System and method for deforming, imaging and analyzing particles
    106.
    发明授权
    System and method for deforming, imaging and analyzing particles 有权
    颗粒变形,成像和分析的系统和方法

    公开(公告)号:US09464977B2

    公开(公告)日:2016-10-11

    申请号:US14057942

    申请日:2013-10-18

    Abstract: A system for deforming and analyzing particles includes a substrate defining an inlet, and an outlet; a fluidic pathway fluidly coupled to the inlet and the outlet and defining a delivery region upstream of a deformation region configured to deform particles, wherein the fluidic pathway comprises a first branch configured to generate a first flow, and a second branch configured to generate a second flow that opposes the first flow, wherein an intersection of the first flow and the second flow defines the deformation region; a detection module including a sensor configured to generate a morphology dataset characterizing deformation of the particles, and a photodetector configured to generate a fluorescence dataset characterizing fluorescence of the particles; and a processor configured to output an analysis of the plurality of particles based at least in part on the deformation dataset and the fluorescent dataset for the plurality of particles.

    Abstract translation: 用于变形和分析颗粒的系统包括限定入口的基板和出口; 流体路径,流体地联接到入口和出口,并且限定被配置为变形颗粒的变形区域上游的输送区域,其中流体路径包括被配置为产生第一流量的第一分支和被配置为产生第二流量的第二分支 所述第一流与所述第一流相对,其中所述第一流和所述第二流的交点限定所述变形区; 检测模块,其包括被配置为生成表征所述粒子的变形的形态学数据集的传感器,以及被配置为产生表征所述粒子的荧光的荧光数据集的光电检测器; 以及处理器,被配置为至少部分地基于所述多个粒子的所述变形数据集和所述荧光数据集来输出所述多个粒子的分析。

    SYSTEM AND METHOD FOR DEFORMING AND ANALYZING PARTICLES
    107.
    发明申请
    SYSTEM AND METHOD FOR DEFORMING AND ANALYZING PARTICLES 审中-公开
    用于变形和分析颗粒的系统和方法

    公开(公告)号:US20150355073A1

    公开(公告)日:2015-12-10

    申请号:US14802293

    申请日:2015-07-17

    Abstract: A system for deforming and analyzing a plurality of particles carried in a sample volume includes a substrate defining an inlet, configured to receive the sample volume, and an outlet; and a fluidic pathway fluidly coupled to the inlet and the outlet. The fluidic pathway includes a delivery region configured to receive the plurality of particles from the inlet and focus the plurality of particles from a random distribution to a focused state, a deformation region defining an intersection located downstream of the delivery region and coupled to the outlet, and wherein the deformation region is configured to receive the plurality of particles from the delivery region and to transmit each particle in the plurality of particles into the intersection from a single direction, a first branch fluidly coupled to the deformation region and configured to transmit a first flow into the intersection, and a second branch fluidly coupled to the deformation region and configured to transmit a second flow, substantially opposing the first flow, into the intersection, wherein the first flow and the second flow are configured to induce extension of one or more particles in the plurality of particles.

    Abstract translation: 用于变形和分析载体在样品体积中的多个颗粒的系统包括限定入口的衬底,其构造成接收样品体积和出口; 以及流体连接到入口和出口的流体通路。 流体通道包括配置成从入口接收多个颗粒并将多个颗粒从随机分布聚焦到聚焦状态的输送区域,限定位于输送区域下游并且耦合到出口的交叉的变形区域, 并且其中所述变形区域被配置为从所述递送区域接收所述多个颗粒并且将多个颗粒中的每个颗粒从单个方向传播到所述交叉点,所述第一分支流体耦合到所述变形区域并且被配置为传输第一 流入所述十字路口的第二分支和流体耦合到所述变形区域并被配置为将基本上与所述第一流相对的第二流传送到所述交叉点的第二分支,其中所述第一流和所述第二流被配置为诱导一个或多个 多个颗粒中的颗粒。

    SYSTEMS AND METHODS FOR PARTICLE CLASSIFICATION AND SORTING
    108.
    发明申请
    SYSTEMS AND METHODS FOR PARTICLE CLASSIFICATION AND SORTING 审中-公开
    用于粒子分类和分类的系统和方法

    公开(公告)号:US20150308941A1

    公开(公告)日:2015-10-29

    申请号:US14709931

    申请日:2015-05-12

    Abstract: A particle analysis system includes an inlet; an inertial focusing microchannel disposed in a substrate and having a downstream expanding region at a distal end, where the inlet is connected to a proximal end of the microchannel; a plurality of outlets connected to the microchannel at the downstream expanding region; a plurality of fluidic resistors, where each fluidic resistor is connected to a respective outlet; and a particle analyzer configured to measure a size and a position of particles in the microchannel. A particle sorting system includes an inlet; an inertial focusing microchannel disposed in a substrate and having a downstream expanding region at a distal end, where the inlet is connected to a proximal end of the microchannel; a plurality of outlets connected to the microchannel at the downstream expanding region; and a plurality of fluidic resistors, where each fluidic resistor is connected to a respective outlet.

    Abstract translation: 粒子分析系统包括入口; 惯性聚焦微通道,其设置在基底中并且在远端具有下游扩张区域,其中所述入口连接到所述微通道的近端; 在下游扩展区域连接到微通道的多个出口; 多个流体电阻器,其中每个流体电阻器连接到相应的出口; 以及粒子分析器,被配置为测量微通道中颗粒的尺寸和位置。 颗粒分选系统包括入口; 惯性聚焦微通道,其设置在基底中并且在远端具有下游扩张区域,其中所述入口连接到所述微通道的近端; 在下游扩展区域连接到微通道的多个出口; 和多个流体电阻器,其中每个流体电阻器连接到相应的出口。

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