Printed circuit board and methods to enhance reliability

    公开(公告)号:US10172243B2

    公开(公告)日:2019-01-01

    申请号:US15351066

    申请日:2016-11-14

    Abstract: In some embodiments, methods include drilling one or a plurality of PTHs with any industrial grade drill to fabricate holes with positive etch back, flooding the PTHs with a dilute solution of an acrylate monomer/oligomer containing an appropriate level of peroxide initiator, polymerizing the acrylate, and then rising the PTHs with the solvent used in the formulation of the acrylate material. In one embodiment, the printed circuit board may include a substrate comprising a plurality of metal layers separated by a plurality of insulating layers; a plurality of plated through holes formed in the substrate, each plated through hole comprising: recesses formed at each insulating layer, copper lands between the recesses, a polymer coating in each recess, and a metal layer lining the plated through hole.

    Laminate substrate thermal warpage prediction for designing a laminate substrate

    公开(公告)号:US10108753B2

    公开(公告)日:2018-10-23

    申请号:US15176101

    申请日:2016-06-07

    Abstract: Method of designing a laminate substrate having upper laminate layers and an equal plurality of lower laminate layers including: dividing the laminate substrate into regions having corresponding laminate layer pairs consisting of an upper laminate layer and a lower laminate layer; calculating a net stretching value for each corresponding laminate layer pair in each region to result in net stretching values in each region; summing the net stretching values in each region to result in a net stretching value for each region proportional to a curvature of each local region; calculating a relative out-of-plane displacement for the laminate substrate from the curvature of each local region; calculating a predicted thermal warpage for the laminate substrate; and finalizing a design of the laminate substrate when the predicted thermal warpage is within a predetermined acceptable range.

    UNDER BALL METALLURGY (UBM) FOR IMPROVED ELECTROMIGRATION
    29.
    发明申请
    UNDER BALL METALLURGY (UBM) FOR IMPROVED ELECTROMIGRATION 有权
    用于改进电化学的金属(UBM)

    公开(公告)号:US20140339699A1

    公开(公告)日:2014-11-20

    申请号:US14447908

    申请日:2014-07-31

    Abstract: An interconnect structure that includes a substrate having an electrical component present therein, and a under-bump metallurgy (UBM) stack that is present in contact with a contact pad to the electrical component that is present in the substrate. The UBM stack includes a metallic adhesion layer that is direct contact with the contact pad to the electrical component, a copper (Cu) seed layer that is in direct contact with the metallic adhesion layer layer, a first nickel (Ni) barrier layer that is present in direct contact with copper (Cu) seed layer, and a layered structure of at least one copper (Cu) conductor layer and at least one second nickel (Ni) barrier layer present on the first nickel (Ni) barrier layer. A solder ball may be present on second nickel (Ni) barrier layer.

    Abstract translation: 一种互连结构,其包括其中存在电气部件的基板以及与接触焊盘接触的凸起下冶金(UBM)堆叠,所述凸块冶金(UBM)堆叠存在于所述基板中的所述电气部件。 UBM堆叠包括与接触焊盘直接接触电气部件的金属粘合层,与金属粘附层层直接接触的铜(Cu)种子层,第一镍(Ni)阻挡层, 存在于铜(Cu)种子层的直接接触中,以及存在于第一镍(Ni)阻挡层上的至少一个铜(Cu)导体层和至少一个第二镍(Ni)阻挡层的层状结构。 第二镍(Ni)阻挡层上可能存在焊球。

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