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公开(公告)号:US20200043854A1
公开(公告)日:2020-02-06
申请号:US16424000
申请日:2019-05-28
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: JUHYEON OH , SUNCHUL KIM , HYUNKI KIM
IPC: H01L23/538 , H01L23/00 , H01L23/16 , H01L23/31
Abstract: A semiconductor package includes a first substrate, a second substrate provided on the first substrate, a semiconductor chip provided between the first substrate and the second substrate, solder structures extending between the first substrate and the second substrate and spaced apart from the semiconductor chip, and bumps provided between the semiconductor chip and the second substrate. The solder structures electrically connect the first substrate and the second substrate.
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公开(公告)号:US20190067258A1
公开(公告)日:2019-02-28
申请号:US15960698
申请日:2018-04-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yun-Young KIM , PYOUNGWAN KIM , HYUNKI KIM , Junwoo PARK , Sangsoo KIM , Seung Hwan KIM , Sung-Kyu PARK , Insup SHIN
CPC classification number: H01L25/117 , H01L21/561 , H01L25/105 , H01L25/50 , H01L2224/16227 , H01L2224/97 , H01L2225/1023 , H01L2225/1035 , H01L2225/1041 , H01L2225/1058 , H01L2225/1076 , H01L2225/1082 , H01L2225/1094 , H01L2924/15311 , H01L2924/15331 , H01L2924/1815 , H01L2924/18161 , H01L2224/81
Abstract: Disclosed are a semiconductor package and a method of fabricating the same. The semiconductor package comprises a lower semiconductor chip on a lower substrate, a lower molding layer covering the lower semiconductor chip on the lower substrate and including a molding cavity that extends toward the lower semiconductor chip from a top surface of the lower molding layer, an interposer substrate on the top surface of the lower molding layer and including a substrate opening that penetrates the interposer substrate and overlaps the molding cavity, and an upper package on the interposer substrate. The molding cavity has a floor surface spaced apart from the upper package across a substantially hollow space.
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公开(公告)号:US20230187285A1
公开(公告)日:2023-06-15
申请号:US17883250
申请日:2022-08-08
Applicant: Samsung Electronics Co., Ltd.
Inventor: SANG-WON LEE , HYUNKI KIM , YOUNG-JA KIM , HYUNGGIL BAEK
CPC classification number: H01L22/12 , H01L24/75 , H01L24/81 , H01L2224/75621 , H01L2224/75001 , H01L2224/81194 , H01L2224/8118
Abstract: A method of manufacturing a semiconductor package includes estimating an error in a solder ball attaching process, determining a specification of a ball tool and a method of the solder ball attaching process, based on the estimated error, manufacturing the ball tool according to the determined specification thereof, and performing the solder ball attaching process based on the method of the solder ball attaching process. The determining of the specification of the ball tool and the method of the solder ball attaching process includes determining a number of a plurality of holders in the ball tool and a position and a width of each of the plurality of holders, determining a number of a plurality of working regions of a substrate and a position and a width of each of the plurality of working regions, and dividing a substrate into the plurality of working regions.
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公开(公告)号:US20200098734A1
公开(公告)日:2020-03-26
申请号:US16698749
申请日:2019-11-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: CHANHEE JEONG , HYUNKI KIM , JUNWOO PARK , BYOUNG WOOK JANG , SUNCHUL KIM , SU-MIN PARK , PYOUNGWAN KIM , INKU KANG , HEEYEOL KIM
Abstract: A semiconductor package includes a semiconductor chip disposed on a first substrate, a mold layer covering a sidewall of the semiconductor chip and including a through-hole, a second substrate disposed on the semiconductor chip, a connection terminal disposed between the first substrate and the second substrate and provided in the through-hole, and an underfill resin layer extending from between the semiconductor chip and the second substrate into the through-hole.
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公开(公告)号:US20180145061A1
公开(公告)日:2018-05-24
申请号:US15818346
申请日:2017-11-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: CHANHEE JEONG , HYUNKI KIM , JUNWOO PARK , BYOUNG WOOK JANG , SUNCHUL KIM , SU-MIN PARK , PYOUNGWAN KIM , INKU KANG , HEEYEOL KIM
CPC classification number: H01L25/105 , H01L21/4853 , H01L21/4857 , H01L21/565 , H01L23/3121 , H01L23/3128 , H01L23/3135 , H01L23/49811 , H01L23/49816 , H01L23/5383 , H01L23/5385 , H01L23/5386 , H01L23/5389 , H01L24/13 , H01L24/19 , H01L24/20 , H01L24/32 , H01L24/48 , H01L24/97 , H01L25/50 , H01L2224/04042 , H01L2224/13101 , H01L2224/16225 , H01L2224/214 , H01L2224/32145 , H01L2224/32225 , H01L2224/48091 , H01L2224/48227 , H01L2224/73265 , H01L2224/97 , H01L2225/0651 , H01L2225/06568 , H01L2225/1023 , H01L2225/1035 , H01L2225/1041 , H01L2225/1058 , H01L2924/00014 , H01L2924/15151 , H01L2924/15311 , H01L2224/45099 , H01L2924/014 , H01L2924/00012 , H01L2224/81 , H01L2924/00
Abstract: A semiconductor package includes a semiconductor chip disposed on a first substrate, a mold layer covering a sidewall of the semiconductor chip and including a through-hole, a second substrate disposed on the semiconductor chip, a connection terminal disposed between the first substrate and the second substrate and provided in the through-hole, and an underfill resin layer extending from between the semiconductor chip and the second substrate into the through-hole.
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