Abstract:
Apparatus and method for performing depth sectioned fluorescence imaging of a turbid sample including a fluorescent turbid medium, uses an apparatus for quantitative modulated fluorescence imaging, the apparatus including projection optics with a first optical axis, to expose the turbid sample to a periodic pattern of excitation radiation to provide depth-resolved discrimination of fluorescent structures within the turbid medium; an image capture module, including a second optical axis and a detection beam path, to receive a data image from the sample; and a signal processor to transform the data image from the sample, spatially filter the transformed data image from the sample, and reconstruct the filtered, transformed data image from the sample.
Abstract:
A gas detector (10) includes a cell internal space (130) into which a target gas is supplied, the target gas exhibiting an absorption peak in an absorption spectrum; a light source (410) configured to generate light having at least a wavelength belonging to the absorption peak; and a photodetector (420) configured to detect the light that has emitted from the light source (410) and has propagated through the cell internal space (130). The gas detector (10) further includes a conductive thin film (220) in which a plurality of optical apertures (222) are regularly arranged such that a transmission peak in a transmission spectrum is superimposed over the absorption peak in the absorption spectrum along a wavelength axis. The conductive thin film (220) is provided on an optical path extending from the light source (410) to the photodetector (420), and is provided so as to be contactable with the target gas within the cell internal space (130).
Abstract:
Acquiring a sharp final image by preventing, even when an intermediate image is formed at a position overlapping an optical element, a flaw or the like on the optical element from being superimposed on the intermediate image. An observation apparatus including: an image-forming optical system having image-forming lenses that form a final image and an intermediate image, a first phase modulator that applies a spatial disturbance to the wavefront of light, and a second phase modulator that cancels out the spatial disturbance; a light source; an XY-scanning part including a first and a second scanner; and a photodetector. The two phase modulators are disposed at positions optically conjugate with the first scanner and have one-dimensional phase-distribution characteristics changing in the scanning direction of the illumination light.
Abstract:
The disclosure relates to processing SPR signals, in particular signals obtained by illuminating a conductive surface with light at two wavelengths. Processing SPR signals can involve processing a first and second signal indicative of an intensity of light, received from a conductive layer at which SPR has occurred, as a function of angle of incidence, reflection or diffraction at the layer. The first and second signals each have two dips corresponding to a respective wavelength of the light at a respective angle at which surface plasmon resonance occurs for the respective wavelength and a peak between the two dips. The processing includes deriving a first and second value of a quantity indicative of signal magnitudes in the region of the peak. The first and second values can be compared to detect a change in refractive index at the layer after the first signal and before the second signal was captured.
Abstract:
A freshness estimation method includes obtaining an absorbance spectrum that is obtained by irradiating an eye of a fish with light having all or part of a wavelength band from 315 nm to 450 nm; and estimating freshness of the fish by using a shape of the obtained absorbance spectrum.
Abstract:
A system includes a non-uniform grating having a first region with a first refractive index and second regions with a second refractive index. A pattern of the second regions varies with an angular coordinate such that phase shifts of an incident beam created by the grating cause destructive interference that creates an intensity minimum within an output beam from the grating.
Abstract:
A device includes one or more reflector components. Each reflector component comprises layer pairs of epitaxially grown reflective layers and layers of a non-epitaxial material, such as air. Vias extend through at least some of the layers of the reflector components. The device may include a light emitting layer.
Abstract:
A device includes one or more reflector components. Each reflector component comprises layer pairs of epitaxially grown reflective layers and layers of a non-epitaxial material, such as air. Vias extend through at least some of the layers of the reflector components. The device may include a light emitting layer.
Abstract:
An installation of optical inspection of integrated circuits or the like includes a photographic system placed above a scene in a plane defined by a first and a second direction, the photographic system having several digital cameras each having an orthogonal array of pixels, all cameras having their respective optical axes inclined by a first angle with respect to a third direction perpendicular to the two others; and two projectors of determined patterns, these patterns being such that two straight lines projected by each of the projectors are aligned in the plane defined by the first two directions and are coplanar with a straight line interconnecting the optical centers of the two projectors.
Abstract:
The disclosure relates to processing SPR signals, in particular signals obtained by illuminating a conductive surface with light at two wavelengths. Processing SPR signals can involve processing a first and second signal indicative of an intensity of light, received from a conductive layer at which SPR has occurred, as a function of angle of incidence, reflection or diffraction at the layer. The first and second signals each have two dips corresponding to a respective wavelength of the light at a respective angle at which surface plasmon resonance occurs for the respective wavelength and a peak between the two dips. The processing includes deriving a first and second value of a quantity indicative of signal magnitudes in the region of the peak. The first and second values can be compared to detect a change in refractive index at the layer after the first signal and before the second signal was captured.