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公开(公告)号：US20120025389A1
公开(公告)日：2012-02-02
申请号：US12846504
申请日：2010-07-29
申请人： Richard Chu , Martin Liu , Chia-Hua Chu , Yuan-Chih Hsieh , Chung-Hsien Lin , Lan-Lin Chao , Chun-Wen Cheng , Mingo Liu
发明人： Richard Chu , Martin Liu , Chia-Hua Chu , Yuan-Chih Hsieh , Chung-Hsien Lin , Lan-Lin Chao , Chun-Wen Cheng , Mingo Liu
CPC分类号： H01L24/94 , B81B2207/015 , B81C1/00269 , B81C2203/0109 , B81C2203/0771 , H01L23/481 , H01L25/50 , H01L2225/06513 , H01L2225/06541 , H01L2924/0002 , H01L2924/1306 , H01L2924/14 , H01L2924/1461 , H01L2924/00
摘要： Provided is a wafer level packaging. The packaging includes a first semiconductor wafer having a transistor device and a first bonding layer that includes a first material. The packaging includes a second semiconductor wafer having a second bonding layer that includes a second material different from the first material, one of the first and second materials being aluminum-based, and the other thereof being titanium-based. Wherein a portion of the second wafer is diffusively bonded to the first wafer through the first and second bonding layers.
摘要翻译： 提供晶圆级封装。 该封装包括具有晶体管器件的第一半导体晶片和包括第一材料的第一结合层。 所述封装包括具有第二接合层的第二半导体晶片，所述第二接合层包括不同于所述第一材料的第二材料，所述第一和第二材料中的一个为铝基，另一个为钛基。 其中第二晶片的一部分通过第一和第二接合层扩散地结合到第一晶片。
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公开(公告)号：US08648468B2
公开(公告)日：2014-02-11
申请号：US12846504
申请日：2010-07-29
申请人： Richard Chu , Martin Liu , Chia-Hua Chu , Yuan-Chih Hsieh , Chung-Hsien Lin , Lan-Lin Chao , Chun-Wen Cheng , Mingo Liu
发明人： Richard Chu , Martin Liu , Chia-Hua Chu , Yuan-Chih Hsieh , Chung-Hsien Lin , Lan-Lin Chao , Chun-Wen Cheng , Mingo Liu
IPC分类号： H01L23/48
CPC分类号： H01L24/94 , B81B2207/015 , B81C1/00269 , B81C2203/0109 , B81C2203/0771 , H01L23/481 , H01L25/50 , H01L2225/06513 , H01L2225/06541 , H01L2924/0002 , H01L2924/1306 , H01L2924/14 , H01L2924/1461 , H01L2924/00
摘要： Provided is a wafer level packaging. The packaging includes a first semiconductor wafer having a transistor device and a first bonding layer that includes a first material. The packaging includes a second semiconductor wafer having a second bonding layer that includes a second material different from the first material, one of the first and second materials being aluminum -based, and the other thereof being titanium-based. Wherein a portion of the second wafer is diffusively bonded to the first wafer through the first and second bonding layers.
摘要翻译： 提供晶圆级封装。 该封装包括具有晶体管器件的第一半导体晶片和包括第一材料的第一结合层。 所述封装包括具有第二接合层的第二半导体晶片，所述第二接合层包括不同于所述第一材料的第二材料，所述第一和第二材料中的一个为铝基，另一个为钛基。 其中第二晶片的一部分通过第一和第二接合层扩散地结合到第一晶片。
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公开(公告)号：US20110233621A1
公开(公告)日：2011-09-29
申请号：US12729911
申请日：2010-03-23
申请人： Martin Liu , Richard Chu , Hung-Hua Lin , H. T. Huang , Jung-Huei Peng , Yuan-Chih Hsieh , Lan-Lin Chao , Chun-Wen Cheng , Chia-Shiung Tsai
发明人： Martin Liu , Richard Chu , Hung-Hua Lin , H. T. Huang , Jung-Huei Peng , Yuan-Chih Hsieh , Lan-Lin Chao , Chun-Wen Cheng , Chia-Shiung Tsai
CPC分类号： H01L25/162 , B81B2207/012 , B81C1/00269 , B81C2203/0118 , B81C2203/035 , H01L21/187 , H01L2924/0002 , H01L2924/00
摘要： The present disclosure provides a method of bonding a plurality of substrates. In an embodiment, a first substrate includes a first bonding layer. The second substrate includes a second bonding layer. The first bonding layer includes silicon; the second bonding layer includes aluminum. The first substrate and the second substrate are bonded forming a bond region having an interface between the first bonding layer and the second bonding layer. A device having a bonding region between substrates is also provided. The bonding region includes an interface between a layer including silicon and a layer including aluminum.
