PVD PROCESS WITH SYNCHRONIZED PROCESS PARAMETERS AND MAGNET POSITION
    9.
    发明申请
    PVD PROCESS WITH SYNCHRONIZED PROCESS PARAMETERS AND MAGNET POSITION 审中-公开
    具有同步工艺参数和磁体位置的PVD工艺

    公开(公告)号:US20120181166A1

    公开(公告)日:2012-07-19

    申请号:US13007228

    申请日:2011-01-14

    IPC分类号: C23C14/35

    摘要: Embodiments of the present invention generally relate to methods for physical vapor deposition processes. The methods generally include synchronizing process chamber conditions with the position of a magnetron. As the magnetron is scanned over a first area of a target, the conditions within the chamber are adjusted to a first set of predetermined process conditions. As the magnetron is subsequently scanned over a second area of the target, the conditions within the chamber are adjusted to a second set of predetermined process conditions different the first set. The target may be divided into more than two areas. By correlating the position of the magnetron with different sets of process conditions, film uniformity can be improved by reducing center-to-edge non-uniformities, such as re-sputter rates which may be higher when the magnetron is near the edge of the target.

    摘要翻译: 本发明的实施方案一般涉及物理气相沉积方法的方法。 方法通常包括使处理室条件与磁控管的位置同步。 当磁控管在目标的第一区域上被扫描时,腔室内的条件被调整到第一组预定的工艺条件。 随着磁控管随后在目标的第二区域上扫描,腔室内的条件被调整到与第一组不同的第二组预定过程条件。 目标可分为两个以上的区域。 通过将磁控管的位置与不同的工艺条件相关联,可以通过减小中心到边缘的不均匀性来改善膜均匀性,例如当磁控管靠近靶的边缘时可能更高的再溅射速率 。