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公开(公告)号:US20250126827A1
公开(公告)日:2025-04-17
申请号:US18989749
申请日:2024-12-20
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Abhishek BANERJEE , Peter MOENS , Herbert DE VLEESCHOUWER , Peter COPPENS
Abstract: High Electron Mobility Transistors (HEMTs) are described with a circular gate. with a drain region disposed within the circular gates and circular source region disposed around the circular gates. The circular gate and the circular source region may form complete circles.
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公开(公告)号:US20220020872A1
公开(公告)日:2022-01-20
申请号:US17369479
申请日:2021-07-07
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Herbert DE VLEESCHOUWER , Jaume ROIG-GUITART , Peter MOENS , Mohammad Shawkat ZAMAN , Olivier TRESCASES
IPC: H01L29/778 , G01R31/26 , G01R19/00 , H01L29/20
Abstract: In an embodiment, a HEMT is formed to have a main transistor having a main active area and a sense transistor having a sense active area. An embodiment may include that the main active area is isolated from the sense active area.
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公开(公告)号:US20220285248A1
公开(公告)日:2022-09-08
申请号:US17194846
申请日:2021-03-08
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Thomas NEYER , Herbert DE VLEESCHOUWER , Fredrik ALLERSTAM
IPC: H01L23/482 , H01L29/16 , H01L29/10 , H01L29/739 , H01L29/78 , H01L21/768 , H01L29/66
Abstract: In a general aspect, a semiconductor device can include a plurality of vertical transistor segments disposed in an active region of a semiconductor region. The plurality of vertical transistor segments can include respective gate electrodes. A first dielectric can be disposed on the active region. An electrically conductive grid can be disposed on the first dielectric. The electrically conductive grid can be electrically coupled with the respective gate electrodes using a plurality of conductive contacts formed through the first dielectric. A second dielectric can be disposed on the electrically conductive grid and the first dielectric. A conductive metal layer can be disposed on the second dielectric layer. The conductive metal layer can include a portion that is electrically coupled with the respective gate electrodes through the electrically conductive grid using at least one conductive contact to the electrically conductive grid formed through the second dielectric.
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公开(公告)号:US20220216332A1
公开(公告)日:2022-07-07
申请号:US17143301
申请日:2021-01-07
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Abhishek BANERJEE , Peter MOENS , Herbert DE VLEESCHOUWER , Peter COPPENS
IPC: H01L29/778 , H01L29/423 , H01L29/20
Abstract: High Electron Mobility Transistors (HEMTs) are described with a circular gate, with a drain region disposed within the circular gates and circular source region disposed around the circular gates. The circular gate and the circular source region may form complete circles.
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公开(公告)号:US20180356296A1
公开(公告)日:2018-12-13
申请号:US15621093
申请日:2017-06-13
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Jaume ROIG-GUITART , Herbert DE VLEESCHOUWER , Gordon M. GRIVNA
Abstract: An electronic device can include a temperature sensor. The temperature sensor can include a drain electrode including drain fingers spaced apart from the source fingers; a source electrode including source fingers spaced apart from the drain fingers; and a gate electrode including a runner, gate fingers and a conductive bridge. In an embodiment, the runner includes a first portion and a second portion spaced apart from the first portion, the gate fingers are coupled to the runner and each gate finger is disposed between a pair of the source and drain fingers. The conductive bridge connects at least two gate fingers, wherein the conductive bridge is along a conduction path between the first and second portions of the runner. Designs for the temperature sensor may provide a more accurate temperature measurement reflective of a transistor within the electronic device.
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公开(公告)号:US20180033877A1
公开(公告)日:2018-02-01
申请号:US15730897
申请日:2017-10-12
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Peter MOENS , Balaji PADMANABHAN , Herbert DE VLEESCHOUWER , Prasad VENKATRAMAN
IPC: H01L29/747 , H01L23/495 , H01L23/00 , H01L25/11 , H01L29/205 , H01L29/74 , H03K17/687 , H01L29/778 , H01L29/423 , H01L29/40 , H01L21/8258 , H01L27/06 , H01L27/088
CPC classification number: H01L29/747 , H01L21/8258 , H01L23/4952 , H01L23/49524 , H01L23/49541 , H01L23/49562 , H01L23/49575 , H01L24/40 , H01L25/115 , H01L25/18 , H01L27/0629 , H01L27/088 , H01L27/0883 , H01L29/205 , H01L29/404 , H01L29/4238 , H01L29/7416 , H01L29/742 , H01L29/7786 , H01L29/7787 , H01L2224/0603 , H01L2224/40245 , H01L2224/48247 , H01L2224/49113 , H01L2224/73221 , H01L2224/83801 , H01L2224/8385 , H01L2924/00014 , H03K17/6874 , H03K2017/6878 , H03K2217/0009 , H03K2217/0018 , H01L2224/37099
Abstract: An electronic device can include a bidirectional HEMT. In an aspect, the electronic device can include a pair of switch gate and blocking gate electrodes, wherein the switch gate electrodes are not electrically connected to the blocking gate electrodes, and the first blocking, first switch, second blocking, and second switch gate electrodes are on the same die. In another aspect, the electronic device can include shielding structures having different numbers of laterally extending portions. In a further aspect, the electronic device can include a gate electrode and a shielding structure, wherein a portion of the shielding structure defines an opening overlying the gate electrode.
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公开(公告)号:US20160322351A1
公开(公告)日:2016-11-03
申请号:US15133679
申请日:2016-04-20
Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Inventor: Peter MOENS , Balaji PADMANABHAN , Herbert DE VLEESCHOUWER , Prasad VENKATRAMAN
IPC: H01L27/088 , H01L29/423 , H01L29/40 , H01L29/778 , H01L29/20 , H01L29/205
CPC classification number: H01L29/747 , H01L21/8258 , H01L23/4952 , H01L23/49524 , H01L23/49541 , H01L23/49562 , H01L23/49575 , H01L24/40 , H01L25/115 , H01L25/18 , H01L27/0629 , H01L27/088 , H01L27/0883 , H01L29/205 , H01L29/404 , H01L29/4238 , H01L29/7416 , H01L29/742 , H01L29/7786 , H01L29/7787 , H01L2224/0603 , H01L2224/40245 , H01L2224/48247 , H01L2224/49113 , H01L2224/73221 , H01L2224/83801 , H01L2224/8385 , H01L2924/00014 , H03K17/6874 , H03K2017/6878 , H03K2217/0009 , H03K2217/0018 , H01L2224/37099
Abstract: An electronic device can include a bidirectional HEMT. In an aspect, the electronic device can include a pair of switch gate and blocking gate electrodes, wherein the switch gate electrodes are not electrically connected to the blocking gate electrodes, and the first blocking, first switch, second blocking, and second switch gate electrodes are on the same die. In another aspect, the electronic device can include shielding structures having different numbers of laterally extending portions. In a further aspect, the electronic device can include a gate electrode and a shielding structure, wherein a portion of the shielding structure defines an opening overlying the gate electrode.
Abstract translation: 电子设备可以包括双向HEMT。 一方面,电子设备可以包括一对开关栅极和阻挡栅电极,其中开关栅极电极不与阻挡栅电极电连接,并且第一阻塞,第一开关,第二阻断和第二开关栅电极 在同一个死亡。 在另一方面,电子设备可以包括具有不同数量的横向延伸部分的屏蔽结构。 在另一方面,电子设备可以包括栅电极和屏蔽结构,其中屏蔽结构的一部分限定了覆盖栅电极的开口。
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