摘要翻译： 本公开提供了一种接合多个基板的方法。 在一个实施例中，第一衬底包括第一接合层。 第二基板包括第二接合层。 第一接合层包括硅; 第二结合层包括铝。 第一基板和第二基板被接合形成在第一接合层和第二接合层之间具有界面的接合区域。 还提供了一种在衬底之间具有接合区域的器件。 接合区域包括在包括硅的层和包括铝的层之间的界面。
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公开(公告)号：US08647962B2
公开(公告)日：2014-02-11
申请号：US12729911
申请日：2010-03-23
申请人： Martin Liu , Richard Chu , Hung Hua Lin , Hsin-Ting Huang , Jung-Huei Peng , Yuan-Chih Hsieh , Lan-Lin Chao , Chun-Wen Cheng , Chia-Shiung Tsai
发明人： Martin Liu , Richard Chu , Hung Hua Lin , Hsin-Ting Huang , Jung-Huei Peng , Yuan-Chih Hsieh , Lan-Lin Chao , Chun-Wen Cheng , Chia-Shiung Tsai
CPC分类号： H01L25/162 , B81B2207/012 , B81C1/00269 , B81C2203/0118 , B81C2203/035 , H01L21/187 , H01L2924/0002 , H01L2924/00
摘要： The present disclosure provides a method of bonding a plurality of substrates. In an embodiment, a first substrate includes a first bonding layer. The second substrate includes a second bonding layer. The first bonding layer includes silicon; the second bonding layer includes aluminum. The first substrate and the second substrate are bonded forming a bond region having an interface between the first bonding layer and the second bonding layer. A device having a bonding region between substrates is also provided. The bonding region includes an interface between a layer including silicon and a layer including aluminum.
摘要翻译： 本公开提供了一种接合多个基板的方法。 在一个实施例中，第一衬底包括第一接合层。 第二基板包括第二接合层。 第一接合层包括硅; 第二结合层包括铝。 第一基板和第二基板被接合形成在第一接合层和第二接合层之间具有界面的接合区域。 还提供了一种在衬底之间具有接合区域的器件。 接合区域包括在包括硅的层和包括铝的层之间的界面。
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公开(公告)号：US20120074590A1
公开(公告)日：2012-03-29
申请号：US12892003
申请日：2010-09-28
申请人： Chung-Hsien Lin , Chia-Hua Chu , Li-Cheng Chu , Yuan-Chih Hsieh , Chun-Wen Cheng
发明人： Chung-Hsien Lin , Chia-Hua Chu , Li-Cheng Chu , Yuan-Chih Hsieh , Chun-Wen Cheng
IPC分类号： H01L23/488 , H01L21/768
CPC分类号： B81B7/0032 , B81B2207/092 , B81C1/00269 , B81C1/00357 , B81C2203/0109 , B81C2203/0792 , H01L2924/0002 , H01L2924/00
摘要： The present disclosure provides a method for fabricating a MEMS device including multiple bonding of substrates. In an embodiment, a method includes providing a micro-electro-mechanical systems (MEMS) substrate including a first bonding layer, providing a semiconductor substrate including a second bonding layer, and providing a cap including a third bonding layer. The method further includes bonding the MEMS substrate to the semiconductor substrate at the first and second bonding layers, and bonding the cap to the semiconductor substrate at the second and third bonding layers to hermetically seal the MEMS substrate between the cap and the semiconductor substrate. A MEMS device fabricated by the above method is also provided.
