Probe for scanning over a substrate and data storage device
    1.
    发明授权
    Probe for scanning over a substrate and data storage device 失效
    用于扫描基板和数据存储设备的探头

    公开(公告)号:US08373431B2

    公开(公告)日:2013-02-12

    申请号:US12054938

    申请日:2008-03-25

    IPC分类号: G01R31/02 G01R31/28

    摘要: A data storage device comprises a storage medium for storing data in the form of marks and at least one probe for scanning the storage medium. The storage medium may be comprised in a substrate. The probe comprises a cantilever that comprises terminals serving as electrical contacts an being during operation of the probe mechanically fixed to a probe-holding structure, which may be a common frame of the data storage device. A probe further comprises a supporting structure, to which the terminals are mechanically directly coupled or coupled via hinges and which extends away from the terminals. A tip with a nanoscale apex is provided. A beam structure comprises a heating resistor and is attached at ends to the supporting structure. The beam structure is thinned at least in a direction parallel to an axis of the tip compared to an area of the supporting structure abutting the beam structure.

    摘要翻译: 数据存储装置包括用于以标记形式存储数据的存储介质和用于扫描存储介质的至少一个探针。 存储介质可以包含在基板中。 探头包括悬臂,其包括用作电触点的端子,所述端子在机械地固定到探头保持结构的探头的操作期间,探头保持结构可以是数据存储装置的公共框架。 探头还包括支撑结构,端子通过铰链机械地直接联接或耦合到该支撑结构,并且远离端子延伸。 提供具有纳米级顶点的尖端。 梁结构包括加热电阻器,并且在端部附接到支撑结构。 与支撑结构邻接梁结构的区域相比,梁结构至少在平行于尖端的轴线的方向上变薄。

    Probe for scanning over a substrate and a data storage device
    2.
    发明授权
    Probe for scanning over a substrate and a data storage device 失效
    用于扫描基板和数据存储设备的探头

    公开(公告)号:US07482826B2

    公开(公告)日:2009-01-27

    申请号:US11332137

    申请日:2006-01-13

    IPC分类号: G01R31/02

    摘要: A data storage device comprises a storage medium for storing data in the form of marks and at least one probe for scanning the storage medium. The storage medium may be comprised in a substrate. The probe comprises a cantilever that comprises terminals serving as electrical contacts an being during operation of the probe mechanically fixed to a probe-holding structure, which may be a common frame of the data storage device. A probe further comprises a supporting structure, to which the terminals are mechanically directly coupled or coupled via hinges and which extends away from the terminals. A tip with a nanoscale apex is provided. A beam structure comprises a heating resistor and is attached at ends to the supporting structure. The beam structure is thinned at least in a direction parallel to an axis of the tip compared to an area of the supporting structure abutting the beam structure.

    摘要翻译: 数据存储装置包括用于以标记形式存储数据的存储介质和用于扫描存储介质的至少一个探针。 存储介质可以包含在基板中。 探头包括悬臂,其包括用作电触点的端子,所述端子在机械地固定到探头保持结构的探头的操作期间,探头保持结构可以是数据存储装置的公共框架。 探头还包括支撑结构,端子通过铰链机械地直接联接或耦合到该支撑结构,并且远离端子延伸。 提供具有纳米级顶点的尖端。 梁结构包括加热电阻器,并且在端部附接到支撑结构。 与支撑结构邻接梁结构的区域相比,梁结构至少在平行于尖端的轴线的方向上变薄。

    PROBE FOR SCANNING OVER A SUBSTRATE AND DATA STORAGE DEVICE
    3.
    发明申请
    PROBE FOR SCANNING OVER A SUBSTRATE AND DATA STORAGE DEVICE 失效
    用于扫描基板和数据存储设备的探测

    公开(公告)号:US20090003188A1

    公开(公告)日:2009-01-01

    申请号:US12054938

    申请日:2008-03-25

    IPC分类号: G11B3/00

    摘要: A data storage device comprises a storage medium for storing data in the form of marks and at least one probe for scanning the storage medium. The storage medium may be comprised in a substrate. The probe comprises a cantilever that comprises terminals serving as electrical contacts an being during operation of the probe mechanically fixed to a probe-holding structure, which may be a common frame of the data storage device. A probe further comprises a supporting structure, to which the terminals are mechanically directly coupled or coupled via hinges and which extends away from the terminals. A tip with a nanoscale apex is provided. A beam structure comprises a heating resistor and is attached at ends to the supporting structure. The beam structure is thinned at least in a direction parallel to an axis of the tip compared to an area of the supporting structure abutting the beam structure.

