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公开(公告)号:US20230054754A1
公开(公告)日:2023-02-23
申请号:US17702291
申请日:2022-03-23
发明人: Eun Chu Oh , Junyeong Seok , Younggul Song , Byungchul Jang
IPC分类号: G06F11/10 , G06F11/07 , G11C11/408 , G11C11/4096 , G11C11/4074
摘要: A storage device includes a NAND flash memory device, an auxiliary memory device and a storage controller to control the NAND flash memory device and the auxiliary memory device. The storage controller includes a processor, an error correction code (ECC) engine and a memory interface. The processor executes a flash translation layer (FTL) loaded onto an on-chip memory. The ECC engine generates first parity bits for user data to be stored in a target page of the NAND flash memory device based on error attribute of a target memory region associated with the target page, and selectively generates additional parity bits for the user data under control of the processor. The memory interface transmits the user data and the first parity bits to the NAND flash memory device, and selectively transmits the additional parity bits to the auxiliary memory device.
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公开(公告)号:US12033706B2
公开(公告)日:2024-07-09
申请号:US17873739
申请日:2022-07-26
发明人: Junyeong Seok , Younggul Song , Eunchu Oh , Byungchul Jang , Joonsung Lim
CPC分类号: G11C16/3459 , G11C16/08 , G11C16/102 , G11C16/16
摘要: In a method of operating one or more nonvolatile memory devices including one or more memory blocks, each memory block includes a plurality of memory cells and a plurality of pages arranged in a vertical direction. Pages arranged in a first direction of a channel hole are set as first to N-th pages. A size of the channel hole increases in the first direction and decreases in the second direction. Pages arranged in a second direction of the channel hole are set as (N+1)-th to 2N-th pages. First to N-th page pairs are set such that a K-th page among the first to the N-th pages and an (N+K)-th page among the (N+1)-th to 2N-th pages form one page pair. Parity regions of two pages included in at least one page pair are shared by the two pages included in the at least one page pair.
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公开(公告)号:US20230112694A1
公开(公告)日:2023-04-13
申请号:US17750581
申请日:2022-05-23
发明人: Eun Chu Oh , Junyeong Seok , Younggul Song , Wijik Lee , Byungchul Jang
摘要: A storage device includes a nonvolatile memory device including a memory cell array and a storage controller to control the nonvolatile memory device. The memory cell array includes word-lines, memory cells and word-line cut regions dividing the word-lines into memory blocks. The storage controller includes an error correction code (ECC) engine including an ECC encoder and a memory interface. The ECC encoder performs a first ECC encoding operation on each of sub data units in user data to generate parity bits and generate a plurality of ECC sectors, selects outer cell bits to be stored in outer cells to constitute an outer ECC sector including the outer cell bits and performs a second ECC encoding operation on the outer ECC sector to generate outer parity bits. The memory interface transmits, to the nonvolatile memory device, a codeword set including the ECC sectors and the outer parity bits.
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公开(公告)号:US20240331782A1
公开(公告)日:2024-10-03
申请号:US18539914
申请日:2023-12-14
发明人: Junyeong Seok , Beomkyu Shin , Eunchu Oh
CPC分类号: G11C16/3431 , G11C16/0483 , G11C16/16 , G11C16/3445 , H01L24/08 , H01L25/0657 , H01L25/18 , H10B80/00 , H01L2224/08145 , H01L2924/1431 , H01L2924/14511
摘要: A memory block is divided into sub blocks including a first sub block and a second sub block that are disposed in a vertical direction where the memory block includes a plurality of cell strings and each cell string includes a plurality of memory cells that are disposed in the vertical direction. A normal erase operation is performed independently with respect to each of the sub blocks. A disturbance verification read operation with respect to the first sub block is performed to determine whether a threshold voltage of memory cells connected to a wordline in an erased state of the first sub block is increased higher than a reference level. A post erase operation is selectively performed based on a result of the disturbance verification read operation to decrease the threshold voltage of memory cells in the erased state of the first sub block.
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公开(公告)号:US11901321B2
公开(公告)日:2024-02-13
申请号:US17854287
申请日:2022-06-30
发明人: Eun Chu Oh , Junyeong Seok , Younggul Song , Byungchul Jang , Joonsung Lim
IPC分类号: H01L23/00 , H01L25/065 , H01L25/18 , G06F11/10 , H01L25/00 , G11C7/10 , H10B41/20 , H10B41/40 , H10B41/50 , H10B43/20 , H10B43/40 , H10B43/50
CPC分类号: H01L24/08 , G06F11/1008 , G06F11/1048 , G11C7/10 , H01L25/0657 , H01L25/18 , H01L25/50 , H10B41/20 , H10B41/40 , H10B41/50 , H10B43/20 , H10B43/40 , H10B43/50 , H01L2224/0603 , H01L2224/08145 , H01L2225/06524 , H01L2225/06541 , H01L2924/1431 , H01L2924/14511
摘要: A three-dimensional (3D) storage device using wafer-to-wafer bonding is disclosed. In the storage device, a first chip including a peripheral circuit region including a first control logic circuit configured to control operation modes of a nonvolatile memory (NVM) device is wafer-bonded with a second chip including 3D arrays of NVM cells, and a memory controller includes a third chip including a control circuit region. The control circuit region of the third chip includes a second control logic circuit associated with operation conditions of the NVM device, and the second control logic circuit includes a serializer/deserializer (SERDES) interface configured to share random access memory (RAM) in the memory controller and transmit and receive data to and from the NVM device.
