公开(公告)号：US20230132197A1

公开(公告)日：2023-04-27

申请号：US18089536

申请日：2022-12-27

Applicant: Intel Corporation

Inventor： Debendra MALLIK ,  Ravindranath MAHAJAN ,  Digvijay RAORANE

IPC: H01L23/367 ,  H01L23/538 ,  H01L23/31 ,  H01L21/56 ,  H01L23/00 ,  H01L21/48 ,  H01L23/495

Abstract: A multi-chip unit suitable for chip-level packaging may include multiple IC chips that are interconnected through a metal redistribution structure, and that are directly bonded to an integrated heat spreader. Bonding of the integrated heat spreader to the multiple IC chips may be direct so that no thermal interface material (TIM) is needed, resulting in a reduced bond line thickness (BLT) and lower thermal resistance. The integrated heat spreader may further serve as a structural member of the multi-chip unit, allowing a second side of the redistribution structure to be further interconnected to a host by solder interconnects. The redistribution structure may be fabricated on a sacrificial interposer that may facilitate planarizing IC chips of differing thickness prior to bonding the heat spreader. The sacrificial interposer may be removed to expose the RDL for further interconnection to a substrate without the use of through-substrate vias.

公开(公告)号：US20220352121A1

公开(公告)日：2022-11-03

申请号：US17858031

申请日：2022-07-05

Applicant: Intel Corporation

Inventor： Debendra MALLIK ,  Digvijay A. RAORANE ,  Ravindranath Vithal MAHAJAN ,  Mitul Bharat MODI

IPC: H01L25/065 ,  H01L21/768 ,  H01L21/822 ,  H01L23/31 ,  H01L23/42 ,  H01L23/48 ,  H01L23/00 ,  H01L21/56 ,  H01L25/00

Abstract: Semiconductor packages including passive support wafers, and methods of fabricating such semiconductor packages, are described. In an example, a semiconductor package includes a passive support wafer mounted on several active dies. The active dies may be attached to an active die wafer, and the passive support wafer may include a monolithic form to stabilize the active dies and active die wafer during processing and use. Furthermore, the passive support wafer may include a monolith of non-polymeric material to transfer and uniformly distribute heat generated by the active dies.

公开(公告)号：US20220344247A1

公开(公告)日：2022-10-27

申请号：US17862300

申请日：2022-07-11

Applicant: Intel Corporation

Inventor： Debendra MALLIK ,  Robert L. SANKMAN ,  Robert NICKERSON ,  Mitul MODI ,  Sanka GANESAN ,  Rajasekaran SWAMINATHAN ,  Omkar KARHADE ,  Shawna M. LIFF ,  Amruthavalli ALUR ,  Sri Chaitra J. CHAVALI

IPC: H01L23/498 ,  H01L23/31 ,  H01L23/538 ,  H01L23/00

Abstract: Ultra-thin, hyper-density semiconductor packages and techniques of forming such packages are described. An exemplary semiconductor package is formed with one or more of: (i) metal pillars having an ultra-fine pitch (e.g., a pitch that is greater than or equal to 150 μm, etc.); (ii) a large die-to-package ratio (e.g., a ratio that is equal to or greater than 0.85, etc.); and (iii) a thin pitch translation interposer. Another exemplary semiconductor package is formed using coreless substrate technology, die back metallization, and low temperature solder technology for ball grid array (BGA) metallurgy. Other embodiments are described.

公开(公告)号：US20210391301A1

公开(公告)日：2021-12-16

申请号：US16898198

申请日：2020-06-10

Applicant: Intel Corporation

Inventor： Shigeki TOMISHIMA ,  Debendra MALLIK ,  Altug KOKER

IPC: H01L25/065 ,  H01L25/18 ,  H01L23/538

Abstract: Embodiments disclosed herein include multi-die electronic packages. In an embodiment, an electronic package comprises a package substrate and a first die electrically coupled to the package substrate. In an embodiment, an array of die stacks are electrically coupled to the first die. In an embodiment the array of die stacks are between the first die and the package substrate. In an embodiment, individual ones of the die stacks comprise a plurality of second dies arranged in a vertical stack.

公开(公告)号：US20210082826A1

公开(公告)日：2021-03-18

申请号：US17102726

申请日：2020-11-24

Applicant: Intel Corporation

Inventor： Vipul Vijay MEHTA ,  Eric Jin LI ,  Sanka GANESAN ,  Debendra MALLIK ,  Robert Leon SANKMAN

IPC: H01L23/538 ,  H01L21/48 ,  H01L21/56 ,  H01L21/683 ,  H01L21/78 ,  H01L23/31 ,  H01L25/065 ,  H01L23/48 ,  H01L23/498

Abstract: Semiconductor packages and package assemblies having active dies and external die mounts on a silicon wafer, and methods of fabricating such semiconductor packages and package assemblies, are described. In an example, a semiconductor package assembly includes a semiconductor package having an active die attached to a silicon wafer by a first solder bump. A second solder bump is on the silicon wafer laterally outward from the active die to provide a mount for an external die. An epoxy layer may surround the active die and cover the silicon wafer. A hole may extend through the epoxy layer above the second solder bump to expose the second solder bump through the hole. Accordingly, an external memory die can be connected directly to the second solder bump on the silicon wafer through the hole.

