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公开(公告)号:US11942183B2
公开(公告)日:2024-03-26
申请号:US17502481
申请日:2021-10-15
Applicant: Micron Technology, Inc.
Inventor: Mattia Boniardi , Richard K. Dodge , Innocenzo Tortorelli , Mattia Robustelli , Mario Allegra
CPC classification number: G11C7/1096 , G11C7/1051
Abstract: Methods, systems, and devices for adaptive write operations for a memory device are described. In an example, the described techniques may include identifying a quantity of access operations performed on a memory array, modifying one or more parameters for a write operation based on the identified quantity of access operations, and writing logic states to the memory array by performing the write operation according to the one or more modified parameters. In some examples, the memory array may include memory cells associated with a configurable material element, such as a chalcogenide material, that stores a logic state based on a material property of the material element. In some examples, the described techniques may at least partially compensate for a change in memory material properties due to aging or other degradation or changes over time (e.g., due to accumulated access operations).
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公开(公告)号:US11923002B2
公开(公告)日:2024-03-05
申请号:US17869649
申请日:2022-07-20
Applicant: Micron Technology, Inc.
Inventor: Innocenzo Tortorelli , Hari Giduturi , Fabio Pellizzer
IPC: G11C7/00 , G11C11/4074 , G11C11/409 , G11C11/56 , G11C29/50
CPC classification number: G11C11/5642 , G11C11/4074 , G11C11/409 , G11C11/5628 , G11C29/50004
Abstract: Methods, systems, and devices for varying-polarity read operations for polarity-written memory cells are described. Memory cells may be programmed to store different logic values based on applying write voltages of different polarities to the memory cells. A memory device may read the logic values based on applying read voltages to the memory cells, and the polarity of the read voltages may vary such that at least some read voltages have one polarity and at least some read voltages have another polarity. The read voltage polarity may vary randomly or according to a pattern and may be controlled by the memory device or by a host device for the memory device.
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公开(公告)号:US20240049610A1
公开(公告)日:2024-02-08
申请号:US18374925
申请日:2023-09-29
Applicant: Micron Technology, Inc.
Inventor: Innocenzo Tortorelli , Mattia Robustelli
CPC classification number: H10N70/063 , H10B63/84 , H10N70/043 , H10N70/245 , H10N70/826 , H10B63/20 , H10N70/882
Abstract: Methods and devices based on the use of dopant-modulated etching are described. During fabrication, a memory storage element of a memory cell may be non-uniformly doped with a dopant that affects a subsequent etching rate of the memory storage element. After etching, the memory storage element may have an asymmetric geometry or taper profile corresponding to the non-uniform doping concentration. A multi-deck memory device may also be formed using dopant-modulated etching. Memory storage elements on different memory decks may have different taper profiles and different doping gradients.
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公开(公告)号:US11817148B2
公开(公告)日:2023-11-14
申请号:US17685219
申请日:2022-03-02
Applicant: Micron Technology, Inc.
Inventor: Hernan A. Castro , Innocenzo Tortorelli , Agostino Pirovano , Fabio Pellizzer
CPC classification number: G11C13/0069 , G11C5/063 , G11C13/004 , G11C13/0007 , G11C13/0064 , G11C2013/009 , G11C2013/0073
Abstract: Techniques are provided for programming a self-selecting memory cell that stores a first logic state. To program the memory cell, a pulse having a first polarity may be applied to the cell, which may result in the memory cell having a reduced threshold voltage. During a duration in which the threshold voltage of the memory cell may be reduced (e.g., during a selection time), a second pulse having a second polarity (e.g., a different polarity) may be applied to the memory cell. Applying the second pulse to the memory cell may result in the memory cell storing a second logic state different than the first logic state.
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公开(公告)号:US20230352095A1
公开(公告)日:2023-11-02
申请号:US17733474
申请日:2022-04-29
Applicant: Micron Technology, Inc.
Inventor: Mattia Robustelli , Innocenzo Tortorelli
CPC classification number: G11C16/102 , G11C16/26 , G11C16/32 , G11C16/22 , G11C16/30 , G11C16/3404
Abstract: Methods, systems, and devices for improving write latency and energy using asymmetric cell design are described. A memory device may implement a programming scheme that uses low programming pulses based on an asymmetric memory cell design. For example, the asymmetric memory cells may have electrodes with different contact areas (e.g., widths) and may accordingly be biased to a desired polarity (e.g., negative biased or positive biased) for programming operations. That is, the asymmetric memory cell design may enable an asymmetric read window budget. For example, an asymmetric memory cell may be polarity biased, supporting programming operations for logic states based on the polarity bias.
