Multi-level memory arrays with memory cells that employ bipolar storage elements and methods of forming the same
    3.
    发明授权
    Multi-level memory arrays with memory cells that employ bipolar storage elements and methods of forming the same 有权
    具有使用双极存储元件的存储器单元的多级存储器阵列及其形成方法

    公开(公告)号:US08841648B2

    公开(公告)日:2014-09-23

    申请号:US12904802

    申请日:2010-10-14

    摘要: In some embodiments, a memory array is provided that includes (1) a first memory cell having (a) a first conductive line; (b) a first bipolar storage element formed above the first conductive line; and (c) a second conductive line formed above the first bipolar storage element; and (2) a second memory cell formed above the first memory cell and having (a) a second bipolar storage element formed above the second conductive line; and (b) a third conductive line formed above the second bipolar storage element. The first and second memory cells share the second conductive line; the first bipolar storage element has a first storage element polarity orientation within the first memory cell; the second bipolar storage element has a second storage element polarity orientation within the second memory cell; and the second storage element polarity orientation is opposite the first storage element polarity orientation. Numerous other aspects are provided.

    摘要翻译: 在一些实施例中,提供了一种存储器阵列,其包括(1)具有(a)第一导电线的第一存储器单元; (b)形成在第一导线之上的第一双极存储元件; 和(c)形成在所述第一双极存储元件上方的第二导线; 以及(2)形成在所述第一存储单元上方的第二存储单元,并且具有(a)形成在所述第二导线上方的第二双极存储元件; 和(b)形成在第二双极存储元件上方的第三导线。 第一和第二存储单元共享第二导线; 第一双极存储元件在第一存储单元内具有第一存储元件极性取向; 所述第二双极存储元件在所述第二存储单元内具有第二存储元件极性取向; 并且第二存储元件极性取向与第一存储元件极性取向相反。 提供了许多其他方面。

    MULTI-LEVEL MEMORY ARRAYS WITH MEMORY CELLS THAT EMPLOY BIPOLAR STORAGE ELEMENTS AND METHODS OF FORMING THE SAME
    4.
    发明申请
    MULTI-LEVEL MEMORY ARRAYS WITH MEMORY CELLS THAT EMPLOY BIPOLAR STORAGE ELEMENTS AND METHODS OF FORMING THE SAME 有权
    具有使用双极存储元件的存储器单元的多级存储器阵列及其形成方法

    公开(公告)号:US20120091427A1

    公开(公告)日:2012-04-19

    申请号:US12904802

    申请日:2010-10-14

    IPC分类号: H01L45/00 H01L21/02

    摘要: In some embodiments, a memory array is provided that includes (1) a first memory cell having (a) a first conductive line; (b) a first bipolar storage element formed above the first conductive line; and (c) a second conductive line formed above the first bipolar storage element; and (2) a second memory cell formed above the first memory cell and having (a) a second bipolar storage element formed above the second conductive line; and (b) a third conductive line formed above the second bipolar storage element. The first and second memory cells share the second conductive line; the first bipolar storage element has a first storage element polarity orientation within the first memory cell; the second bipolar storage element has a second storage element polarity orientation within the second memory cell; and the second storage element polarity orientation is opposite the first storage element polarity orientation. Numerous other aspects are provided.

    摘要翻译: 在一些实施例中,提供了一种存储器阵列,其包括(1)具有(a)第一导电线的第一存储器单元; (b)形成在第一导线之上的第一双极存储元件; 和(c)形成在所述第一双极存储元件上方的第二导线; 以及(2)形成在所述第一存储单元上方的第二存储单元,并且具有(a)形成在所述第二导线上方的第二双极存储元件; 和(b)形成在第二双极存储元件上方的第三导线。 第一和第二存储单元共享第二导线; 第一双极存储元件在第一存储单元内具有第一存储元件极性取向; 所述第二双极存储元件在所述第二存储单元内具有第二存储元件极性取向; 并且第二存储元件极性取向与第一存储元件极性取向相反。 提供了许多其他方面。

    Punch-through diode steering element
    5.
    发明授权
    Punch-through diode steering element 有权
    穿通二极管转向元件

