METHOD FOR MANUFACTURING AN ELECTRONIC DEVICE

    公开(公告)号:US20240251509A1

    公开(公告)日:2024-07-25

    申请号:US18624158

    申请日:2024-04-02

    CPC classification number: H05K3/22 H05K1/0274 H05K1/028 H05K3/10 H05K2203/1105

    Abstract: A method for manufacturing an electronic device is disclosed. The electronic device has a first region and a transparent region. The method includes the steps of providing a flexible substrate, forming an electric circuit layer on the flexible substrate at an elevated temperature, forming an opening in the transparent region after forming the electric circuit layer, wherein the opening penetrates through a portion of the electric circuit layer, and forming a filling layer on the flexible substrate after forming the opening, wherein at least a part of the filling layer is formed in the opening to enhance a transmittance of the transparent region.

    METHOD FOR PRODUCING WIRING CIRCUIT BOARD AND WIRING CIRCUIT BOARD

    公开(公告)号:US20240107664A1

    公开(公告)日:2024-03-28

    申请号:US18471070

    申请日:2023-09-20

    CPC classification number: H05K1/0296 H05K3/0017 H05K3/10

    Abstract: A method for producing a wiring circuit board includes a step of preparing a substrate; a step of forming a first insulating layer on one side of the substrate in a thickness direction; a step of forming a conductive pattern on one side of the first insulating layer in the thickness direction; a step of etching the substrate to form a first metal support layer on the other side of the first insulating layer in the thickness direction; and a step of depositing a metal on the other side of the first metal support layer in the thickness direction to form a second metal support layer. The second metal support layer has a terminal support portion supporting two terminals of the conductive pattern, a wiring support portion supporting a wiring of the conductive pattern, and a second wiring support portion supporting a second wiring of the conductive pattern.

    Fabricating tamper-respondent sensors with random three-dimensional security patterns

    公开(公告)号:US11877390B2

    公开(公告)日:2024-01-16

    申请号:US17460421

    申请日:2021-08-30

    CPC classification number: H05K1/0275 H05K3/10 H05K2201/10151

    Abstract: Methods of fabricating tamper-respondent sensors with random three-dimensional security patterns are provided. The methods include establishing a security circuit pattern for a security circuit of a tamper-respondent sensor to enclose, at least in part, one or more components of a circuit board within a secure volume. The establishing includes determining in three-dimensions boundaries for the security circuit of the tamper-respondent sensor. The boundaries define a sensor volume which the security circuit is to fill in three dimensions. The establishing also includes generating at least one trace configuration for the security circuit pattern. The at least one trace configuration defines a random, three-dimensional security pattern to fill the sensor volume, and the at least one trace configuration establishes, at least in part, the security circuit pattern. The process further includes fabricating the tamper-respondent sensor based on the established security circuit pattern.

    PRODUCTION METHOD OF WIRING BOARD AND WIRING BOARD

    公开(公告)号:US20230269885A1

    公开(公告)日:2023-08-24

    申请号:US18140769

    申请日:2023-04-28

    Inventor: Akitoshi SAKAUE

    CPC classification number: H05K3/46 H05K1/0298 H05K3/10 H05K2203/0502

    Abstract: A wiring board includes a conductor pattern formed on a board, and an insulating film that covers at least part of the conductor pattern. A first insulating film is provided in a first region on the board, the first region covering at least part of the conductor pattern and having a first border segment. A second insulating film is provided in a second region on the board, the second region covering at least part of the first region and having a second border segment. The second border segment is located outside the first region, and the shortest distance from any point belonging to the second border segment to the first border segment is not more than 400 μm.

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