Abstract:
PROBLEM TO BE SOLVED: To provide a wiring board having high reliability.SOLUTION: The wiring board comprises: an interlayer insulating layer 26a; a conductor layer 31a formed on the interlayer insulating layer 26a; an interlayer insulating layer 33a provided on the interlayer insulating layer 26a and the conductor layer 31a; a wiring structure 10 which is disposed on the interlayer insulating layer 26a and has an insulating layer 110 and a conductor layer 111 formed on an insulating layer 120; a conductor layer 37c formed on the interlayer insulating layer 33a; and a via conductor 38c which is formed inside the interlayer insulating layer 33a and connects the conductor layer 31a and the conductor layer 37c. The conductor layer 31a includes conductor wiring 31 as a positioning pattern for positioning the wiring structure 10 at a predetermined position on the interlayer insulating layer 26a.
Abstract:
PROBLEM TO BE SOLVED: To provide an electronic component in which a crack is hard to generate in a conductor pattern between semiconductor elements, and provide a manufacturing method of the electronic component.SOLUTION: A pitch P1 between second bumps 77 arranged in a second area ED 2 which is positioned between semiconductor elements and is not strengthened by a semiconductor element is narrower than a pitch P2 between the second bumps 77 arranged in a first area ED 1 which is located immediately beneath a semiconductor element and is strengthened by a first semiconductor element 90A or a second semiconductor element 90B.
Abstract:
PROBLEM TO BE SOLVED: To provide: an electronic component capable of suppressing a crack of wiring in the vicinity of a semiconductor element; and a method of manufacturing the same.SOLUTION: An electronic component includes: a wiring board 30 in which resin insulating layers 50 and 150 and conductor patterns 58 and 158 are alternately laminated and a bump 76 is formed on the conductor pattern of the outermost layer; a semiconductor element 90 mounted on the wiring board with the bump interposed therebetween; and a sealing resin 94 for sealing the semiconductor element. A resin insulating layer 250 of the outermost layer constituting the wiring board has a recess 252 at least at a part located outside a region for forming the bump, and the sealing resin 94 is loaded into the recess.
Abstract:
PROBLEM TO BE SOLVED: To provide a wiring board having high reliability and a method for manufacturing the same.SOLUTION: The wiring board includes: an interlayer insulating layer 26a; a conductor layer 31a formed on the interlayer insulating layer 26a; an interlayer insulating layer 33a provided on the interlayer insulating layer 26a and the conductor layer 31a; a sub wiring board 10 which is arranged on the interlayer insulating layer 26a and has an insulating layer 110 and a conductor layer 111 on an insulating layer 120; a conductor layer 36a formed on the interlayer insulating layer 33a; and a via conductor 35a which is formed inside the interlayer insulating layer 33a and connects the conductor layer 31a and the conductor layer 36a.
Abstract:
PROBLEM TO BE SOLVED: To provide a manufacturing method of an electronic component which enables a test of a first chip to be conducted after mounting the first chip and before mounting a second chip.SOLUTION: After a logic chip 90A is mounted on a first mounting pad 158A to conduct a function test of the logic chip 90A through a test pad 158T (Fig. 4(A)), a memory chip 90B is mounted on a second mounting pad 158B (Fig. 4(B)). The manufacturing method allows the test of the logic chip to be easily conducted before the memory chip is attached. Thus, when the logic chip does not function, the attachment of the memory chip may be cancelled and the wasteful use of the memory chip is avoided.
Abstract:
PROBLEM TO BE SOLVED: To provide an electronic component which can inhibit disconnection of a conductor pattern adjacent to a semiconductor element; and provide a manufacturing method of the electronic component.SOLUTION: An electronic component 10 includes a conductor part 158S formed directly below a circumference of a semiconductor element 90. The conductor part 158S is provided between an interlayer resin insulation layer 150 in the outermost layer and an underfill material 94 in a thickness direction of the electronic component 10.