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公开(公告)号:US09691493B1
公开(公告)日:2017-06-27
申请号:US15244664
申请日:2016-08-23
Inventor: Marco Pasotti , Fabio De Santis , Roberto Bregoli , Dario Livornesi , Sandor Petenyi
CPC classification number: G11C16/30 , G05F3/30 , G11C5/147 , G11C16/0408 , G11C16/0433 , G11C16/10 , G11C16/28 , G11C2216/10 , H01L27/11521 , H01L27/1156 , H03F3/45188 , H03F3/45475 , H03F2200/456 , H03F2203/45341 , H03F2203/45342 , H03F2203/45528 , H03F2203/45674 , H03F2203/45676
Abstract: A device for generating a reference voltage includes a first non-volatile memory cell provided with a control-gate transistor and a reading transistor. The control-gate transistor includes a gate terminal, a body, a first conduction terminal and a second conduction terminal. The first conduction terminal and the second conduction terminal are connected together to form a control-gate terminal. The reading transistor includes a gate terminal that is connected to the gate terminal of the control-gate transistor to form a floating-gate terminal, a body, a third conduction terminal and a fourth conduction terminal. The device also includes a second, equivalent, memory cell. The source terminal of the first non-volatile memory cell and the source terminal of the second equivalent memory cell are connected together.
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公开(公告)号:US11342031B2
公开(公告)日:2022-05-24
申请号:US17006510
申请日:2020-08-28
Inventor: Marco Pasotti , Dario Livornesi , Roberto Bregoli , Vikas Rana , Abhishek Mittal
Abstract: An integrated circuit includes a memory array and a read voltage regulator that generates read voltages from the memory array. The read voltage regulator includes a replica memory cell and the replica bitline current path. The replica memory cell is a replica of memory cells of the memory array. The replica bitline current path is a replica of current paths associated with deadlines of the memory array. The read voltage regulator generates a read voltage based on the current passed through the replica bitline current path. This read voltage is then supplied to the wordlines of the memory array during a read operation.
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公开(公告)号:US09627066B1
公开(公告)日:2017-04-18
申请号:US15210709
申请日:2016-07-14
Applicant: STMicroelectronics S.r.l.
Inventor: Marco Pasotti , Fabio de Santis , Roberto Bregoli , Dario Livornesi
CPC classification number: G11C16/0441 , G11C16/04 , G11C16/0408 , G11C16/10 , G11C16/14 , G11C16/26
Abstract: A non-volatile memory cell for storing a single bit is disclosed. The non-volatile memory cell includes an access transistor including a gate, a first body, a first source/drain node, and a second source/drain node. The non-volatile memory cell also includes a first floating gate storage transistor that has a third source/drain node, a second body, a fourth source/drain node, and a first floating gate including a first storage node. The third source/drain node is coupled to the second source/drain node. The non-volatile memory cell further includes a first capacitor, a second capacitor, and a second floating gate storage transistor. The first capacitor has a first plate coupled to the first storage node and an opposite second plate. The second floating gate storage transistor includes a fifth source/drain node, a third body, a sixth source/drain node, a second floating gate including a second storage node. The fifth source/drain node is coupled to the fourth source/drain node. The second capacitor includes a third plate coupled to the second storage node and having an opposite fourth plate. The second plate is coupled to the fourth plate, and the first body of the access transistor is coupled to the second body and the third body.
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公开(公告)号:US12148473B2
公开(公告)日:2024-11-19
申请号:US17697846
申请日:2022-03-17
Inventor: Roberto Bregoli , Vikas Rana
Abstract: In an embodiment a non-volatile memory cell includes a substrate, a first body in the substrate, a second body in the substrate, a first storage transistor having a first conduction region and a second conduction region in the first body, the first and second conduction regions delimiting a first channel region in the first body, a first control gate region in the second body, an insulating region overlying the substrate, a single floating gate region extending on the substrate and embedded in the insulating region, the single floating gate region having a first portion on the first body and a second portion on the second body, the first portion and second portion being connected and electrically coupled, a first selection via extending through the insulating region and electrically coupling the first conduction region with a first conduction node, a second selection via extending through the insulating region and electrically coupling the second conduction region with a second conduction node and a first control via extending though the insulating region and electrically coupling the first control gate region with a first control node.
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公开(公告)号:US20230328979A1
公开(公告)日:2023-10-12
申请号:US18185575
申请日:2023-03-17
Applicant: STMicroelectronics S.r.l.
Inventor: Roberto Bregoli , Alessandro Ferretti , Federica Rosa
CPC classification number: H10B41/70 , G11C16/045 , G11C16/10 , G11C16/14 , H10B41/35
Abstract: A non-volatile memory cell includes a first well of a first conductivity type and a second well of a second conductivity type in a body adjacent to each other; a first conduction region, a second conduction region and a third conduction region in the first well, the first, second and third conduction regions being of the second conductivity type; a control gate region, of the first or second conductivity type, in the second well; a selection gate over the first well forming, together with the first and second conduction regions, a selection transistor; and a floating gate region. The floating gate region has a programming portion overlying the first well and a capacitive portion overlying the second well. The floating gate region forms, together with the second and third conduction regions, a storage transistor and, together with the control gate region, a capacitive element.
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公开(公告)号:US20220319598A1
公开(公告)日:2022-10-06
申请号:US17697846
申请日:2022-03-17
Inventor: Roberto Bregoli , Vikas Rana
IPC: G11C16/04 , H01L27/11524 , H01L27/1156 , G11C16/10 , G11C16/14 , G11C16/26
Abstract: In an embodiment a non-volatile memory cell includes a substrate, a first body in the substrate, a second body in the substrate, a first storage transistor having a first conduction region and a second conduction region in the first body, the first and second conduction regions delimiting a first channel region in the first body, a first control gate region in the second body, an insulating region overlying the substrate, a single floating gate region extending on the substrate and embedded in the insulating region, the single floating gate region having a first portion on the first body and a second portion on the second body, the first portion and second portion being connected and electrically coupled, a first selection via extending through the insulating region and electrically coupling the first conduction region with a first conduction node, a second selection via extending through the insulating region and electrically coupling the second conduction region with a second conduction node and a first control via extending though the insulating region and electrically coupling the first control gate region with a first control node.
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公开(公告)号:US20170178734A1
公开(公告)日:2017-06-22
申请号:US15244664
申请日:2016-08-23
Inventor: Marco Pasotti , Fabio De Santis , Roberto Bregoli , Dario Livornesi , Sandor Petenyi
IPC: G11C16/30 , G11C5/14 , G11C16/04 , H01L27/115 , G11C16/28
CPC classification number: G11C16/30 , G05F3/30 , G11C5/147 , G11C16/0408 , G11C16/0433 , G11C16/10 , G11C16/28 , G11C2216/10 , H01L27/11521 , H01L27/1156 , H03F3/45188 , H03F3/45475 , H03F2200/456 , H03F2203/45341 , H03F2203/45342 , H03F2203/45528 , H03F2203/45674 , H03F2203/45676
Abstract: A device for generating a reference voltage includes a first non-volatile memory cell provided with a control-gate transistor and a reading transistor. The control-gate transistor includes a gate terminal, a body, a first conduction terminal and a second conduction terminal. The first conduction terminal and the second conduction terminal are connected together to form a control-gate terminal. The reading transistor includes a gate terminal that is connected to the gate terminal of the control-gate transistor to form a floating-gate terminal, a body, a third conduction terminal and a fourth conduction terminal. The device also includes a second, equivalent, memory cell. The source terminal of the first non-volatile memory cell and the source terminal of the second equivalent memory cell are connected together.
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