Lane line recognition apparatus
    3.
    发明授权

    公开(公告)号:US11749002B2

    公开(公告)日:2023-09-05

    申请号:US17493385

    申请日:2021-10-04

    发明人: Kensaku Natsume

    IPC分类号: G06V20/56 G06V10/88 G06V10/60

    摘要: A lane line recognition apparatus includes an imaging device, a lane-line-search-region setting section, a light-streak-search-region setting section, a light-streak determination section, a light-streak-reaching determination section, and a mask processing section. The imaging device is to be mounted on a vehicle and captures an image of a traveling environment in front of the vehicle. The lane-line-search-region setting section sets a lane-line search region on the image. The light-streak-search-region setting section sets a light-streak search region adjacently to the lane-line search region. The light-streak determination section determines whether a light streak that crosses, in a vertical direction of the image, the light-streak search region is found. The light-streak-reaching determination section determines, if the light streak is found, whether the light streak reaches the lane-line search region. The mask processing section performs, if the light streak reaches the lane-line search region, a mask process on the light streak.

    Mask structure optimization device, mask structure optimization method, and program

    公开(公告)号:US11668696B2

    公开(公告)日:2023-06-06

    申请号:US17706962

    申请日:2022-03-29

    申请人: RIKEN ThinkCyte, Inc.

    摘要: A mask structure optimization device includes a classification target image size acquisition unit that is configured to acquire a size of a classification target image which is an image including a classification target, a mask size setting unit that is configured to set a size of a mask applied to the classification target image, a brightness detection unit that is configured to detect a brightness of each pixel within the classification target image at a position on an opposite side of the mask from the classification target image, a sum total brightness calculation unit that is configured to calculate the sum total brightness of the each pixel within the classification target image detected by the brightness detection unit, an initial value setting unit that is configured to set an initial value for a mask pattern of the mask, and a movement unit that is configured to relatively move the mask with respect to the classification target image. The sum total brightness calculation unit is configured to calculate the sum total brightness of the each pixel within the classification target image every time the movement unit relatively moves the mask by a predetermined movement amount. The mask structure optimization device further includes a mask pattern optimization unit that is configured to optimize the mask pattern of the mask on the basis of the sum total brightness.

    INSPECTION DEVICE
    6.
    发明公开
    INSPECTION DEVICE 审中-公开

    公开(公告)号:US20240346818A1

    公开(公告)日:2024-10-17

    申请号:US18292978

    申请日:2022-09-21

    申请人: HITACHI, LTD.

    摘要: The purpose of the present invention is to provide an inspection device that can determine the reliability of an image feature value in a target region of an observation image of a sample. This inspection device extracts a first feature value from a target region including an inspection target in an observation image of a sample, extracts a second feature value from a reference region other than the target region in the observation image, and compares the first feature value and the second feature value, thereby calculating the reliability of the first feature value (see FIG. 1).