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公开(公告)号:US12094535B2
公开(公告)日:2024-09-17
申请号:US17810777
申请日:2022-07-05
发明人: Eun Chu Oh , Junyeong Seok , Younggul Song
CPC分类号: G11C16/10 , G11C11/5628 , G11C11/5642 , G11C11/5671 , G11C16/0483 , G11C16/08 , G11C16/24 , G11C16/26
摘要: A nonvolatile memory device includes a memory cell array and a control circuit. The memory cell array includes a plurality of word-lines, a plurality of memory cells provided in a plurality of channel holes and a word-line cut region extending in a first horizontal direction and dividing the word-lines into a plurality of memory blocks. A plurality of target memory cells coupled to each of the plurality of word-lines are grouped into outer cells and inner cells based on a location index of each of the plurality of memory cells. The control circuit controls a program operation on target memory cells coupled to a target word-line of the plurality of word-lines such that each of the outer cells stores a first number of bits and each of the inner cells stores a second number of bits. The second number is a natural number greater than the first number.
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公开(公告)号:US12056007B2
公开(公告)日:2024-08-06
申请号:US17702291
申请日:2022-03-23
发明人: Eun Chu Oh , Junyeong Seok , Younggul Song , Byungchul Jang
IPC分类号: G06F11/10 , G06F11/07 , G11C11/4074 , G11C11/408 , G11C11/4096
CPC分类号: G06F11/1068 , G06F11/076 , G11C11/4074 , G11C11/4082 , G11C11/4085 , G11C11/4087 , G11C11/4096
摘要: A storage device includes a NAND flash memory device, an auxiliary memory device and a storage controller to control the NAND flash memory device and the auxiliary memory device. The storage controller includes a processor, an error correction code (ECC) engine and a memory interface. The processor executes a flash translation layer (FTL) loaded onto an on-chip memory. The ECC engine generates first parity bits for user data to be stored in a target page of the NAND flash memory device based on error attribute of a target memory region associated with the target page, and selectively generates additional parity bits for the user data under control of the processor. The memory interface transmits the user data and the first parity bits to the NAND flash memory device, and selectively transmits the additional parity bits to the auxiliary memory device.
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公开(公告)号:US11989091B2
公开(公告)日:2024-05-21
申请号:US17965091
申请日:2022-10-13
发明人: Younggul Song , Byungchul Jang , Junyeong Seok , Eun Chu Oh
CPC分类号: G06F11/1068 , G06F11/076 , G06F11/0793
摘要: A method of operating a memory system that comprises a memory device including a plurality of memory blocks and a memory controller, includes detecting a first memory block having a degradation count greater than or equal to a first reference value by the memory controller. A first command for the first memory block is transmitted to the memory device by the memory controller. A first voltage is applied to all of a plurality of word lines connected to the first memory block and a second voltage to a bit line connected to the first memory block in response to the first command by the memory device. The first voltage is greater than a voltage applied to turn on memory cells connected to all of the plurality of word lines. The second voltage is greater than a voltage applied to the bit line during program, read or erase operations.
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公开(公告)号:US20230052161A1
公开(公告)日:2023-02-16
申请号:US17873739
申请日:2022-07-26
发明人: Junyeong Seok , Younggul Song , Eunchu Oh , Byungchul Jang , Joonsung Lim
摘要: In a method of operating one or more nonvolatile memory devices including one or more memory blocks, each memory block includes a plurality of memory cells and a plurality of pages arranged in a vertical direction. Pages arranged in a first direction of a channel hole are set as first to N-th pages. A size of the channel hole increases in the first direction and decreases in the second direction. Pages arranged in a second direction of the channel hole are set as (N+1)-th to 2N-th pages. First to N-th page pairs are set such that a K-th page among the first to the N-th pages and an (N+K)-th page among the (N+1)-th to 2N-th pages form one page pair. Parity regions of two pages included in at least one page pair are shared by the two pages included in the at least one page pair.
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公开(公告)号:US12125534B2
公开(公告)日:2024-10-22
申请号:US17935122
申请日:2022-09-25
发明人: Younggul Song , Junyeong Seok , Eun Chu Oh , Byungchul Jang
CPC分类号: G11C16/0483 , G11C5/063 , G11C16/08 , H10B69/00
摘要: A storage device includes a non-volatile memory device. The non-volatile memory device includes a first substrate including a first peripheral circuit region including a row decoder selecting one word line from among a plurality of word lines of a three-dimensional (3D) memory cell array and a second substrate including a second peripheral circuit region, including a page buffer unit selecting at least one bit line from among a plurality of bit lines of the 3D memory cell array, and a cell region including the 3D memory cell array formed in the second peripheral circuit region. The 3D memory cell array is disposed between the first peripheral circuit region and the second peripheral circuit region by vertically stacking and bonding the second substrate on and to the first substrate.
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