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    GENERAL NOISE SUPPRESSION SCHEME WITH REFERENCE DETECTION IN OPTICAL HETERODYNE SPECTROSCOPY
    255.
    发明申请
    GENERAL NOISE SUPPRESSION SCHEME WITH REFERENCE DETECTION IN OPTICAL HETERODYNE SPECTROSCOPY 审中-公开

    公开(公告)号：US20180283950A1

    公开(公告)日：2018-10-04

    申请号：US15941510

    申请日：2018-03-30

    Applicant: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA

    Inventor： Nien-Hui Ge ,  Yuan Feng ,  Ilya Vinogradov

    IPC: G01J3/45 ,  G01J3/02

    CPC classification number: G01J3/45 ,  G01J3/027 ,  G01J3/433 ,  G01J9/04

    Abstract: A heterodyne optical spectroscopy system comprises a light source that acts as a local oscillator (LO); a beam splitting component that generates a reference beam from the LO; a signal component that generates a sample signal from a sample; a beam blocker that can turn off the sample signal to generate blank shots; a composite signal detection subsystem that detects a heterodyned signal that is a mix of the sample signal and a portion of the LO; a composite reference detection subsystem synchronized to the signal detection subsystem to detect a portion of the reference beam; and a processor that processes digital signals from the signal detection subsystem and the reference detection subsystem. A very versatile reference scheme is developed to treat different heterodyne spectroscopies in a unified way, which achieves optimal noise suppression.

    Optical chemical analyser and liquid depth sensor
    257.
    发明授权
    Optical chemical analyser and liquid depth sensor 有权

    公开(公告)号：US10041880B2

    公开(公告)日：2018-08-07

    申请号：US14758914

    申请日：2014-01-09

    Applicant: International Moisture Analysers Limited

    Inventor： Paul Stockwell ,  David Widdup ,  Michael Foster ,  Jonathan Storey

    IPC: G01J3/44 ,  G01N21/45 ,  G01N21/65 ,  G01N21/85 ,  G01J3/45

    CPC classification number: G01N21/45 ,  G01J3/4412 ,  G01J3/45 ,  G01N21/65 ,  G01N21/85 ,  G01N21/8507

    Abstract: An optical chemical analyzer comprises a source of a first amount of radiation (46), an optics module configured to direct the first amount of radiation such that it is incident on or passes though a target (14) at a target location, the optics module further being configured to receive a second amount of Raman scattered radiation from the target and direct the second amount of radiation (206) to a Spatial Interference Fourier Transform (SIFT) module, the SIFT module including a first dispersive element (216) and a second dispersive element (218), the SIFT module being configured such that a portion of the second amount of radiation is received by the first dispersive element and interferes with a portion of the second amount of radiation received by the second dispersive element to form an interference pattern; the SIFT module further comprising a detector (48) configured to capture an image of at least a portion of the interference pattern and produce a detector signal (226) based on the captured image; and a processor configured to receive the detector signal from the detector and perform a Fourier transform on the detector signal to thereby obtain a frequency spectrum of the second amount of radiation.

    Static fourier transform spectrometer
    258.
    发明授权
    Static fourier transform spectrometer 有权

    公开(公告)号：US09995629B2

    公开(公告)日：2018-06-12

    申请号：US15808898

    申请日：2017-11-10

    Applicant: Technische Universität München

    Inventor： Michael Schardt

    IPC: G01J3/45 ,  G01J3/02

    CPC classification number: G01J3/45 ,  G01J3/021 ,  G01J3/453 ,  G01J3/4531

    Abstract: A static Fourier transform spectrometer is disclosed that includes a beam splitter, a mirror device, and a collection optic. The beam splitter divides an input light beam into a first arm and a second arm, wherein the first arm is reflected by the beam splitter and the second arm passes through the beam splitter, wherein the first arm extends to the converging optical unit without deflection after reflection at the mirror device, wherein the second arm extends to the converging optical unit without deflection after passing through the beam splitter, and wherein the collection optic merges the first arm and the second arm for interference.

    Method and system for spectral imaging
    260.
    发明授权
    Method and system for spectral imaging 有权

    公开(公告)号：US09915565B2

    公开(公告)日：2018-03-13

    申请号：US14438641

    申请日：2013-10-24

    Applicant: Applied Spectral Imaging Ltd.

    Inventor： Nir Katzir

    IPC: G01J3/45 ,  G01J3/453 ,  G02B27/14 ,  G01J3/28 ,  G01J3/02

    CPC classification number: G01J3/4532 ,  G01J3/0237 ,  G01J3/0297 ,  G01J3/2823 ,  G01J3/45 ,  G02B27/144

    Abstract: A method of calibrating a spectral imaging system is disclosed. The spectral imaging system comprises an interferometer having a beam splitter and at least a first reflector and a second reflector. The method comprises: obtaining data pertaining to an interference pattern model, operating the spectral imaging system to provide an interference pattern of a received light beam, and varying a relative orientation between at least two of: the beam splitter, the first reflector and the second reflector, until the interference pattern of the input light beam substantially matches the interference pattern model.

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