摘要:
A multi-interface integrated circuit in which, during the chip's lifetime in use, only one interface is active at a time. However, special test logic powers up all of the on-chip interface modules at once, so that a complete test cycle can be performed. All of the interfaces are exercised in one test program. Since some pads are inactive in some interface modes, mask bits are used to select which pads are monitored during which test cycles.
摘要:
A multi-interface integrated circuit in which, during the chip's lifetime in use, only one interface is active at a time. However, special test logic powers up all of the on-chip interface modules at once, so that a complete test cycle can be performed. All of the interfaces are exercised in one test program. Since some pads are inactive in some interface modes, mask bits are used to select which pads are monitored during which test cycles.
摘要:
Methods and systems for forming a variety of integrated circuits, having quite different interfaces and packages, from a single manufactured die. Preferably the die has bond pads for at least a first mode of operation positioned along only two of its four sides, and these bond pads are sufficient to construct a multi-chip module in which the die is functional in the first mode of operation. Many of the pads on these two sides are duplicated on third and/or fourth sides, except that power management circuitry prevents wasteful capacitive current onto whichever of the duplicated pads is not connected out. Optionally the third and/or fourth sides can be used for connections needed for a mode which is not available with two sides only.
摘要:
A multi-interface integrated circuit in which, during the chip's lifetime in use, only one interface is active at a time. However, special test logic powers up all of the on-chip interface modules at once, so that a complete test cycle can be performed. All of the interfaces are exercised in one test program. Since some pads are inactive in some interface modes, mask bits are used to select which pads are monitored during which test cycles.
摘要:
The embodiments described herein provide a controller and method for performing a background commands or operations. In one embodiment, a controller is provided with interfaces through which to communicate with a host and a plurality of flash memory devices. The controller contains a processor operative to perform a foreground command received from the host, wherein the processor performs the foreground command to completion without interruption. The processor is also operative to perform a background commands or operations stored in the controller's memory, wherein the processor performs the background command until completed or preempted by a foreground command. If the background command is preempted, the processor can resume performing the background command at a later time until completed.
摘要:
A controller communicates with a plurality of multi-chip memory packages. Each multi-chip memory package comprises a plurality of memory dies, each having a respective plurality of memory blocks, some of which are good and some of which are bad. The controller determines a number of good blocks in each memory die. Based on the determined number of good blocks in each memory die, the controller selects a memory die from each of the multi-chip memory packages to access in parallel, wherein the selected memory dies are not necessarily all in the same relative position in each multi-chip package. The controller then creates a metablock from a set of good blocks from each of the selected memory dies, wherein a maximum number of metablocks that can be created across the selected memory dies is determined by a lowest number of good blocks in the selected memory dies.
摘要:
In a storage device such as a solid state disk (SSD), a central controller communicates with a plurality of multi-chip memory packages. Each multi-chip memory package comprises a plurality of memory dies and a local processor, wherein the plurality of memory dies includes different memory tiers. The central controller may handle management of the virtual address space while the local processor in each MCP manages the storage of data within memory tiers in the memory dies of its respective MCP.
摘要:
In a storage device such as a solid state disk (SSD), a central controller communicates with a plurality of multi-chip memory packages. Each multi-chip memory package comprises a plurality of memory dies and a local processor, wherein the plurality of memory dies includes different memory tiers. The central controller may handle management of the virtual address space while the local processor in each MCP manages the storage of data within memory tiers in the memory dies of its respective MCP.
摘要:
A controller communicates with a plurality of multi-chip memory packages. Each multi-chip memory package comprises a plurality of memory dies, each having a respective plurality of memory blocks, some of which are good and some of which are bad. The controller determines a number of good blocks in each memory die. Based on the determined number of good blocks in each memory die, the controller selects a memory die from each of the multi-chip memory packages to access in parallel, wherein the selected memory dies are not necessarily all in the same relative position in each multi-chip package. The controller then creates a metablock from a set of good blocks from each of the selected memory dies, wherein a maximum number of metablocks that can be created across the selected memory dies is determined by a lowest number of good blocks in the selected memory dies.
摘要:
The embodiments described herein provide a controller, storage device, and method for power throttling memory operations. In one embodiment, a controller is provided in a storage device with a plurality of flash memory devices. The controller determines how much power will be consumed (or heat will be generated) by each of a plurality of commands and dynamically alters when each of the commands operating on one or more of the flash memory devices is performed based on the determination of how much power would be consumed (or heat will be generated), so that performance of the plurality of commands does not exceed a predetermined average power limit over a period of time (or a predetermined temperature). In some embodiments, the storage device also has a thermal sensor, and a reading from the thermal sensor can be used, instead of or in addition to the power or thermal costs of each command, to dynamically alter when the commands are performed.