Implant-controlled-channel vertical JFET
    11.
    发明申请
    Implant-controlled-channel vertical JFET 有权
    植入物控制通道垂直JFET

    公开(公告)号:US20050006663A1

    公开(公告)日:2005-01-13

    申请号:US10614840

    申请日:2003-07-08

    摘要: We disclose the structure of an electronic device, the method of making the device and the operation of the device. The device is built near the top of a substrate. It has, near the top surface, a buried layer that is electrically communicable to a drain terminal. The device has a body region over the buried layer. A portion of the body region contacts a gate region connected to a gate terminal. The device has a channel region, of which the length spans the distance between the buried layer and a source region, which projects upward from the channel region and is connected to a source terminal. The device current flows in the channel substantially perpendicularly to the top surface of the substrate.

    摘要翻译: 我们公开了电子设备的结构,制造设备的方法和设备的操作。 该器件靠近基板顶部。 在顶表面附近具有可电连接到漏极端子的掩埋层。 该器件在掩埋层上方具有体区。 身体区域的一部分接触连接到栅极端子的栅极区域。 该器件具有沟道区,其长度跨越掩埋层与源极区之间的距离,该距离从沟道区向上突出并连接到源极。 器件电流在通道中基本上垂直于衬底的顶表面流动。

    Versatile System for Cross-Lateral Junction Field Effect Transistor
    12.
    发明申请
    Versatile System for Cross-Lateral Junction Field Effect Transistor 有权
    用于横向交错场效应晶体管的通用系统

    公开(公告)号:US20070281408A1

    公开(公告)日:2007-12-06

    申请号:US11839832

    申请日:2007-08-16

    IPC分类号: H01L21/337

    CPC分类号: H01L29/808 H01L29/0692

    摘要: The present invention provides a system for providing a cross-lateral junction field effect transistor (114) having desired high-performance desired voltage, frequency or current characteristics. The cross-lateral transistor is formed on a commercial semiconductor substrate (102). A channel structure (124) is formed along the substrate, having source (120) and drain (122) structures laterally formed on opposites sides thereof. A first gate structure (116) is formed along the substrate, laterally adjoining the channel structure orthogonal to the source and drain structures. A second gate structure (118) is formed along the substrate, laterally adjoining the channel structure, orthogonal to the source and drain structures and opposite the first gate stricture.

    摘要翻译: 本发明提供了一种用于提供具有期望的高性能期望电压,频率或电流特性的横向结型场效应晶体管(114)的系统。 横向晶体管形成在商用半导体衬底(102)上。 沿着衬底形成通道结构(124),其具有在其相对侧上横向形成的源极(120)和漏极(122)结构。 第一栅极结构(116)沿着衬底形成,横向邻接与源极和漏极结构正交的沟道结构。 沿着衬底形成第二栅极结构(118),其横向邻接沟道结构,垂直于源极和漏极结构并与第一栅极狭窄相对。

    Silicided amorphous polysilicon - metal capacitor
    14.
    发明申请
    Silicided amorphous polysilicon - metal capacitor 审中-公开
    硅化非晶多晶硅 - 金属电容器

    公开(公告)号:US20050170598A1

    公开(公告)日:2005-08-04

    申请号:US10767390

    申请日:2004-01-29

    CPC分类号: H01L28/75

    摘要: A silicided amorphous polysilicon-metal capacitor is formed using a standard process except that the exposed surface of the polycrystalline silicon is transformed into amorphous polysilicon before the silicidation of the polysilicon layer to form the bottom plate of the capacitive element. Transforming the polycrystalline silicon to amorphous polysilicon at the surface renders the top surface of the polysilicon substantially smooth compared to that of the polycrystalline silicon. This in turn renders the surface of the silicide layer, which forms the bottom plate of the capacitor and is formed by the silicidation of the polysilicon, to be substantially smooth as well. Thus, the likelihood of stress points being formed in the dielectric layer of the capacitor is substantially reduced, increasing yield and reliability and permitting a reduction in the thickness which leads to a greater value of capacitance per unit area. The polycrystalline silicon can be rendered amorphous through implantation of a neutral species prior to the silicidation of the polysilicon to form the silicide layer that is used for the bottom plate of the capacitive element.

    摘要翻译: 使用标准工艺形成硅化非晶多晶硅 - 金属电容器,不同之处在于,多晶硅层的硅化之前将多晶硅的暴露表面转化为非晶多晶硅,以形成电容元件的底板。 在多晶硅的表面使多晶硅转化为非晶态多晶硅使得多晶硅的顶表面与多晶硅相比基本上平滑。 这又使得形成电容器的底板的硅化物层的表面也通过多晶硅的硅化形成,使其基本平滑。 因此,在电容器的电介质层中形成应力点的可能性大大降低,提高了产量和可靠性,并允许减小厚度,这导致每单位面积的电容值更大。 多晶硅可以在多晶硅硅化之前通过中性物质的注入而变得非晶化,以形成用于电容元件底板的硅化物层。

    SEMICONDUCTOR CIRCUIT WITH MULTIPLE CONTACT SIZES
    15.
    发明申请
    SEMICONDUCTOR CIRCUIT WITH MULTIPLE CONTACT SIZES 有权
    具有多个接触尺寸的半导体电路

    公开(公告)号:US20050093151A1

    公开(公告)日:2005-05-05

    申请号:US10696017

    申请日:2003-10-29

    摘要: A semiconductor circuit comprising a semiconductor die and a package substrate. In one embodiment, a first plurality of conductive bumps serves as a portion of a conductive path between contacts on the semiconductor die and contacts on the package substrate. A second plurality of conductive bumps serves as a portion of a conductive path between other contacts on the die and contacts on the package substrate. Each of the bumps in the first plurality of conductive bumps is larger than each of the bumps in the second plurality of conductive bumps. In another embodiment, the average size of the first plurality of conductive bumps may be at least 20% larger (or greater) than the average size of the second plurality of bumps.

