Semiconductor package with a stiffening member supporting a thermal heat spreader
    11.
    发明授权
    Semiconductor package with a stiffening member supporting a thermal heat spreader 有权
    半导体封装,其具有支撑热散热器的加强构件

    公开(公告)号:US08013438B2

    公开(公告)日:2011-09-06

    申请号:US12507049

    申请日:2009-07-21

    IPC分类号: H01L23/34

    摘要: A semiconductor package includes a substrate board and a semiconductor die attached to a top surface of that substrate board. A heat spreader is provided over the semiconductor die. A stiffening ring is positioned surrounding the semiconductor die, the stiffening ring being attached to the top surface of the substrate board and attached to a bottom surface of the plate portion of the heat spreader. Space is left on the board outside of the stiffening ring to support the installation of passive components to the substrate board. An external ring may be included, with that external ring being interconnected to the stiffening ring by a set of tie bars. Alternatively, the heat spreader includes an integrally formed peripheral sidewall portion.

    摘要翻译: 半导体封装包括衬底板和附接到该衬底板的顶表面的半导体管芯。 散热器设置在半导体管芯上。 加强环定位在半导体模具周围,加强环附接到基板的顶表面并且附接到散热器的板部分的底表面。 空间留在加强环外部的板上,以支持将无源部件安装到基板上。 可以包括外部环,该外环通过一组连接杆与加强环相互连接。 或者,散热器包括整体形成的外围侧壁部分。

    FLIP-CHIP FAN-OUT WAFER LEVEL PACKAGE FOR PACKAGE-ON-PACKAGE APPLICATIONS, AND METHOD OF MANUFACTURE
    19.
    发明申请
    FLIP-CHIP FAN-OUT WAFER LEVEL PACKAGE FOR PACKAGE-ON-PACKAGE APPLICATIONS, AND METHOD OF MANUFACTURE 有权
    用于包装封装应用的FLIP-CHIP FAN-OUT WAFER LEVEL PACKAGE AND AND METHOD OF MANUFACTURE

    公开(公告)号:US20110156250A1

    公开(公告)日:2011-06-30

    申请号:US12651365

    申请日:2009-12-31

    IPC分类号: H01L23/498 H01L21/60

    摘要: A flip-chip fan-out wafer level package for package-on-package applications includes a semiconductor die with solder bumps on an upper surface in a flip chip configuration. The die is inverted, with an upper surface facing an upper side of a redistribution layer, with the solder bumps in electrical contact with respective chip contact pads of the redistribution layer. The redistribution layer includes conductive traces that place each of the solder bumps in electrical contact with one or both of one of a plurality of upper redistribution contact pads and one of a plurality of lower redistribution contact pads. Each of the plurality of upper redistribution contact pads has an upper solder ball in electrical contact therewith. The die and the upper solder balls are at least partially encapsulated in a layer of mold compound positioned on the upper surface of the redistribution layer, and whose lateral dimensions are defined by the lateral dimensions of the redistribution layer. The layer of mold compound has a back-ground surface at which a portion of each of the upper solder balls is exposed, for electrical contact with an upper package. Each of the lower redistribution contact pads has a lower solder ball a coupled thereto.

    摘要翻译: 用于封装封装应用的倒装芯片扇出晶片级封装包括在倒装芯片配置的上表面上具有焊料凸块的半导体管芯。 模具倒置,上表面面向再分布层的上侧,焊料凸块与再分布层的相应芯片接触焊盘电接触。 再分配层包括导电迹线,其将每个焊料凸点与多个上再分布接触焊盘和多个下再分布接触焊盘之一中的一个或两者电接触。 多个上再分配接触垫中的每一个具有与其接触的上焊球。 模具和上焊球至少部分地封装在位于再分配层的上表面上的模具化合物层中,并且其横向尺寸由再分布层的横向尺寸限定。 模具化合物层具有背面表面,每个上焊球的一部分暴露在其中,用于与上封装电接触。 每个下再分布接触垫具有与其耦合的较低焊球。