公开(公告)号：US20230260914A1

公开(公告)日：2023-08-17

申请号：US18139275

申请日：2023-04-25

Applicant: Intel Corporation

Inventor： Sanka GANESAN ,  Kevin MCCARTHY ,  Leigh M. TRIBOLET ,  Debendra MALLIK ,  Ravindranath V. MAHAJAN ,  Robert L. SANKMAN

IPC: H01L23/538 ,  H01L21/48 ,  H01L21/56 ,  H01L21/683 ,  H01L23/31 ,  H01L23/367 ,  H01L23/498 ,  H01L23/00 ,  H01L25/065 ,  H01L25/00

CPC classification number: H01L23/5381 ,  H01L21/4853 ,  H01L21/486 ,  H01L21/561 ,  H01L21/568 ,  H01L21/6835 ,  H01L23/3128 ,  H01L23/3675 ,  H01L23/49816 ,  H01L23/5384 ,  H01L23/5386 ,  H01L24/16 ,  H01L24/17 ,  H01L24/32 ,  H01L24/73 ,  H01L24/97 ,  H01L25/0655 ,  H01L25/50 ,  H01L2221/68345 ,  H01L2221/68359 ,  H01L2224/16227 ,  H01L2224/16238 ,  H01L2224/1703 ,  H01L2224/32225 ,  H01L2224/73204

Abstract: Embodiments include semiconductor packages and methods to form the semiconductor packages. A semiconductor package includes a bridge over a glass patch. The bridge is coupled to the glass patch with an adhesive layer. The semiconductor package also includes a high-density packaging (HDP) substrate over the bridge and the glass patch. The HDP substrate is conductively coupled to the glass patch with a plurality of through mold vias (TMVs). The semiconductor package further includes a plurality of dies over the HDP substrate, and a first encapsulation layer over the TMVs, the bridge, the adhesive layer, and the glass patch. The HDP substrate includes a plurality of conductive interconnects that conductively couple the dies to the bridge and glass patch. The bridge may be an embedded multi-die interconnect bridge (EMIB), where the EMIB is communicatively coupled to the dies, and the glass patch includes a plurality of through glass vias (TGVs).

公开(公告)号：US20230207522A1

公开(公告)日：2023-06-29

申请号：US17561720

申请日：2021-12-24

Applicant: Intel Corporation

Inventor： Omkar KARHADE ,  Nitin A. DESHPANDE ,  Ravindranath V. MAHAJAN

IPC: H01L25/065 ,  H01L21/56 ,  H01L23/538 ,  H01L23/48 ,  H01L23/498 ,  H01L23/00

CPC classification number: H01L25/0655 ,  H01L21/568 ,  H01L21/561 ,  H01L23/5389 ,  H01L23/481 ,  H01L23/49816 ,  H01L24/19 ,  H01L2224/04105 ,  H01L2224/12105

Abstract: Embodiments disclosed herein include die modules and methods of making die modules. In an embodiment, a die module comprises a first die with a set of first pads with surfaces that are substantially coplanar with a surface of a first dielectric layer. In an embodiment, the die module further comprises a second die with a set of second pads with surfaces that are substantially coplanar with a surface of a second dielectric layer. In an embodiment the first pads are bonded to the second pads and the first dielectric layer is bonded to the second dielectric layer.

公开(公告)号：US20220238402A1

公开(公告)日：2022-07-28

申请号：US17720202

申请日：2022-04-13

Applicant: Intel Corporation

Inventor： Mitul MODI ,  Robert L. SANKMAN ,  Debendra MALLIK ,  Ravindranath V. MAHAJAN ,  Amruthavalli P. ALUR ,  Yikang DENG ,  Eric J. LI

IPC: H01L23/13 ,  H01L21/48 ,  H01L21/56 ,  H01L23/31 ,  H01L23/498 ,  H01L25/065 ,  H01L25/18 ,  H01L25/00

Abstract: An apparatus is provided which comprises: a plurality of dielectric layers forming a substrate, a plurality of first conductive contacts on a first surface of the substrate, a cavity in the first surface of the substrate defining a second surface parallel to the first surface, a plurality of second conductive contacts on the second surface of the substrate, one or more integrated circuit die(s) coupled with the second conductive contacts, and mold material at least partially covering the one or more integrated circuit die(s) and the first conductive contacts. Other embodiments are also disclosed and claimed.

