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    LIQUID HANDLING, IN PARTICULAR METERING
    2.
    发明申请
    LIQUID HANDLING, IN PARTICULAR METERING 审中-公开

    公开(公告)号：US20200171490A1

    公开(公告)日：2020-06-04

    申请号：US16617864

    申请日：2018-05-31

    Applicant: BIOSURFIT, S.A.

    Inventor： Fábio Miguel Rolo PEREIRA ,  Miguel João MARQUES BARREIROS ,  David Pena De Sousa SANTOS

    IPC: B01L3/00

    Abstract: A microfluidic liquid handling device is configured for rotation about an axis of rotation to drive liquid flow within the device. The device can include an upstream liquid handling structure, a metering structure and an overflow region. The metering structure is configured to receive liquid from the upstream liquid handling structure. The overflow region is separated from the metering structure by a wall. The wall has a first surface portion on the side of the overflow region which has an extent in a direction perpendicular to the direction of action of the centrifugal force, in a substantially tangential or circumferential direction, relative to the axis of rotation. The first surface portion faces radially outwards. Advantageously, the structure of the wall facilitates accurate metering.

    Enhanced surface plasmon resonance method
    4.
    发明授权
    Enhanced surface plasmon resonance method 有权

    公开(公告)号：US10228368B2

    公开(公告)日：2019-03-12

    申请号：US15486039

    申请日：2017-04-12

    Applicant: Biosurfit S.A.

    Inventor： João Manuel Oliveira Garcia Da Fonseca

    IPC: G01N33/543 ,  G01N21/41 ,  G01N21/552 ,  G01N33/553

    Abstract: The disclosure relates to processing SPR signals, in particular signals obtained by illuminating a conductive surface with light at two wavelengths. Embodiments—involve processing a first and second signal indicative of an intensity of light, received from a conductive layer at which SPR has occurred, as a function of angle of incidence, reflection or diffraction at the layer (depending on whether the incident light beam is received by a detector recording it in reflection or transmission from the conductive layer). The first and second signals each have two dips corresponding to a respective wavelength of the light at a respective angle at which surface plasmon resonance occurs for the respective wavelength and a peak between the two dips. The processing includes deriving a first and second value of a quantity indicative of signal magnitudes in the region of the peak. The method then provides for comparing the first and second values to detect a change in refractive index at the layer after the first signal and before the second signal was captured.

    Enhanced Surface Plasmon Resonance method
    6.
    发明授权
    Enhanced Surface Plasmon Resonance method 有权

    公开(公告)号：US09632022B2

    公开(公告)日：2017-04-25

    申请号：US14382334

    申请日：2013-03-05

    Applicant: BIOSURFIT S.A.

    Inventor： Joao Manuel De Oliveira Garcia Da Fonseca

    IPC: G01N21/41 ,  G01N21/552

    CPC classification number: G01N33/54373 ,  G01N21/41 ,  G01N21/553 ,  G01N33/54346 ,  G01N33/553 ,  G01N2201/0612 ,  G01N2201/06146 ,  G01N2201/0621 ,  G01N2201/0635 ,  G01N2201/12723

    Abstract: The disclosure relates to processing SPR signals, in particular signals obtained by illuminating a conductive surface with light at two wavelengths. Processing SPR signals can involve processing a first and second signal indicative of an intensity of light, received from a conductive layer at which SPR has occurred, as a function of angle of incidence, reflection or diffraction at the layer. The first and second signals each have two dips corresponding to a respective wavelength of the light at a respective angle at which surface plasmon resonance occurs for the respective wavelength and a peak between the two dips. The processing includes deriving a first and second value of a quantity indicative of signal magnitudes in the region of the peak. The first and second values can be compared to detect a change in refractive index at the layer after the first signal and before the second signal was captured.

    ENHANCED SURFACE PLASMON RESONANCE METHOD
    7.
    发明申请
    ENHANCED SURFACE PLASMON RESONANCE METHOD 有权
    增强表面等离子体共振方法

    公开(公告)号：US20150109614A1

    公开(公告)日：2015-04-23

    申请号：US14382334

    申请日：2013-03-05

    Applicant: BIOSURFIT S.A.

    Inventor： Joao Manuel De Oliveira Garcia Da Fonseca

    IPC: G01N21/41 ,  G01N21/552

    CPC classification number: G01N33/54373 ,  G01N21/41 ,  G01N21/553 ,  G01N33/54346 ,  G01N33/553 ,  G01N2201/0612 ,  G01N2201/06146 ,  G01N2201/0621 ,  G01N2201/0635 ,  G01N2201/12723

    Abstract: The disclosure relates to processing SPR signals, in particular signals obtained by illuminating a conductive surface with light at two wavelengths. Processing SPR signals can involve processing a first and second signal indicative of an intensity of light, received from a conductive layer at which SPR has occurred, as a function of angle of incidence, reflection or diffraction at the layer. The first and second signals each have two dips corresponding to a respective wavelength of the light at a respective angle at which surface plasmon resonance occurs for the respective wavelength and a peak between the two dips. The processing includes deriving a first and second value of a quantity indicative of signal magnitudes in the region of the peak. The first and second values can be compared to detect a change in refractive index at the layer after the first signal and before the second signal was captured.

    Abstract translation: 本公开涉及处理SPR信号，特别是通过用两个波长的光照射导电表面而获得的信号。 处理SPR信号可以涉及处理表示从已经发生SPR的导电层接收的光的强度的第一和第二信号作为该层处的入射角，反射或衍射的函数。 第一和第二信号各自具有对应于在相应波长的相应波长处的两个倾斜，在该角度处，针对相应波长发生表面等离子体共振并且在两个下降之间产生峰值。 该处理包括导出指示峰值区域中的信号幅度的量的第一值和第二值。 可以比较第一和第二值以检测第一信号之后的层和第二信号被捕获之前的折射率的变化。

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