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公开(公告)号：US06215185B1
公开(公告)日：2001-04-10
申请号：US09456403
申请日：1999-12-08
申请人： Takumi Kikuchi , Hirofumi Fujioka , Toshiyuki Kikunaga , Hirotaka Muto , Shinichi Kinouchi , Osamu Usui , Takeshi Ohi
发明人： Takumi Kikuchi , Hirofumi Fujioka , Toshiyuki Kikunaga , Hirotaka Muto , Shinichi Kinouchi , Osamu Usui , Takeshi Ohi
IPC分类号： H01L2348
CPC分类号： H01L24/72 , H01L23/49579 , H01L24/37 , H01L24/40 , H01L24/45 , H01L24/48 , H01L2224/37599 , H01L2224/45124 , H01L2224/48091 , H01L2224/48491 , H01L2224/48699 , H01L2224/73265 , H01L2224/83801 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01028 , H01L2924/01029 , H01L2924/01042 , H01L2924/01047 , H01L2924/01078 , H01L2924/01079 , H01L2924/014 , H01L2924/1301 , H01L2924/13033 , H01L2924/1305 , H01L2924/13055 , H01L2924/13091 , H01L2924/351 , H01L2924/00 , H01L2224/37099 , H01L2224/85399 , H01L2224/05599
摘要： An object is to obtain long-term reliability of an electric connection in a power semiconductor module. In a power semiconductor module, the main circuit interconnection directly connected to a power semiconductor chip (3) is formed of a busbar (6) and the power semiconductor chip (3) and the busbar electrode (6a) of the busbar (6) are electrically connected through a conductive resin (12). A member (13) having lower thermal expansion than the busbar electrode (6a) is joined to the busbar electrode (6a) in the part adjacent to said power semiconductor chip (3).
摘要翻译： 目的在于获得功率半导体模块中的电连接的长期可靠性。 在功率半导体模块中，直接连接到功率半导体芯片（3）的主电路互连由母线（6）和母线（6）的功率半导体芯片（3）和母线电极（6a）形成 通过导电树脂（12）电连接。 具有比母线电极（6a）低的热膨胀的部件（13）在与所述功率半导体芯片（3）相邻的部分中与汇流条电极（6a）接合。
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公开(公告)号：US20130153900A1
公开(公告)日：2013-06-20
申请号：US13818993
申请日：2011-08-26
IPC分类号： H01L23/34
CPC分类号： H01L23/34 , G01K7/01 , H01L29/1608 , H01L29/66068 , H01L29/7803 , H01L29/7815 , H01L29/7828 , H01L2924/0002 , H01L2924/00
摘要： A semiconductor device capable of rapidly and accurately sensing the information regarding the temperature of a semiconductor transistor contained therein. A MOSFET includes a plurality of cells, and includes a main cell group including a cell for supplying a current to a load among the plurality of cells, and a sense cell group including a cell for sensing temperature information regarding the temperature of the MOSFET thereamong. The main cell group and the sense cell group have different temperature characteristics showing changes in electrical characteristics to changes in temperature. A temperature sensing circuit senses the temperature of the MOSFET based on, for example, a value of a main current flowing through the main cell group and a value of a sense current flowing through the sense cell group.
摘要翻译： 一种半导体器件，其能够快速且准确地感测关于其中包含的半导体晶体管的温度的信息。 MOSFET包括多个单元，并且包括主单元组，其包括用于向多个单元之间的负载提供电流的单元，以及包括用于感测关于MOSFET的温度的温度信息的单元的感测单元组。 主电池组和感应电池组具有不同的温度特性，显示电特性随温度变化的变化。 温度检测电路基于例如流过主单元组的主电流的值和流过感测单元组的感测电流的值来感测MOSFET的温度。
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3.发明授权公开(公告)号：US09270193B2
公开(公告)日：2016-02-23
申请号：US13582834
申请日：2010-10-29
申请人： Takeshi Tanaka , Shinichi Kinouchi
发明人： Takeshi Tanaka , Shinichi Kinouchi
CPC分类号： H02M5/4585 , B60L9/22 , B60L2200/26 , H03K17/127
摘要： A power semiconductor module includes an element pair formed by connecting, in anti-parallel to each other, an IGBT and an FWD group in which an FWD, a voltage drop characteristic of which during conduction has a negative temperature coefficient, and an FED, a voltage drop characteristic of which during conduction has a positive temperature coefficient, are connected in series and an element pair formed by connecting, in anti-parallel to each other, an IGBT and an FWD group in which a FWD, a voltage drop characteristic of which during conduction has a negative temperature coefficient, and an FWD, a voltage drop characteristic of which during conduction has a positive temperature coefficient, are connected in series. The element pairs are connected in parallel.