摘要翻译： 本公开提供了一种用于制造包括多个基板结合的MEMS装置的方法。 在一个实施例中，一种方法包括提供包括第一结合层的微电子机械系统（MEMS）衬底，提供包括第二接合层的半导体衬底，以及提供包括第三接合层的帽。 该方法还包括在第一和第二接合层处将MEMS衬底接合到半导体衬底，并且在第二和第三接合层处将盖接合到半导体衬底上，以密封MEMS衬底在盖和半导体衬底之间。 还提供了通过上述方法制造的MEMS器件。
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公开(公告)号：US08486744B2
公开(公告)日：2013-07-16
申请号：US12892003
申请日：2010-09-28
申请人： Chung-Hsien Lin , Chia-Hua Chu , Li-Cheng Chu , Yuan-Chih Hsieh , Chun-Wen Cheng
发明人： Chung-Hsien Lin , Chia-Hua Chu , Li-Cheng Chu , Yuan-Chih Hsieh , Chun-Wen Cheng
IPC分类号： H01L21/00
CPC分类号： B81B7/0032 , B81B2207/092 , B81C1/00269 , B81C1/00357 , B81C2203/0109 , B81C2203/0792 , H01L2924/0002 , H01L2924/00
摘要： The present disclosure provides a method for fabricating a MEMS device including multiple bonding of substrates. In an embodiment, a method includes providing a micro-electro-mechanical systems (MEMS) substrate including a first bonding layer, providing a semiconductor substrate including a second bonding layer, and providing a cap including a third bonding layer. The method further includes bonding the MEMS substrate to the semiconductor substrate at the first and second bonding layers, and bonding the cap to the semiconductor substrate at the second and third bonding layers to hermetically seal the MEMS substrate between the cap and the semiconductor substrate. A MEMS device fabricated by the above method is also provided.
摘要翻译： 本公开提供了一种用于制造包括多个基板结合的MEMS装置的方法。 在一个实施例中，一种方法包括提供包括第一结合层的微电子机械系统（MEMS）衬底，提供包括第二接合层的半导体衬底，以及提供包括第三接合层的帽。 该方法还包括在第一和第二接合层处将MEMS衬底接合到半导体衬底，并且在第二和第三接合层处将盖接合到半导体衬底上，以密封MEMS衬底在盖和半导体衬底之间。 还提供了通过上述方法制造的MEMS器件。
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公开(公告)号：US09054121B2
公开(公告)日：2015-06-09
申请号：US13280075
申请日：2011-10-24
申请人： Ping-Yin Liu , Xin-Hua Huang , Hsin-Ting Huang , Yuan-Chih Hsieh , Jung-Huei Peng , Lan-Lin Chao , Chia-Shiung Tsai , Chun-Wen Cheng
发明人： Ping-Yin Liu , Xin-Hua Huang , Hsin-Ting Huang , Yuan-Chih Hsieh , Jung-Huei Peng , Lan-Lin Chao , Chia-Shiung Tsai , Chun-Wen Cheng
CPC分类号： B81B7/0058 , B81B3/0005 , B81B3/0021 , B81C1/00269 , B81C1/00793 , B81C2201/053 , B81C2203/0109 , H01G5/16 , H01L28/60
摘要： A method includes forming a MEMS device, forming a bond layer adjacent the MEMS device, and forming a protection layer over the bond layer. The steps of forming the bond layer and the protection layer include in-situ deposition of the bond layer and the protection layer.
摘要翻译： 一种方法包括形成MEMS器件，形成与MEMS器件相邻的接合层，并在接合层上形成保护层。 形成接合层和保护层的步骤包括接合层和保护层的原位沉积。
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公开(公告)号：US20130203199A1
公开(公告)日：2013-08-08
申请号：US13365043
申请日：2012-02-02
申请人： Xin-Hua Huang , Ping-Yin Liu , Li-Cheng Chu , Yuan-Chih Hsieh , Lan-Lin Chao , Chun-Wen Cheng , Chia-Shiung Tsai
发明人： Xin-Hua Huang , Ping-Yin Liu , Li-Cheng Chu , Yuan-Chih Hsieh , Lan-Lin Chao , Chun-Wen Cheng , Chia-Shiung Tsai
CPC分类号： B23K20/002 , B23K20/023
摘要： A method includes bonding a first bond layer to a second bond layer through eutectic bonding. The step of bonding includes heating the first bond layer and the second bond layer to a temperature higher than a eutectic temperature of the first bond layer and the second bond layer, and performing a pumping cycle. The pumping cycle includes applying a first force to press the first bond layer and the second bond layer against each other. After the step of applying the first force, a second force lower than the first force is applied to press the first bond layer and the second bond layer against each other. After the step of applying the second force, a third force higher than the second force is applied to press the first bond layer and the second bond layer against each other.
