Memory device and method of operating with different input/output modes

    公开(公告)号:US11482261B2

    公开(公告)日:2022-10-25

    申请号:US17242988

    申请日:2021-04-28

    Applicant: SK hynix Inc.

    Inventor: Sang Hwan Kim

    Abstract: A memory device, and a method of operating the same, includes a plurality of pages, a peripheral circuit, and control logic. The peripheral circuit is configured to receive a command, an address, and data from an external controller to program a page selected from among the plurality of pages, and to generate internal input data depending on an input mode for the command, the address, and the data. The control logic is configured to determine whether internal input data is to be generated based on the data depending on the input mode and to control the peripheral circuit so that a program operation of programming the internal input data is performed.

    Memory device and memory system having the same

    公开(公告)号:US10796769B2

    公开(公告)日:2020-10-06

    申请号:US16299590

    申请日:2019-03-12

    Applicant: SK hynix Inc.

    Abstract: The present disclosure relates to a memory device and a memory system having the same. The memory device includes page buffers arranged in a first direction and a second direction perpendicular to the first direction, a first storage group and a second storage group arranged adjacent to the page buffers in the second direction, and a switch circuit arranged between the first storage group and the second storage group and selectively coupling the first storage group and the second storage group to data lines according to a number of page buffers and a number of first and second storage groups.

    Semiconductor apparatus and semiconductor system

    公开(公告)号:US09665118B2

    公开(公告)日:2017-05-30

    申请号:US15045494

    申请日:2016-02-17

    Applicant: SK hynix Inc.

    Inventor: Sang Hwan Kim

    CPC classification number: G05F5/00

    Abstract: A semiconductor apparatus includes a controller configured to generate a plurality of control signals for selecting an operation mode of the semiconductor apparatus in response to a number of input chip enable pulses, and an output driving unit configured to be operated according to the operation mode of the semiconductor apparatus based on the plurality of control signals.

    Memory device
    7.
    发明授权

    公开(公告)号:US11373722B2

    公开(公告)日:2022-06-28

    申请号:US17149495

    申请日:2021-01-14

    Applicant: SK hynix Inc.

    Inventor: Sang Hwan Kim

    Abstract: A memory device includes a first pad, a second pad, and a double data rate (DDR) test controller. The first pad may receive a write enable signal. The second pad may receive a data strobe signal. The DDR test controller is connected to the first pad and the second pad and outputs an internal write enable signal and an internal data strobe signal. The DDR test controller generates the internal data strobe signal based on the write enable signal received through the first pad, in at least a portion of a DDR test operation of the memory device.

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