括:将半导体衬底设置在载体上,其中半导体衬底在面向载体的一侧具有多个触点; 从半导体衬底的背面稀薄半导体衬底,然后在薄化的半导体衬底中形成多个通过硅通孔; 在所述半导体衬底上形成多个第一焊盘,其中所述第一焊盘分别连接到所述通孔硅通孔; 将多个芯片接合到所述半导体基板,其中所述芯片电连接到相应的焊盘; 在所述半导体衬底上形成模塑料以覆盖所述芯片和所述第一焊盘; 分离半导体衬底和载体,然后在半导体衬底上形成多个焊球; 并锯切模塑料和半导体衬底。

    Semiconductor Device With A Plurality Of Mark Through Substrate Vias
    10.
    发明申请
    Semiconductor Device With A Plurality Of Mark Through Substrate Vias 有权
    具有多个标记的半导体器件通过基板通孔

    公开(公告)号:US20120119335A1

    公开(公告)日:2012-05-17

    申请号:US12945134

    申请日:2010-11-12

    Abstract: The present invention relates to a semiconductor device with a plurality of mark through substrate vias, comprising a semiconductor substrate, a plurality of original through substrate vias and a plurality of mark through substrate vias. The original through substrate vias and the mark through substrate vias are disposed in the semiconductor substrate and protrude from the backside surface of the semiconductor substrate. The mark through substrate vias are added at a specific position and/or in a specific pattern and serve as a fiducial mark, which facilitates identifying to the position and direction on the backside surface. Thus, the redistribution layer (RDL) or the special equipment for achieving the backside alignment (BSA) is not necessary.

    Abstract translation: 本发明涉及具有多个标记通过衬底通孔的半导体器件,包括半导体衬底,多个原始通过衬底通孔和多个通过衬底通孔的标记。 原始通过衬底通孔和通过衬底通孔的标记设置在半导体衬底中并从半导体衬底的背面突出。 通过基板通孔的标记在特定位置和/或特定图案中添加,并且用作基准标记,其有助于识别背面上的位置和方向。 因此,再分配层(RDL)或用于实现背侧对准(BSA)的专用设备是不必要的。

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