摘要翻译： 一种方法包括通过共晶接合将第一接合层结合到第二接合层。 接合步骤包括将第一接合层和第二接合层加热至高于第一接合层和第二接合层的共晶温度的温度，并进行泵送循环。 泵送循环包括施加第一力以将第一接合层和第二接合层相互挤压。 在施加第一力的步骤之后，施加比第一力小的第二力以将第一接合层和第二接合层相互挤压。 在施加第二力的步骤之后，施加比第二力高的第三力以将第一接合层和第二接合层相互挤压。
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公开(公告)号：US20130099355A1
公开(公告)日：2013-04-25
申请号：US13280075
申请日：2011-10-24
申请人： Ping-Yin Liu , Xin-Hua Huang , Hsin-Ting Huang , Yuan-Chih Hsieh , Jung-Huei Peng , Lan-Lin Chao , Chia-Shiung Tsai , Chun-Wen Cheng
发明人： Ping-Yin Liu , Xin-Hua Huang , Hsin-Ting Huang , Yuan-Chih Hsieh , Jung-Huei Peng , Lan-Lin Chao , Chia-Shiung Tsai , Chun-Wen Cheng
CPC分类号： B81B7/0058 , B81B3/0005 , B81B3/0021 , B81C1/00269 , B81C1/00793 , B81C2201/053 , B81C2203/0109 , H01G5/16 , H01L28/60
摘要： A method includes forming a MEMS device, forming a bond layer adjacent the MEMS device, and forming a protection layer over the bond layer. The steps of forming the bond layer and the protection layer include in-situ deposition of the bond layer and the protection layer
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公开(公告)号：US08905293B2
公开(公告)日：2014-12-09
申请号：US12964347
申请日：2010-12-09
申请人： Ping-Yin Liu , Li-Cheng Chu , Hung-Hua Lin , Shang-Ying Tsai , Yuan-Chih Hsieh , Jung-Huei Peng , Lan-Lin Chao , Chia-Shiung Tsai , Chun-Wen Cheng
发明人： Ping-Yin Liu , Li-Cheng Chu , Hung-Hua Lin , Shang-Ying Tsai , Yuan-Chih Hsieh , Jung-Huei Peng , Lan-Lin Chao , Chia-Shiung Tsai , Chun-Wen Cheng
CPC分类号： B81C1/00269 , B32B7/12 , B32B15/043 , B32B15/20 , B32B2255/24 , B32B2307/746 , B32B2457/00 , B81B3/0005 , B81C2201/112 , Y10T428/12674 , Y10T428/12708 , Y10T428/12736 , Y10T428/12986
摘要： A bond free of an anti-stiction layer and bonding method is disclosed. An exemplary method includes forming a first bonding layer; forming an interlayer over the first bonding layer; forming an anti-stiction layer over the interlayer; and forming a liquid from the first bonding layer and interlayer, such that the anti-stiction layer floats over the first bonding layer. A second bonding layer can be bonded to the first bonding layer while the anti-stiction layer floats over the first bonding layer, such that a bond between the first and second bonding layers is free of the anti-stiction layer.
摘要翻译： 公开了没有抗静电层和粘合方法的键。 一种示例性方法包括形成第一粘合层; 在所述第一接合层上形成中间层; 在中间层上形成抗静电层; 以及从所述第一接合层和中间层形成液体，使得所述抗静电层浮在所述第一接合层上。 第二接合层可以结合到第一接合层，同时抗静电层漂浮在第一接合层上，使得第一和第二接合层之间的接合没有抗静电层。
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