公开(公告)号：US20210035911A1

公开(公告)日：2021-02-04

申请号：US16524748

申请日：2019-07-29

Applicant: Intel Corporation

Inventor： Sanka GANESAN ,  Kevin MCCARTHY ,  Leigh M. TRIBOLET ,  Debendra MALLIK ,  Ravindranath V. MAHAJAN ,  Robert L. SANKMAN

IPC: H01L23/538 ,  H01L25/065 ,  H01L23/498 ,  H01L23/367 ,  H01L21/683 ,  H01L21/48 ,  H01L21/56 ,  H01L25/00 ,  H01L23/31 ,  H01L23/00

Abstract: Embodiments include semiconductor packages and methods to form the semiconductor packages. A semiconductor package includes a bridge over a glass patch. The bridge is coupled to the glass patch with an adhesive layer. The semiconductor package also includes a high-density packaging (HDP) substrate over the bridge and the glass patch. The HDP substrate is conductively coupled to the glass patch with a plurality of through mold vias (TMVs). The semiconductor package further includes a plurality of dies over the HDP substrate, and a first encapsulation layer over the TMVs, the bridge, the adhesive layer, and the glass patch. The HDP substrate includes a plurality of conductive interconnects that conductively couple the dies to the bridge and glass patch. The bridge may be an embedded multi-die interconnect bridge (EMIB), where the EMIB is communicatively coupled to the dies, and the glass patch includes a plurality of through glass vias (TGVs).

公开(公告)号：US20200211969A1

公开(公告)日：2020-07-02

申请号：US16235879

申请日：2018-12-28

Applicant: Intel Corporation

Inventor： MD Altaf HOSSAIN ,  Ankireddy NALAMALPU ,  Dheeraj SUBBAREDDY ,  Robert SANKMAN ,  Ravindranath V. MAHAJAN ,  Debendra MALLIK ,  Ram S. VISWANATH ,  Sandeep B. SANE ,  Sriram SRINIVASAN ,  Rajat AGARWAL ,  Aravind DASU ,  Scott WEBER ,  Ravi GUTALA

IPC: H01L23/538 ,  H01L25/18 ,  H01L23/00

Abstract: Embodiments disclosed herein include electronic packages. In an embodiment, the electronic package comprises, a package substrate, an interposer on the package substrate, a first die cube and a second die cube on the interposer, wherein the interposer includes conductive traces for electrically coupling the first die cube to the second die cube, a die on the package substrate, and an embedded multi-die interconnect bridge (EMIB) in the package substrate, wherein the EMIB electrically couples the interposer to the die.

公开(公告)号：US20250046680A1

公开(公告)日：2025-02-06

申请号：US18921373

申请日：2024-10-21

Applicant: Intel Corporation

Inventor： Aditya S. VAIDYA ,  Ravindranath V. MAHAJAN ,  Digvijay A. RAORANE ,  Paul R. START

IPC: H01L23/48 ,  H01L21/768 ,  H01L23/00 ,  H01L23/498 ,  H01L23/538 ,  H01L25/065 ,  H01L25/16

Abstract: An integrated circuit (IC) package comprising a-substrate having a first side and an opposing a second side, and a bridge die within the substrate. The bridge die comprises a plurality of vias extending from a first side to a second side of the-bridge die. The-bridge die comprises a first plurality of pads on the first side of the bridge die and a second plurality of pads on the second side. The plurality of vias interconnect ones of the first plurality of pads to ones of the second plurality of pads. The bridge die comprises an adhesive film over a layer of silicon oxide on the second side of the bridge die.

