Abstract:
An electron emitter comprising a body of gallium phosphide having a thin surface layer of cesium. The gallium phosphide is doped with a deep acceptor such as iron. Interaction between the cesium layers and the semiconductor surface results in ionization of the deep acceptor impurities in a small region near the surface. The ionization of deep acceptors at the cesiated surface results in a graded concentration of ionized impurities through the gallium phosphide layer, which establishes an internal electric field for impelling electrons toward the cesiated emitting surface.
Abstract:
Excess charge signal generated in response to optical overload of a charge-coupled sensing region is removed from that region by a bus imbedded in the substrate of the sensing array. The bus is separated from a row of sensing regions by a potential barrier produced by an electrode associated with the bus. This barrier is lower than that present, during the optical detection period, between adjacent sensing regions of a row and its value is affected by the voltages present on the conductors which pass over the bus and lead to the sensing regions.
Abstract:
A transmissive semiconductor photocathode structure comprising a first monocrystalline epitaxial layer of silicon or germanium about 200 to 300 nanometers thick on a major surface of a transparent monocrystalline dielectric substrate. On the silicon or germanium layer is a second monocrystalline epitaxial layer of a III-V or II-VI semiconductor compound having a thickness of at least about three microns. On the second layer is a third monocrystalline epitaxial layer of a III-V semiconductor compound having an energy bandgap smaller than the second layer compound and having a thickness on the order of from about one micron to about five microns. Also disclosed is a photoemissive electron tube utilizing the transmissive photocathode structure, with a work function reducing material deposited on the emissive surface of the third layer.