    摘要翻译: 数据存储装置包括用于以标记形式存储数据的存储介质和用于扫描存储介质的至少一个探针。 存储介质可以包含在基板中。 探头包括悬臂,其包括用作电触点的端子,所述端子在机械地固定到探头保持结构的探头的操作期间,探头保持结构可以是数据存储装置的公共框架。 探头还包括支撑结构,端子通过铰链机械地直接联接或耦合到该支撑结构,并且远离端子延伸。 提供具有纳米级顶点的尖端。 梁结构包括加热电阻器,并且在端部附接到支撑结构。 与支撑结构邻接梁结构的区域相比,梁结构至少在平行于尖端的轴线的方向上变薄。

    Probe for scanning over a substrate and a data storage device
    4.
    发明申请
    Probe for scanning over a substrate and a data storage device 失效
    用于扫描基板和数据存储设备的探头

    公开(公告)号:US20080013437A1

    公开(公告)日:2008-01-17

    申请号:US11332137

    申请日:2006-01-13

    IPC分类号: G11B3/00

    摘要: A data storage device comprises a storage medium for storing data in the form of marks and at least one probe for scanning the storage medium. The storage medium may be comprised in a substrate. The probe comprises a cantilever that comprises terminals serving as electrical contacts an being during operation of the probe mechanically fixed to a probe-holding structure, which may be a common frame of the data storage device. A probe further comprises a supporting structure, to which the terminals are mechanically directly coupled or coupled via hinges and which extends away from the terminals. A tip with a nanoscale apex is provided. A beam structure comprises a heating resistor and is attached at ends to the supporting structure. The beam structure is thinned at least in a direction parallel to an axis of the tip compared to an area of the supporting structure abutting the beam structure.

    摘要翻译: 数据存储装置包括用于以标记形式存储数据的存储介质和用于扫描存储介质的至少一个探针。 存储介质可以包含在基板中。 探头包括悬臂,其包括用作电触点的端子,所述端子在机械地固定到探头保持结构的探头的操作期间,探头保持结构可以是数据存储装置的公共框架。 探头还包括支撑结构,端子通过铰链机械地直接联接或耦合到该支撑结构,并且远离端子延伸。 提供具有纳米级顶点的尖端。 梁结构包括加热电阻器,并且在端部附接到支撑结构。 与支撑结构邻接梁结构的区域相比,梁结构至少在平行于尖端的轴线的方向上变薄。

    Method and System for Self-Aligning Parts in Mems
    5.
    发明申请
    Method and System for Self-Aligning Parts in Mems 审中-公开
    内存中自动对齐零件的方法和系统

    公开(公告)号:US20080011814A1

    公开(公告)日:2008-01-17

    申请号:US10596349

    申请日:2004-11-08

    IPC分类号: B23K31/02 B81B7/00

    摘要: A method and system for efficiently self-aligning parts of a MEMS during manufacturing, as well as controlling distance between these parts, are disclosed. According to the invention each MEMS part comprises at least one pad that is aligned so as to form a pair of pads. In a preferred embodiment, each part comprises three pads. The pad shape of two pairs of pads is rectangular, one pair being rotated of an angle approximately equal to 90° from the other, and the pad shape of the third pair is annular. Therefore, one of the pair of pads allows alignment according to a first direction, a second pair of pads allows alignment according to a second direction, and the third pair of pads allows rotational alignment.

    摘要翻译: 公开了一种用于在制造期间有效地对准MEMS部件的方法和系统,以及控制这些部件之间的距离。 根据本发明,每个MEMS部件包括至少一个对准以形成一对焊盘的焊盘。 在优选实施例中,每个部分包括三个焊盘。 两对焊盘的焊盘形状是矩形的,一对由另一对旋转大约等于90°的角度,第三对的焊盘形状是环形的。 因此,一对衬垫之一允许根据第一方向进行对准,第二对衬垫允许根据第二方向对准,并且第三对衬垫允许旋转对准。

    Microsystem and method for positioning a second element with respect to a first element in a microsystem
    10.
    发明授权
    Microsystem and method for positioning a second element with respect to a first element in a microsystem 有权
    用于相对于微系统中的第一元件定位第二元件的微系统和方法

    公开(公告)号:US07906887B2

    公开(公告)日:2011-03-15

    申请号:US11577331

    申请日:2005-09-29

    IPC分类号: H02N10/00

    摘要: A microsystem, comprising a first static element (1), a second, movable and unattached element (2), an actuator (3) for effecting a force between the first and the second element (1, 2), which actuator (3) is designed for controlling a temperature (T1, T2) of one of the first element (1) and the second element (2). A corresponding method for positioning a second element (2) with respect to a first element (1) in a microsystem is introduced.

    摘要翻译: 一种微系统,包括第一静态元件(1),第二可移动和未附接元件(2),用于在第一和第二元件(1,2)之间产生力的致动器(3),该致动器(3) 被设计用于控制第一元件(1)和第二元件(2)之一的温度(T1,T2)。 引入了相对于在微系统中相对于第一元件(1)定位第二元件(2)的方法。