Abstract:
An operation method of a nonvolatile memory device which includes a memory block having wordlines includes performing an erase on the memory block, performing a block verification on the memory block by using a 0-th erase verification voltage, performing a delta verification on the memory block by using a first erase verification voltage different from the 0-th erase verification voltage when a result of the block verification indicates a pass, and outputting information about an erase result of the memory block based on the result of the block verification or a result of the delta verification. The delta verification includes generating delta counting values respectively corresponding to wordline groups by using the first erase verification voltage, generating a delta value based on the delta counting values, and comparing the delta value and a first reference value.
Abstract:
An electronic device includes a memory controller; a first memory device coupled to the memory controller; a second memory device coupled to the memory controller, the second memory device being a different type of memory from the first memory device; and a conversion circuit between the memory controller and the second memory device. The memory controller is configured to send a first command and first data to the first memory device according to a first timing scheme to access the first memory device, and send a second command and a packet to the conversion circuit according to the first timing scheme to access the second memory device. The conversion circuit is configured to receive the second command and the packet, and access the second memory device based on the second command and the packet.
Abstract:
A semiconductor device includes a semiconductor chip which includes a first circuit and a second circuit that are spaced apart from each other, without internal wirings electrically connecting the first circuit and the second circuit to each other, a substrate on which the semiconductor chip is disposed, and substrate wirings that are arranged on the substrate and electrically connect the first circuit and the second circuit to each other.
Abstract:
An operating method of an ECC decoder includes receiving first chunk data and second chunk data from a nonvolatile memory device, the second chunk data subsequent to the first chunk data, performing error correction on the first chunk data, determining if the first chunk data includes an uncorrectable error bit and determining not to perform error correction on the second chunk data in response to the first chunk data including the uncorrectable error bit.
Abstract:
An operation method of a nonvolatile memory device which includes a memory block having wordlines includes performing an erase on the memory block, performing a block verification on the memory block by using a 0-th erase verification voltage, performing a delta verification on the memory block by using a first erase verification voltage different from the 0-th erase verification voltage when a result of the block verification indicates a pass, and outputting information about an erase result of the memory block based on the result of the block verification or a result of the delta verification. The delta verification includes generating delta counting values respectively corresponding to wordline groups by using the first erase verification voltage, generating a delta value based on the delta counting values, and comparing the delta value and a first reference value.
Abstract:
An electronic device includes a memory controller; a first memory device coupled to the memory controller; a second memory device coupled to the memory controller, the second memory device being a different type of memory from the first memory device; and a conversion circuit between the memory controller and the second memory device. The memory controller is configured to send a first command and first data to the first memory device according to a first timing scheme to access the first memory device, and send a second command and a packet to the conversion circuit according to the first timing scheme to access the second memory device. The conversion circuit is configured to receive the second command and the packet, and access the second memory device based on the second command and the packet.
Abstract:
A source driving integrated circuit is provided. The source driving integrated circuit includes a source driver area, an electrostatic discharge (ESD) circuit area and a fan-out area. The source driver area includes a plurality of source driver units. The ESD circuit area includes a plurality of ESD units. The fan-out area includes conduction lines for electrically connecting respective ones of the source driver units of the source driver area to ones of the plurality of the ESD units of the ESD circuit area. In a horizontal structure of a semiconductor integrated circuit, the fan-out area at least partially overlaps the ESD circuit area.
Abstract:
A method of interfacing a memory controller and a memory device in a memory system includes transmitting a control signal between the memory controller and the memory device using a time division multiplexing (TDM) communication process, and transmitting data between the memory controller and the memory device using a serializer/deserializer (SERDES) communication process. Data communication in the memory system is performed via a physical channel and a plurality of virtual channels corresponding to the physical channel.
Abstract:
A memory swap operation comprises writing information about a process in which a page fault occurred, into a temporary memory using a processor of a host, copying a page in which the page fault occurred, from a memory device recognized as a swap memory into a main memory of the host, and after completing the copying of the page, resuming the process in which the page fault occurred, using the information about the process, written in the temporary memory.
Abstract:
A source driving integrated circuit is provided. The source driving integrated circuit includes a source driver area, an electrostatic discharge (ESD) circuit area and a fan-out area. The source driver area includes a plurality of source driver units. The ESD circuit area includes a plurality of ESD units. The fan-out area includes conduction lines for electrically connecting respective ones of the source driver units of the source driver area to ones of the plurality of the ESD units of the ESD circuit area. In a horizontal structure of a semiconductor integrated circuit, the fan-out area at least partially overlaps the ESD circuit area.