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公开(公告)号:US20250088344A1
公开(公告)日:2025-03-13
申请号:US18957293
申请日:2024-11-22
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Dokyung Lim , Sounghun Shin , Wooseok Kim , Wonsik Yu , Chanyoung Jeong
IPC: H04L7/033 , H04L43/087
Abstract: A monitoring circuit for a high frequency signal includes: a phase locked loop configured to generate a divided output signal with respect to an input signal based on a plurality of dividers; a plurality of dividing monitoring circuits configured to receive dividing input signals and dividing output signals respectively corresponding to the plurality of dividers, and output dividing error signals; and a jitter monitoring circuit configured to output a jitter error signal.
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公开(公告)号:US20220239284A1
公开(公告)日:2022-07-28
申请号:US17466006
申请日:2021-09-03
Applicant: Samsung Electronics Co., Ltd.
Inventor: Wonsik Yu , Wooseok Kim , Taeik Kim , Chanyoung Jeong
Abstract: A clock generation circuit includes a temperature compensation circuit and an oscillator. The temperature compensation circuit is configured to generate a temperature-compensated frequency selection code that varies depending on an operation temperature based on a difference between the operation temperature and a reference temperature and based on a temperature-independent frequency selection code that is fixed regardless of the operation temperature. The oscillator is configured to generate a clock signal that has an operation frequency that is based on the temperature-compensated frequency selection code, such that the operation frequency is uniform regardless of the operation temperature. Effects of the operation temperature may be reduced by generating the temperature-compensated frequency selection code that reflects the temperature characteristic of the oscillator using the output value of the temperature sensor and by controlling the oscillator using the temperature-compensated frequency selection code.
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公开(公告)号:US11789482B2
公开(公告)日:2023-10-17
申请号:US17702482
申请日:2022-03-23
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jusung Lee , Wooseok Kim , Taeik Kim , Chanyoung Jeong
Abstract: A bandgap reference circuit includes a reference current generation circuit configured to output a bandgap reference current insensitive to a temperature change, by using a first voltage inversely proportional to temperature and a third voltage proportional to temperature. The third voltage is a difference between the first voltage and a second voltage. The bandgap reference circuit further includes a resistivity temperature coefficient cancellation circuit configured to remove a first current proportional to temperature from the bandgap reference current by using the third voltage, and a reference voltage generation circuit configured to output a bandgap reference voltage insensitive to a temperature change by using a second current inversely proportional to temperature and a first resistance proportional to temperature. The second current is generated by removing the first current from the bandgap reference current.
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公开(公告)号:US20230086367A1
公开(公告)日:2023-03-23
申请号:US17731464
申请日:2022-04-28
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jisu Yu , Youngsook Do , Eunsung Seo , Wooseok Kim , Wonsik Yu , Chanyoung Jeong
IPC: H01L23/528 , H01L23/522
Abstract: A semiconductor device includes: a standard cell array including a plurality of standard cells, each of the plurality of standard cells; a plurality of power supply lines configured to provide a power supply voltage and extending in a first direction; a capacitor structure including electrode structures included in each of a plurality of dielectric layers formed on the standard cell array, the capacitor structure having vias connecting the electrode structures; and contacts electrically connecting the capacitor structure and the standard cell array to each other. Each of the plurality of standard cells provides a unit capacitor circuit having capacitance that is based on a connection structure of active regions and gates of first and second transistors thereof.
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5.
公开(公告)号:US20230009620A1
公开(公告)日:2023-01-12
申请号:US17860519
申请日:2022-07-08
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jusung LEE , Wooseok Kim , Wonsik Yu , Chanyoung Jeong
Abstract: A frequency-locked loop (FLL) logic circuit, including a validity signal generator configured to receive an external clock signal and determine whether a glitch occurs in the external clock signal; a clock divider configured to generate a reference frequency clock signal based on the external clock signal and a determination result of the validity signal generator; a synchronizer configured to synchronize a phase of an oscillator clock signal with a phase of the reference frequency clock signal; a clock counter configured to count a number of pulses of the oscillator clock signal during a reference time; and a code limiter configured to determine a range of a frequency selection value for calibrating an operating frequency of the oscillator clock signal based on the counted number of pulses.