摘要翻译： 功率半导体模块包括通过以彼此反并联的方式连接IGBT和FWD组形成的元件对，其中FWD（其导通期间的电压降特性具有负温度系数）以及FED， 在导通期间具有正温度系数的电压降特性串联连接，并且通过将IGBT和FWD组反向并联连接形成的元件对，其中FWD，其电压降特性 在导通时具有负温度系数，并且在导通期间具有正温度系数的电压降特性的FWD串联连接。 元件对并联连接。
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公开(公告)号：US08785931B2
公开(公告)日：2014-07-22
申请号：US13818993
申请日：2011-08-26
CPC分类号： H01L23/34 , G01K7/01 , H01L29/1608 , H01L29/66068 , H01L29/7803 , H01L29/7815 , H01L29/7828 , H01L2924/0002 , H01L2924/00
摘要： A semiconductor device capable of rapidly and accurately sensing the information regarding the temperature of a semiconductor transistor contained therein. A MOSFET includes a plurality of cells, and includes a main cell group including a cell for supplying a current to a load among the plurality of cells, and a sense cell group including a cell for sensing temperature information regarding the temperature of the MOSFET thereamong. The main cell group and the sense cell group have different temperature characteristics showing changes in electrical characteristics to changes in temperature. A temperature sensing circuit senses the temperature of the MOSFET based on, for example, a value of a main current flowing through the main cell group and a value of a sense current flowing through the sense cell group.
摘要翻译： 一种半导体器件，其能够快速且准确地感测关于其中包含的半导体晶体管的温度的信息。 MOSFET包括多个单元，并且包括主单元组，其包括用于向多个单元之间的负载提供电流的单元，以及包括用于感测关于MOSFET的温度的温度信息的单元的感测单元组。 主电池组和感应电池组具有不同的温度特性，显示电特性随温度变化的变化。 温度检测电路基于例如流过主单元组的主电流的值和流过感测单元组的感测电流的值来感测MOSFET的温度。
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公开(公告)号：US07948277B2
公开(公告)日：2011-05-24
申请号：US12294437
申请日：2007-04-04
申请人： Hiroshi Nakatake , Satoshi Ishibashi , Shinsuke Idenoue , Takeshi Oi , Shinichi Kinouchi , Takeshi Horiguchi
发明人： Hiroshi Nakatake , Satoshi Ishibashi , Shinsuke Idenoue , Takeshi Oi , Shinichi Kinouchi , Takeshi Horiguchi
IPC分类号： H03K3/00
CPC分类号： H03K17/18 , H03K17/08128 , H03K17/168
摘要： A drive circuit wherein any abnormality of a semiconductor element is prevented from being erroneously sensed in a case where a gate “ON” command has entered in a state in which a gate voltage of the semiconductor element has not lowered fully. A detection process for a controlled variable of the semiconductor element is permitted only within a period which corresponds to a controlled variable of the semiconductor element at the time when an “ON” signal has been inputted to a control circuit, and a detected controlled variable which is detected within the period and a comparison controlled variable which is set in correspondence with the controlled variable are compared so as to output an abnormality signal, whereby the semiconductor element is turn-off at a speed lower than in normal turn-off.
摘要翻译： 在半导体元件的栅极电压未完全降低的状态下，在栅极“ON”指令进入的情况下，防止半导体元件的任何异常被错误地检测到的驱动电路。 只有在“ON”信号被输入到控制电路时的半导体元件的受控变量对应的期间内才允许半导体元件的受控变量的检测处理，以及检测到的控制变量， 在与该控制变量对应的情况下设定的比较控制变量进行比较，从而输出异常信号，由此半导体元件以比正常关断低的速度关断。
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公开(公告)号：US06212059B1
公开(公告)日：2001-04-03
申请号：US09592862
申请日：2000-06-13
IPC分类号： H01G410
CPC分类号： C23C16/448 , C23C16/409 , H01G4/085 , H01G4/1227 , H01L21/31691 , H01L28/40 , H01L28/55
摘要： A capacitor for memory devices including a barium strontium titanate system dielectric film, the film being formed from a chemical vapor deposition source material including a liquid solution of respective organometallic compounds of barium, strontium, and titanium dissolved in tetrahydrofuran.
摘要翻译： 一种用于包括钡锶钛酸盐系介电膜的存储器件的电容器，该膜由化学气相沉积源材料形成，该化学气相沉积源材料包括溶解在四氢呋喃中的各种钡，锶和钛的有机金属化合物的液体溶液。
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公开(公告)号：US6103002A
公开(公告)日：2000-08-15
申请号：US112569
申请日：1998-07-09
IPC分类号： C23C16/40 , C23C16/448 , H01L21/02 , H01L21/314 , H01L21/316
CPC分类号： C23C16/448 , C23C16/409 , H01G4/085 , H01G4/1227 , H01L21/31691 , H01L28/40 , H01L28/55
摘要： The multi-source raw material are dissolved in the tetra-hydrofuran, in a liquid state and evaporated simultaneously and stably transported to the reactor, thereby the dielectric thin film used for capacitor having a good performance is formed with a good repeatability. The present invention provides CVD raw material for oxide-system dielectric thin film wherein organic metal raw material is dissolved in the tetra-hydrofuran and the metal atom of the organic metal raw material is selected at least among Pb, Ti, Zr or alkaline earth metal. As a result, a stable dielectric thin film can be formed by CVD method and the dielectric thin film can be used for a capacitor for memory devices.