    公开(公告)号:US08575715B2

    公开(公告)日:2013-11-05

    申请号:US13571100

    申请日:2012-08-09

    IPC分类号: H01L29/66

    摘要: A storage system and method for forming a storage system that uses punch-through diodes as a steering element in series with a reversible resistivity-switching element is described. The punch-through diode allows bipolar operation of a cross-point memory array. The punch-through diode may have a symmetrical non-linear current/voltage relationship. The punch-through diode has a high current at high bias for selected cells and a low leakage current at low bias for unselected cells. Therefore, it is compatible with bipolar switching in cross-point memory arrays having resistive switching elements. The punch-through diode may be a N+/P−/N+ device or a P+/N−/P+ device.

    摘要翻译: 描述了一种用于形成使用穿通二极管作为与可逆电阻率切换元件串联的转向元件的存储系统的存储系统和方法。 穿通二极管允许交叉点存储器阵列的双极性操作。 穿通二极管可具有对称的非线性电流/电压关系。 穿通二极管在选择的电池的高偏压下具有高电流,对于未选择的电池,在低偏压下具有低泄漏电流。 因此,它与具有电阻式开关元件的交叉点存储器阵列中的双极开关兼容。 穿通二极管可以是N + / P- / N +器件或P + / N- / P +器件。

    Method for memory cell erasure with a programming monitor of reference cells
    6.
    发明授权
    Method for memory cell erasure with a programming monitor of reference cells 有权
    用参考单元的编程监视器进行存储单元擦除的方法

    公开(公告)号:US08514629B2

    公开(公告)日:2013-08-20

    申请号:US13602762

    申请日:2012-09-04

    IPC分类号: G11C16/16

    摘要: Embodiments of the present disclosure provide methods, devices, modules, and systems for operating memory cells. One method includes: performing an erase operation on a selected group of memory cells, the selected group including a number of reference cells and a number of data cells; performing a programming monitor operation on the number of reference cells as part of the erase operation; and determining a number of particular operating parameters associated with operating the number of data cells at least partially based on the programming monitor operation performed on the number of reference cells.

    摘要翻译: 本公开的实施例提供用于操作存储器单元的方法,设备,模块和系统。 一种方法包括:对所选择的一组存储器单元执行擦除操作,所选择的组包括多个参考单元和多个数据单元; 对作为擦除操作的一部分的参考单元的数量进行编程监视操作; 以及至少部分地基于对参考单元的数量执行的编程监视操作来确定与操作所述数据单元的数量相关联的特定操作参数的数量。

    Junctionless TFT NAND flash memory
    7.
    发明授权
    Junctionless TFT NAND flash memory 有权
    无结点TFT NAND闪存

    公开(公告)号:US08395942B2

    公开(公告)日:2013-03-12

    申请号:US12848458

    申请日:2010-08-02

    IPC分类号: G11C11/34 H01L29/06 H01L29/76

    摘要: A method of making a NAND string includes forming a semiconductor layer over a major surface of a substrate, patterning the semiconductor layer into an elongated nanowire shaped channel extending substantially parallel to the major surface of the substrate, forming a tunneling dielectric layer over the channel, forming a plurality of charge storage regions over the tunneling dielectric layer and undercutting the channel using the plurality of charge storage regions as mask. The channel has a narrower width than each charge storage region width, and an overhanging portion of each of the plurality of charge storage regions overhangs the channel. The method also includes forming a blocking dielectric layer over the plurality of charge storage regions, such that the blocking dielectric layer fills a space below the overhanging portion of each of the plurality of charge storage regions and forming a plurality of control gates over the blocking dielectric layer.