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公开(公告)号:US11800816B2
公开(公告)日:2023-10-24
申请号:US17069380
申请日:2020-10-13
Applicant: Micron Technology, Inc.
Inventor: Innocenzo Tortorelli , Mattia Robustelli
CPC classification number: H10N70/063 , H10B63/84 , H10N70/043 , H10N70/245 , H10N70/826 , H10B63/20 , H10N70/882
Abstract: Methods and devices based on the use of dopant-modulated etching are described. During fabrication, a memory storage element of a memory cell may be non-uniformly doped with a dopant that affects a subsequent etching rate of the memory storage element. After etching, the memory storage element may have an asymmetric geometry or taper profile corresponding to the non-uniform doping concentration. A multi-deck memory device may also be formed using dopant-modulated etching. Memory storage elements on different memory decks may have different taper profiles and different doping gradients.
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公开(公告)号:US11783897B2
公开(公告)日:2023-10-10
申请号:US17875001
申请日:2022-07-27
Applicant: Micron Technology, Inc.
Inventor: Mattia Boniardi , Anna Maria Conti , Innocenzo Tortorelli
CPC classification number: G11C16/10 , G11C16/26 , G11C16/30 , G11C16/3404
Abstract: Methods, systems, and devices for memory cells for storing operational data are described. A memory device may include an array of memory cells with different sets of cells for storing data. A first set of memory cells may store data for operating the memory device, and the associated memory cells may each contain a chalcogenide storage element. A second set of memory cells may store host data. Some memory cells included in the first set may be programmed to store a first logic state and other memory cells in the first set may be left unprogrammed (and may represent a second logic state). Sense circuitry may be coupled with the array and may determine a value of data stored by the first set of memory cells.
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公开(公告)号:US11765912B2
公开(公告)日:2023-09-19
申请号:US17187213
申请日:2021-02-26
Applicant: Micron Technology, Inc.
Inventor: Agostino Pirovano , Andrea Redaelli , Fabio Pellizzer , Innocenzo Tortorelli
CPC classification number: H10B63/20 , H10B63/30 , H10B63/845 , H10B69/00 , H10N70/20 , H10N70/231 , H10N70/8828 , H10N70/8836
Abstract: In an example, a memory array may include a plurality of first dielectric materials and a plurality of stacks, where each respective first dielectric material and each respective stack alternate, and where each respective stack comprises a first conductive material and a storage material. A second conductive material may pass through the plurality of first dielectric materials and the plurality of stacks. Each respective stack may further include a second dielectric material between the first conductive material and the second conductive material.
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公开(公告)号:US20230260581A1
公开(公告)日:2023-08-17
申请号:US17651218
申请日:2022-02-15
Applicant: Micron Technology, Inc.
Inventor: Agostino Pirovano , Fabio Pellizzer , Innocenzo Tortorelli
CPC classification number: G11C16/34 , G11C16/102 , G11C16/26 , G11C16/0433 , G11C16/08 , G11C16/24
Abstract: Methods, systems, and devices for techniques for operating a vertical memory architecture are described. A memory device may include memory cells arranged in a three-dimensional vertical memory architecture. Each memory cell may include a storage element (e.g., a chalcogenide material), where a logic state may be programmed at the storage element based on a polarity of an applied voltage that exceeds a threshold voltage. The storage element may be coupled with a selection element and a conductive line. The selection element may be coupled with a bit line decoder and a word line decoder via vertical pillars. The selection element may selectively couple the storage element with the bit line decoder. In some examples, an activation voltage for the selection element may be less than a threshold voltage of the storage element.
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公开(公告)号:US11637145B2
公开(公告)日:2023-04-25
申请号:US17210571
申请日:2021-03-24
Applicant: Micron Technology, Inc.
Inventor: Innocenzo Tortorelli
Abstract: Methods, systems, and devices for multi-component cell architectures for a memory device are described. A memory device may include self-selecting memory cells that include multiple self-selecting memory components (e.g., multiple layers or other segments of a self-selecting memory material, separated by electrodes). The multiple self-selecting memory components may be configured to collectively store one logic state based on the polarity of a programming pulse applied to the memory cell. The multiple memory component layers may be collectively (concurrently) programmed and read. The multiple self-selecting memory components may increase the size of a read window of the memory cell when compared to a memory cell with a single self-selecting memory component. The read window for the memory cell may correspond to the sum of the read windows of each self-selecting memory component.
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