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8.发明授权
公开(公告)号：US5413981A
公开(公告)日：1995-05-09
申请号：US93137
申请日：1993-07-19
申请人： Kunihiko Egawa , Toshio Umemura , Shinichi Kinouchi , Mitsunobu Wakata , Shin Utsunomiya , Ayumi Nozaki
发明人： Kunihiko Egawa , Toshio Umemura , Shinichi Kinouchi , Mitsunobu Wakata , Shin Utsunomiya , Ayumi Nozaki
CPC分类号： H01L39/2483 , Y10S505/782 , Y10S505/784 , Y10S505/785
摘要： A method for manufacturing the oxide superconductor according to the present invention comprises the steps of: mixing a starting material including Bi, Sr, Ca and Cu such that a mole ratio of Bi, Sr, Ca and Cu is 2:2+a:1+b:2+c, wherein a.gtoreq.0, b.gtoreq.0, c.gtoreq.0, and 0
摘要翻译： 根据本发明的制造氧化物超导体的方法包括以下步骤：将包含Bi，Sr，Ca和Cu的原料混合，使得Bi，Sr，Ca和Cu的摩尔比为2:2 + a:1 + b：2 + c，其中a> / = 0，b> / = 0，c> / = 0和0 / = x <1）细分散在Bi2Sr2Ca1Cu2Oy（其中y约为8）的超导晶体中。 沉淀物作为磁通钉扎中心。 此外，根据本发明的氧化物超导体包括由Bi，Sr，Ca和Cu氧化物组成的超导结晶，并且将包含Pt作为主要成分的分离的氧化物相被精细地分散在超导晶体中。 这些细分散的氧化物包括Pt作为磁通钉扎中心。
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公开(公告)号：US09024564B2
公开(公告)日：2015-05-05
申请号：US13851511
申请日：2013-03-27
申请人： Shinichi Kinouchi , Kosuke Nakano
发明人： Shinichi Kinouchi , Kosuke Nakano
摘要： The invention provides a drive control device that comprises: inverters that are connected to a motor; a variable resistive element that is connected between the motor and each of the inverters; a current/voltage detection device connected between the motor and each of the inverters; and a controller that, when detecting a fault of an inverter that drives the motor based on a detection signal from the current/voltage detection device, gradually increases a resistance value of a variable resistive element provided between the faulty inverter and the motor at a velocity of a resistance variation such that a surge voltage has a voltage value for which the variable resistive element and the motor are not damaged, and executes drive control of the motor by a normal inverter other than the faulty inverter.
摘要翻译： 本发明提供了一种驱动控制装置，其包括：连接到电动机的反相器; 连接在电动机和每个逆变器之间的可变电阻元件; 连接在电动机和每个逆变器之间的电流/电压检测装置; 以及控制器，当基于来自所述电流/电压检测装置的检测信号检测到驱动所述电动机的逆变器的故障时，以设定在所述故障逆变器和所述电动机之间的可变电阻元件的电阻值以速度逐渐增加 电阻变化使得浪涌电压具有可变电阻元件和电动机不被损坏的电压值，并且通过除故障逆变器之外的正常逆变器来执行电动机的驱动控制。
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公开(公告)号：US20100231269A1
公开(公告)日：2010-09-16
申请号：US12294437
申请日：2007-04-04
申请人： Hiroshi Nakatake , Satoshi Ishibashi , Shinsuke Idenoue , Takeshi Oi , Shinichi Kinouchi , Takeshi Horiguchi
发明人： Hiroshi Nakatake , Satoshi Ishibashi , Shinsuke Idenoue , Takeshi Oi , Shinichi Kinouchi , Takeshi Horiguchi
IPC分类号： H03K3/021
CPC分类号： H03K17/18 , H03K17/08128 , H03K17/168
摘要： A drive circuit wherein any abnormality of a semiconductor element is prevented from being erroneously sensed in a case where a gate “ON” command has entered in a state in which a gate voltage of the semiconductor element has not lowered fully. A detection process for a controlled variable of the semiconductor element is permitted only within a period which corresponds to a controlled variable of the semiconductor element at the time when an “ON” signal has been inputted to a control circuit, and a detected controlled variable which is detected within the period and a comparison controlled variable which is set in correspondence with the controlled variable are compared so as to output an abnormality signal, whereby the semiconductor element is turn-off at a speed lower than in normal turn-off.
摘要翻译： 在半导体元件的栅极电压未完全降低的状态下，在栅极“ON”指令进入的情况下，防止半导体元件的任何异常被错误地检测到的驱动电路。 只有在“ON”信号被输入到控制电路时的半导体元件的受控变量对应的期间内才允许半导体元件的受控变量的检测处理，以及检测到的控制变量， 在与该控制变量对应的情况下设定的比较控制变量进行比较，从而输出异常信号，由此半导体元件以比正常关断低的速度关断。
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