公开(公告)号：US20240071935A1

公开(公告)日：2024-02-29

申请号：US17895965

申请日：2022-08-25

Applicant: Intel Corporation

Inventor： Brandon C. MARIN ,  Ravindranath V. MAHAJAN ,  Srinivas V. PIETAMBARAM ,  Gang DUAN ,  Suddhasattwa NAD ,  Jeremy D. ECTON

IPC: H01L23/538 ,  H01L21/48 ,  H01L21/56 ,  H01L23/00 ,  H01L23/15 ,  H01L23/31 ,  H01L23/48

CPC classification number: H01L23/5381 ,  H01L21/4846 ,  H01L21/565 ,  H01L23/15 ,  H01L23/3121 ,  H01L23/481 ,  H01L23/5386 ,  H01L24/08 ,  H01L24/80 ,  H01L2224/08225 ,  H01L2224/80894 ,  H01L2224/80895

Abstract: Embodiments disclosed herein include electronic packages. In an embodiment, the electronic package comprises a first substrate, where the first substrate comprises glass, and a second substrate over the first substrate, where the second substrate comprises glass. In an embodiment, electrically conductive routing is provided in the second substrate. In an embodiment, a first die is over the second substrate, and a second die is over the second substrate. In an embodiment, the electrically conductive routing electrically couples the first die to the second die.

公开(公告)号：US20240063203A1

公开(公告)日：2024-02-22

申请号：US17889962

申请日：2022-08-17

Applicant: Intel Corporation

Inventor： Brandon C. MARIN ,  Ravindranath V. MAHAJAN ,  Srinivas V. PIETAMBARAM ,  Gang DUAN ,  Suddhasattwa NAD ,  Jeremy D. ECTON ,  Navneet SINGH ,  Sushil PADMANABHAN ,  Samarth ALVA

IPC: H01L25/18 ,  H01L23/15 ,  H01L23/538 ,  H01L23/48 ,  H01L21/48 ,  H01L25/00 ,  H01L21/56

CPC classification number: H01L25/18 ,  H01L23/15 ,  H01L23/5383 ,  H01L23/481 ,  H01L23/5384 ,  H01L21/486 ,  H01L21/4857 ,  H01L25/50 ,  H01L21/56

Abstract: Embodiments disclosed herein include electronic packages. In an embodiment, the electronic package comprises a substrate, where the substrate comprises glass, and buildup layers over the first substrate. In an embodiment, a first die is over the buildup layers, a second die is over the buildup layers and adjacent to the first die, and where conductive routing in the buildup layers electrically couples the first die to the second die.

公开(公告)号：US20230101340A1

公开(公告)日：2023-03-30

申请号：US17485295

申请日：2021-09-24

Applicant: Intel Corporation

Inventor： Kaveh HOSSEINI ,  Omkar KARHADE ,  Ravindranath V. MAHAJAN ,  Sergey Yuryevich SHUMARAYEV ,  Yew F. KOK ,  Sai VADLAMANI

IPC: H01L25/065 ,  H01L23/00 ,  H01L21/48 ,  H01L25/00

Abstract: Embodiments disclosed herein include electronic packages and methods of assembling an electronic package. In an embodiment, an electronic package comprises a package substrate with a stepped top surface, and a first die on a first plateau of the stepped top surface. In an embodiment, a second die is on a second plateau of the stepped top surface, where the second die extends over the first die, In an embodiment, a third die is on a third plateau of the stepped top surface, where the third die extends over the second die.

公开(公告)号：US20220413236A1

公开(公告)日：2022-12-29

申请号：US17358502

申请日：2021-06-25

Applicant: Intel Corporation

Inventor： Omkar KARHADE ,  Sushrutha Reddy GUJJULA ,  Tolga ACIKALIN ,  Ravindranath V. MAHAJAN ,  James E. JAUSSI ,  Chia-Pin CHIU

IPC: G02B6/42 ,  H01L25/16 ,  H01L23/00 ,  H01L23/367 ,  H01S3/04

Abstract: Embodiments described herein may be related to apparatuses, processes, and techniques related to thermally and/or electrically coupling a thermal die to the surface of a photonic integrated circuit (PIC) within an open cavity in a substrate, where the thermal die is proximate to a laser on the PIC. Other embodiments may be described and/or claimed.