公开(公告)号：US20200185289A1

公开(公告)日：2020-06-11

申请号：US16463638

申请日：2016-12-27

Applicant: Intel Corporation

Inventor： Mitul MODI ,  Robert L. SANKMAN ,  Debendra MALLIK ,  Ravindranath V. MAHAJAN ,  Amruthavalli P. ALUR ,  Yikang DENG ,  Eric J. LI

IPC: H01L23/13 ,  H01L23/498 ,  H01L23/31 ,  H01L25/065 ,  H01L25/18 ,  H01L25/00 ,  H01L21/56 ,  H01L21/48

Abstract: An apparatus is provided which comprises: a plurality of dielectric layers forming a substrate, a plurality of first conductive contacts on a first surface of the substrate, a cavity in the first surface of the substrate defining a second surface parallel to the first surface, a plurality of second conductive contacts on the second surface of the substrate, one or more integrated circuit die(s) coupled with the second conductive contacts, and mold material at least partially covering the one or more integrated circuit die(s) and the first conductive contacts. Other embodiments are also disclosed and claimed.

公开(公告)号：US20200083180A1

公开(公告)日：2020-03-12

申请号：US16468266

申请日：2016-12-31

Applicant: INTEL CORPORATION

Inventor： Debendra MALLIK ,  Digvijay A. RAORANE

IPC: H01L23/00 ,  H01L23/31 ,  H01L23/16 ,  H01L25/065 ,  H01L25/16 ,  H01L25/00

Abstract: An electronic package technology is disclosed. A first active die can be mountable to and electrically coupleable to a package substrate. A second active die can be disposed on a top side of the first active die, the second active die being electrically coupleable to one or both of the first active die and the package substrate. At least one open space can be available on the top side of the first active die. At least a portion of a stiffener can substantially fill the at least one open space available on the top side of the first active die.

公开(公告)号：US20240145395A1

公开(公告)日：2024-05-02

申请号：US18406018

申请日：2024-01-05

Applicant: Intel Corporation

Inventor： MD Altaf HOSSAIN ,  Ankireddy NALAMALPU ,  Dheeraj SUBBAREDDY ,  Robert SANKMAN ,  Ravindranath V. MAHAJAN ,  Debendra MALLIK ,  Ram S. VISWANATH ,  Sandeep B. SANE ,  Sriram SRINIVASAN ,  Rajat AGARWAL ,  Aravind DASU ,  Scott WEBER ,  Ravi GUTALA

IPC: H01L23/538 ,  H01L23/00 ,  H01L25/18

CPC classification number: H01L23/5385 ,  H01L23/5386 ,  H01L24/16 ,  H01L24/17 ,  H01L25/18 ,  H01L23/481 ,  H01L2224/16225

Abstract: Embodiments disclosed herein include electronic packages. In an embodiment, the electronic package comprises, a package substrate, an interposer on the package substrate, a first die cube and a second die cube on the interposer, wherein the interposer includes conductive traces for electrically coupling the first die cube to the second die cube, a die on the package substrate, and an embedded multi-die interconnect bridge (EMIB) in the package substrate, wherein the EMIB electrically couples the interposer to the die.

公开(公告)号：US20240128162A1

公开(公告)日：2024-04-18

申请号：US18397906

申请日：2023-12-27

Applicant: Intel Corporation

Inventor： Ravindranath MAHAJAN ,  Debendra MALLIK ,  Sujit SHARAN ,  Digvijay RAORANE

IPC: H01L23/48 ,  H01L21/56 ,  H01L21/768 ,  H01L23/00 ,  H01L23/31 ,  H01L23/34 ,  H01L23/538 ,  H01L25/18

CPC classification number: H01L23/481 ,  H01L21/565 ,  H01L21/76898 ,  H01L23/3128 ,  H01L23/315 ,  H01L23/34 ,  H01L23/5383 ,  H01L23/5386 ,  H01L24/09 ,  H01L24/17 ,  H01L24/29 ,  H01L24/73 ,  H01L25/18 ,  H01L2224/73253

Abstract: Embodiments disclosed herein include electronic packages and methods of forming such electronic packages. In an embodiment, the electronic package comprises a base substrate. The base substrate may have a plurality of through substrate vias. In an embodiment, a first die is over the base substrate. In an embodiment a first cavity is disposed into the base substrate. In an embodiment, the first cavity is at least partially within a footprint of the first die. In an embodiment, a first component is in the first cavity.

公开(公告)号：US20230420375A1

公开(公告)日：2023-12-28

申请号：US18367285

申请日：2023-09-12

Applicant: Intel Corporation

Inventor： Srinivas V. PIETAMBARAM ,  Tarek IBRAHIM ,  Kristof DARMAWIKARTA ,  Rahul N. MANEPALLI ,  Debendra MALLIK ,  Robert L. SANKMAN

IPC: H01L23/538 ,  H01L23/48 ,  H01L23/498 ,  H01L23/00 ,  H01L25/065

CPC classification number: H01L23/5383 ,  H01L23/481 ,  H01L23/49822 ,  H01L23/49894 ,  H01L24/09 ,  H01L25/0652

Abstract: A glass substrate houses an embedded multi-die interconnect bridge that is part of a semiconductor device package. Through-glass vias communicate to a surface for mounting on a semiconductor package substrate.