Method for monitoring and adjusting circuit performance
    3.
    发明授权
    Method for monitoring and adjusting circuit performance 有权
    监控和调整电路性能的方法

    公开(公告)号:US07797596B2

    公开(公告)日:2010-09-14

    申请号:US11861403

    申请日:2007-09-26

    IPC分类号: G11C29/00

    CPC分类号: G01R31/3187

    摘要: A method for testing an integrated circuit implemented in an electronic system. The method includes placing an integrated circuit (or portion thereof) that is implemented in an operational system (e.g., in a computer system) in an offline status. An electrical parameter of the integrated system (e.g., a voltage, clock frequency, etc.) is set, and a built-in self-test (BIST) is conducted. Any failures that occur during the BIST are recorded. Testing is then repeated for each of a plurality of predetermined values of the electrical parameter, recording any failures that occur. Once testing is complete a failure rate/range is determined for each of the predetermined values.

    摘要翻译: 一种用于测试在电子系统中实现的集成电路的方法。 该方法包括在离线状态下放置在操作系统(例如,计算机系统)中实现的集成电路(或其部分)。 设置集成系统的电参数(例如,电压,时钟频率等),并且进行内置自检(BIST)。 记录在BIST期间发生的任何故障。 然后针对电参数的多个预定值中的每一个重复测试,记录发生的任何故障。 一旦测试完成,则为每个预定值确定故障率/范围。

    Bonding pad scheme
    6.
    发明授权
    Bonding pad scheme 失效
    粘接垫方案

    公开(公告)号:US4990996A

    公开(公告)日:1991-02-05

    申请号:US134921

    申请日:1987-12-18

    摘要: A technique is disclosed for manufacturing an integrated circuit die which is capable of being packaged in any of two or more different package types having different arrangements of bonding posts. The circuit is laid out with redundant pads located at different places on the die so that one pad in each pair of redundant pads is accessible for bonding with posts in one package type, while the other pad in each pair of redundant pads is accessible for bonding with posts in another package type. Illustrative layouts are shown whereby various types of pads, e.g., power pads, signal input pads, signal output pads and bidirectional I/O pads, may be made redundant.

    摘要翻译: 公开了一种用于制造集成电路管芯的技术,其能够以具有不同布置的接合柱的两种或多种不同的封装类型中的任何一种封装。 该电路布置有位于管芯上不同位置的冗余焊盘,使得每对冗余焊盘中的一个焊盘可访问,用于与一个封装类型的焊盘结合,而每对冗余焊盘中的另一个焊盘可用于焊接 在另一个包类型的帖子。 示出了示例性布局,由此可以使各种类型的焊盘,例如电源焊盘,信号输入焊盘,信号输出焊盘和双向I / O焊盘成为冗余的。

    METHOD FOR MONITORING AND ADJUSTING CIRCUIT PERFORMANCE
    7.
    发明申请
    METHOD FOR MONITORING AND ADJUSTING CIRCUIT PERFORMANCE 有权
    监测和调整电路性能的方法

    公开(公告)号:US20090083598A1

    公开(公告)日:2009-03-26

    申请号:US11861403

    申请日:2007-09-26

    IPC分类号: G01R31/3187 G06F11/27

    CPC分类号: G01R31/3187

    摘要: A method for testing an integrated circuit implemented in an electronic system. The method includes placing an integrated circuit (or portion thereof) that is implemented in an operational system (e.g., in a computer system) in an offline status. An electrical parameter of the integrated system (e.g., a voltage, clock frequency, etc.) is set, and a built-in self-test (BIST) is conducted. Any failures that occur during the BIST are recorded. Testing is then repeated for each of a plurality of predetermined values of the electrical parameter, recording any failures that occur. Once testing is complete a failure rate/range is determined for each of the predetermined values.

    摘要翻译: 一种用于测试在电子系统中实现的集成电路的方法。 该方法包括在离线状态下放置在操作系统(例如,计算机系统)中实现的集成电路(或其部分)。 设置集成系统的电参数(例如,电压,时钟频率等),并且进行内置自检(BIST)。 记录在BIST期间发生的任何故障。 然后针对电参数的多个预定值中的每一个重复测试,记录发生的任何故障。 一旦测试完成,则为每个预定值确定故障率/范围。