    摘要翻译: 一种包括半导体管芯和封装衬底的半导体电路。 在一个实施例中,第一多个导电凸块用作半导体管芯上的触头和封装衬底上的触点之间的导电路径的一部分。 第二组多个导电凸起用作芯片上的其它触头和封装衬底上的触点之间的导电路径的一部分。 第一多个导电凸块中的每个凸起大于第二多个导电凸块中的每个凸点。 在另一个实施例中,第一多个导电凸块的平均尺寸可以比第二多个凸块的平均尺寸大至少20%(或更大)。

    DOUBLE DIFFUSED VERTICAL JFET
    16.
    发明申请
    DOUBLE DIFFUSED VERTICAL JFET 有权
    双重扩散垂直JFET

    公开(公告)号:US20050012111A1

    公开(公告)日:2005-01-20

    申请号:US10623230

    申请日:2003-07-18

    CPC分类号: H01L29/66909 H01L29/8083

    摘要: We disclose the structure of a JFET device, the method of making the device and the operation of the device. The device is built near the top of a substrate. It has a buried layer that is electrically communicable to a drain terminal. It has a body region above the buried layer. A portion of the body region contacts a gate region connected to a gate terminal. The device has a channel region, of which the length spans the distance between the buried layer and a source region, which projects upward from the channel region and is connected to a source terminal. The device current flows in the channel substantially perpendicularly to the top surface of the substrate.

    摘要翻译: 我们公开了JFET器件的结构,制造器件的方法和器件的操作。 该器件靠近基板顶部。 它具有可电连接到漏极端子的掩埋层。 它在埋层之上有一个体区。 身体区域的一部分接触连接到栅极端子的栅极区域。 该器件具有沟道区,其长度跨越掩埋层与源极区之间的距离,该距离从沟道区向上突出并连接到源极。 器件电流在通道中基本上垂直于衬底的顶表面流动。

    Systems and methods of priority failover determination
    18.
    发明申请
    Systems and methods of priority failover determination 有权
    确定优先级故障切换的系统和方法

    公开(公告)号:US20060209677A1

    公开(公告)日:2006-09-21

    申请号:US11084600

    申请日:2005-03-18

    IPC分类号: H04L1/00

    CPC分类号: H04L41/0609 H04L12/44

    摘要: Systems and methods for implementing priority failover determination are disclosed. An exemplary method includes prioritizing ranking criteria for a plurality of network adapter ports based at least in part on user input. The method also includes determining a ranking value for each of the plurality of network adapter ports based on the prioritized ranking criteria. The method further includes designating a primary network adapter port and at least a secondary network adapter port based on the ranking value for each of the plurality of network adapter ports

    摘要翻译: 公开了实现优先故障转移确定的系统和方法。 一种示例性方法包括至少部分地基于用户输入来对多个网络适配器端口的排序标准进行优先级排序。 该方法还包括基于优先级排序标准确定多个网络适配器端口中的每一个的排序值。 该方法还包括基于多个网络适配器端口中的每一个的排序值来指定主网络适配器端口和至少第二网络适配器端口

    Tolerance bondwire inductors for analog circuitry
    20.
    发明申请
    Tolerance bondwire inductors for analog circuitry 有权
    用于模拟电路的公差接线电感

    公开(公告)号:US20060099792A1

    公开(公告)日:2006-05-11

    申请号:US10984150

    申请日:2004-11-09

    IPC分类号: H01L21/44

    摘要: Disclosed are wirebonding methods wherein bondwires are positioned using dynamically determined variations in die placement. Preferred methods of the invention include steps for placing a die on the prepared substrate using selected ideal placement coordinates. Deviation of the actual die placement from the selected ideal placement coordinates is monitored, and one ore more critical bondwires are wirebonded between respective die pins and pins-on the substrate. The monitored placement deviation is used to dynamically position the critical bondwires on the critical pins according to actual die placement. Disclosed embodiments include methods using lateral deviation monitoring and angular deviation monitoring to dynamically position bondwires.

    摘要翻译: 公开了引线键合方法,其中使用动态确定的管芯放置的变化来定位焊丝。 本发明的优选方法包括使用选择的理想放置坐标将管芯放置在所制备的衬底上的步骤。 监测实际管芯位置与所选择的理想放置坐标的偏差,并且一个或多个关键焊接线在相应的管芯引脚和引脚之间引线接合在衬底上。 监控的放置偏差用于根据实际的管芯位置动态地将关键焊接线定位在关键销上。 公开的实施例包括使用横向偏差监测和角度偏差监测来动态地定位键合线的方法。