摘要:
A flash memory device is provided with a two stage sense amplifier. The two stage sense amplifier includes a sense pre-amplifier coupled to a sense output amplifier. The sense pre-amplifier amplifies a data signal from a memory bank. The sense output amplifier then differentially compares the output of the sense pre-amplifier with a reference signal. An embodiment with first and second memory banks is also provided that is capable of simultaneous operation.
摘要:
A high speed address sequencer allows for a generation of address signals using a clock with higher frequency. The high speed address sequencer can be used in many semiconductor devices, especially in flash memory devices. By reducing a number of gate delays, the high speed address sequencer can generate all address signals in a reduced time period. By using an address signal as a clock for generation of some of the other address signals, the high speed address sequencer is allowed more time to generate all address signals with a given clock frequency. The reduction in the number of gate delays can be combined with the use of the address signal as a clock.
摘要:
A memory device (100) includes a core cell array (102), a sense amplifier circuit (110), data lines (120), each having a length. The memory device further includes bit lines (118) extending from the core cell array and a selection circuit (106) configured to selectively couple a bit line to a data line in response to an input address. Bias circuits (130) are distributed along the length of the data lines and are configured to apply an initial voltage to the data line, reducing the read access time of the memory device. The bias circuits 130 may be positioned to accommodate varying lengths of the data lines and varying capacitance of the data lines.
摘要:
A content addressable memory (CAM) circuit (200) is used as a data storage circuit to store information about operational mode and timing in a flash memory chip (100). To minimize current drain in a standby mode, the CAM circuit is placed in a low power state. To prevent unwanted switching of the output node (240) and eliminate excess current drain and mode switching of other circuits in the flash memory chip, the output of the CAM circuit is latched.
摘要:
A flash Electrically-Erasable Programmable Read-Only Memory (EEPROM) includes a plurality of floating gate transistor memory cells, a plurality of wordlines connected to the cells and a power source for generating a low power supply voltage on the order of 3 V or less. A wordline driver includes a booster for boosting the supply voltage to produce a wordline read voltage which is higher than the supply voltage, and applying the wordline voltage to a wordline. An upper clamp limits a maximum value of the wordline voltage to prevent read disturb. The upper clamp can be configured to reduce an amount by which the maximum value varies with the supply voltage, or to limit the maximum value to substantially a predetermined value. A lower clamp limits the wordline voltage to a minimum value which is higher than the supply voltage and lower than the maximum value for a predetermined length of time at the beginning of the read operation to ensure that the cells have sufficient read current and to reduce the amount by which the minimum value varies with the supply voltage.
摘要:
A system for optimizing the equalization pulse of a read sense amplifier is disclosed. A number of capacitor circuits are provided that can be coupled to a timing circuit in a variety of combinations. The different combinations of coupled and decoupled capacitor circuits result in different durational lengths of the equalization pulse. A testing sequence determines the optimal durational length of the equalization pulse by testing the different combinations of coupled capacitors. The optimal combination is then permanently stored in attribute cells for optimizing the equalization pulse in normal operation.
摘要:
A clock control circuit receives an external clock signal and generates an internal clock signal. Through use of internal programming and an external trigger signal, the clock control circuit blocks out one or more of the clock cycles of the external clock signal to generate the internal clock signal. The clock control circuit can be used in any semiconductor device, and especially in synchronous flash memory devices with a burst operation. In the synchronous flash memory devices, one or more of the internal clock cycles are blocked out to account for increased delays during certain data sensing operations such as word line switching during data reading. In the synchronous flash memory devices, the sensed data is stored in input/output buffers and transferred out synchronously to the external clock signal.
摘要:
A semiconductor device has a function of reading device information specific to the device as and when required. The semiconductor device has storage units for storing plural pieces of device information and a selector for selecting a predetermined one of the information pieces stored in the storage units when a device information read mode is set, so that the read information may match device data such as a manufacturer name and part name printed on the semiconductor device.
摘要:
An electrically erasable non-volatile semiconductor memory device has a memory cell array, a first erase unit, a second erase unit, and an operation mode establish unit. The erasing operation of the second erase unit is independently carried out of the erasing operation of the first erase unit. When a first operation mode is established by the operation mode establish unit, the second erase unit is inactivated, and the erasing operation of the memory cell array is only carried out by the first erase unit. On the other hand, when a second operation mode is established by the operation mode establish unit, the erasing operation of the first erase unit for a part of the memory cell array is disable, and the second erase unit is activated and the erasing operation for the part of the memory cell array is carried out by the second erase unit. Therefore, the change between a boot block type flash memory and normal type flash memory can be realized only by changing an establish value of the operation mode establish unit. Consequently, when developing both boot block type flash memory and normal type flash memory, these two types of flash memories can be obtained by using the same chip or by carrying out only minimum changes, so that the developing processes can be greatly decreased.
摘要:
A signature circuit stores signature information indicative of one of a plurality of device functions of a non-volatile memory device which includes first memory cells which are respectively coupled to one of a plurality of word lines and to one of a plurality of bit lines. The signature circuit includes second memory cells which are respectively connected to the bit lines which are grouped into a plurality of blocks, at least one predetermined word line which is provided exclusively for the second memory cells and is connected to each of the memory cells, and a selecting circuit coupled to the bit lines for selecting one of the blocks. The second memory cells in each of the blocks store one kind of signature information, so that a number of blocks is equal to a number of kinds of signature information that can be stored in the signature circuit.