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公开(公告)号:US12192315B2
公开(公告)日:2025-01-07
申请号:US17943932
申请日:2022-09-13
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Dokyung Lim , Sounghun Shin , Wooseok Kim , Wonsik Yu , Chanyoung Jeong
IPC: H03D3/24 , H04L7/033 , H04L43/087
Abstract: A monitoring circuit for a high frequency signal includes: a phase locked loop configured to generate a divided output signal with respect to an input signal based on a plurality of dividers; a plurality of dividing monitoring circuits configured to receive dividing input signals and dividing output signals respectively corresponding to the plurality of dividers, and output dividing error signals; and a jitter monitoring circuit configured to output a jitter error signal.
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公开(公告)号:US11736112B2
公开(公告)日:2023-08-22
申请号:US17675351
申请日:2022-02-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Kangyeop Choo , Wooseok Kim , Wonsik Yu , Chanyoung Jeong
CPC classification number: H03L7/0992 , H03B5/04 , H03L7/093
Abstract: A digitally controlled oscillator (DCO) includes; a current mirror configured to generate a supply current in response to a bias voltage matching a reference current, a variable resistor connected to the current mirror through a first node outputting the reference current and configured to provide a variable resistance in response to a first control signal, an oscillation circuit connected to the current mirror through a second node outputting the supply current and configured to generate an oscillation signal in response to the supply current, and a feedback circuit configured to control the bias voltage in relation to at least one of a voltage at the first node and a voltage at the second node.
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公开(公告)号:US20250062771A1
公开(公告)日:2025-02-20
申请号:US18804954
申请日:2024-08-14
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Dohun Jang , Junhyeok Yang , Hyuntaek Oh , Dokyung Lim , Chanyoung Jeong
Abstract: There is provided a phase locked loop circuit including a phase-frequency detection circuit configured to receive a reference clock signal and a feedback clock signal having a first phase difference from each other, adjust a phase gain based on first phase difference, and generate a first and a second control signals based on the phase gain, a lock detection circuit configured to generate a lock detection signal based on the first phase difference, a charge pump circuit configured to generate a loop filter input signal based on the first and second control signals, a loop filter configured to adjust impedance based on the activated lock detection signal and generate a loop filter output signal based on the adjusted impedance, an oscillator configured to generate a clock signal based on the loop filter output signal, and a divider configured to generate the feedback clock signal by dividing the clock signal.
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9.
公开(公告)号:US11967962B2
公开(公告)日:2024-04-23
申请号:US17860519
申请日:2022-07-08
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jusung Lee , Wooseok Kim , Wonsik Yu , Chanyoung Jeong
CPC classification number: H03L7/0991 , H03L7/07 , H03L7/091 , H03L7/18
Abstract: A frequency-locked loop (FLL) logic circuit, including a validity signal generator configured to receive an external clock signal and determine whether a glitch occurs in the external clock signal; a clock divider configured to generate a reference frequency clock signal based on the external clock signal and a determination result of the validity signal generator; a synchronizer configured to synchronize a phase of an oscillator clock signal with a phase of the reference frequency clock signal; a clock counter configured to count a number of pulses of the oscillator clock signal during a reference time; and a code limiter configured to determine a range of a frequency selection value for calibrating an operating frequency of the oscillator clock signal based on the counted number of pulses.
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公开(公告)号:US11700005B2
公开(公告)日:2023-07-11
申请号:US17509540
申请日:2021-10-25
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Kangyeop Choo , Insung Kim , Wooseok Kim , Taeik Kim , Sunghyuck Lee , Chanyoung Jeong
CPC classification number: H03L7/0891 , H03L7/101
Abstract: A phased locked loop includes; a load circuit that generates an output signal in response to a driving voltage, a frequency calibration circuit that generates a calibration signal in response to an output frequency of the output signal and a target frequency, and a regulator that generates the driving voltage in response to the calibration signal.
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