    摘要翻译: 制造NAND串的方法包括在衬底的主表面上形成半导体层,将半导体层图案化成基本上平行于衬底的主表面延伸的细长的纳米线形状的沟道,在沟道上形成隧穿介电层, 在隧道电介质层上形成多个电荷存储区域,并使用多个电荷存储区域作为掩模来对沟道进行底切。 通道具有比每个电荷存储区域宽度窄的宽度,并且多个电荷存储区域中的每一个的悬伸部分悬垂在通道上。 该方法还包括在多个电荷存储区域上形成阻挡电介质层,使得阻挡介电层填充多个电荷存储区域中的每一个的悬垂部分下面的空间,并在阻挡电介质上形成多个控制栅极 层。

    Method for memory cell erasure with a programming monitor of reference cells
    8.
    发明授权
    Method for memory cell erasure with a programming monitor of reference cells 有权
    用参考单元的编程监视器进行存储单元擦除的方法

    公开(公告)号:US07924623B2

    公开(公告)日:2011-04-12

    申请号:US12127415

    申请日:2008-05-27

    IPC分类号: G11C16/16

    摘要: Embodiments of the present disclosure provide methods, devices, modules, and systems for operating memory cells. One method includes: performing an erase operation on a selected group of memory cells, the selected group including a number of reference cells and a number of data cells; performing a programming monitor operation on the number of reference cells as part of the erase operation; and determining a number of particular operating parameters associated with operating the number of data cells at least partially based on the programming monitor operation performed on the number of reference cells.

    摘要翻译: 本公开的实施例提供用于操作存储器单元的方法,设备,模块和系统。 一种方法包括:对所选择的一组存储器单元执行擦除操作,所选择的组包括多个参考单元和多个数据单元; 对作为擦除操作的一部分的参考单元的数量进行编程监视操作; 以及至少部分地基于对参考单元的数量执行的编程监视操作来确定与操作所述数据单元的数量相关联的特定操作参数的数量。

    NON-VOLATILE MEMORY CELL HEALING
    9.
    发明申请
    NON-VOLATILE MEMORY CELL HEALING 有权
    非易失性记忆细胞治疗

    公开(公告)号:US20100165747A1

    公开(公告)日:2010-07-01

    申请号:US12721165

    申请日:2010-03-10

    IPC分类号: G11C16/04

    CPC分类号: G11C16/3404 G11C16/0483

    摘要: Embodiments of the present disclosure provide methods, devices, modules, and systems for healing non-volatile memory cells. One method includes biasing a first select gate transistor coupled to a string of memory cells at a first voltage, biasing a second select gate transistor coupled to the string at a second voltage, applying a first healing voltage to a first edge word line in order to extract charge accumulated between the first select gate transistor and a first edge memory cell stack of the string, and applying a second healing voltage to a second edge word line in order to extract charge accumulated between the second select gate transistor and a second edge memory cell stack of the string.

    摘要翻译: 本公开的实施例提供了用于治疗非易失性存储器单元的方法,装置,模块和系统。 一种方法包括以第一电压偏置耦合到一串存储器单元的第一选择栅极晶体管,以第二电压偏置耦合到串的第二选择栅极晶体管,将第一愈合电压施加到第一边缘字线,以便 提取在第一选择栅极晶体管和串的第一边缘存储单元堆之间累积的电荷,以及向第二边缘字线施加第二愈合电压,以便提取在第二选择栅极晶体管和第二边缘存储单元之间累积的电荷 堆栈的字符串。

    Method for programming and erasing an NROM cell
    10.
    发明授权
    Method for programming and erasing an NROM cell 有权
    编程和擦除NROM单元的方法

    公开(公告)号:US07639530B2

    公开(公告)日:2009-12-29

    申请号:US11599701

    申请日:2006-11-15

    申请人: Andrei Mihnea

    发明人: Andrei Mihnea

    IPC分类号: G11C11/34

    摘要: A nitride read only memory (NROM) cell can be programmed by applying a ramp voltage to the gate input, a constant voltage to one of the two source/drain regions, and a ground potential to the remaining source/drain region. In order to erase the NROM cell, a constant voltage is coupled to the gate input. A constant positive current is input to one of the source/drain regions. The remaining source/drain region is either allowed to float, is coupled to a ground potential, or is coupled to the first source/drain region.

    摘要翻译: 氮化物只读存储器(NROM)单元可以通过向栅极输入施加斜坡电压,对两个源极/漏极区中的一个施加恒定电压,并将剩余的源极/漏极区的接地电位编程。 为了擦除NROM单元,将恒定电压耦合到栅极输入端。 恒定的正电流被输入到源/漏区之一。 剩余的源极/漏极区域被允许浮动,耦合到接地电位,或耦合到第一源极/漏极区域。