Abstract:
Method and apparatus for managing data in a semiconductor memory, such as but not limited to a three dimensional (3D) NAND flash memory array. In some embodiments, the memory has non-volatile memory cells arranged into addressable blocks. Each memory cell is configured to store multiple bits. A program/read control circuit programs data sets to and reads data sets from the memory cells in the addressable blocks to service a sequence of host access commands. The circuit concurrently performs background reads in conjunction with the servicing of the host access commands. The background reads result in the reading of a different data set from each of the addressable blocks over each of a succession of time intervals of selected duration. The background reads condition the memory cells prior to a first read operation associated with the host access commands.
Abstract:
Systems and methods for improving data refresh in flash memory are described. In one embodiment, the method includes identifying a first garbage collection unit (GCU) of the storage system, computing a parity function in relation to the first GCU, identifying a data impairment in a first block, the first block being from the N blocks in the first GCU, removing the first block from the first GCU after identifying the data impairment in the first block, and recomputing the parity function when the first block is not cloned.
Abstract:
Method and apparatus for managing a solid state memory, such as but not limited to a NAND flash memory. In some embodiments, a storage device includes a non-volatile solid state memory and a control circuit configured to transfer user data between the memory and a host device. The control circuit maintains, in a local memory, a data structure indicative of measured readback error rates associated with memory locations in the memory in relation to erasure counts associated with the memory locations. The control circuit retires a subset of the memory locations identified by the data structure from further availability to store user data from the host device responsive to the measured readback error rates, and responsive to the erasure counts of said memory locations indicating the memory has reached an end of life (EOL) condition.
Abstract:
Systems and methods for low latency acquisition of soft data from a memory cell based on a sensing time and/or a leakage current are described. In one embodiment, the systems and methods may include applying a first read voltage to a word line of a page of memory cells selected by a processor of a flash memory device for a read operation, applying a pass voltage to word lines associated with one or more different pages of memory cells of the memory block, upon applying the first read voltage sensing whether a bit line of a memory cell in the selected page conducts, measuring a side effect associated with sensing whether the bit line of the memory cell in the selected page conducts, and assigning a LLR value to the memory cell as a soft LDPC input based at least in part on the measured side effect.
Abstract:
Methods and systems that include receiving data to be written to a NAND array in a controller; and writing the data to the NAND array, the NAND array including both type A NAND cells and type B NAND cells, wherein the type A NAND cells and the type B NAND cells have at least one structural difference.
Abstract:
A connection between a user device and a network server is established. Via the connection, a deep learning network is formed for a processing task. A first portion of the deep learning network operates on the user device and a second portion of the deep learning network operates on the network server. Based on cooperation between the user device and the network server, a boundary between the first portion and the second portion of the deep learning network is dynamically modified based on a change in a performance indicator that could affect the processing task
Abstract:
A data storage device receives a write data command and data. The data is stored in a buffer of the data storage device. The data storage device issues a command complete status indication. After the command complete status indication is issued, the data are stored in a primary memory of the data storage device. The primary memory comprises a first type of non-volatile memory and the buffer comprises a second type of non-volatile memory that is different from the first type of non-volatile memory.
Abstract:
A plurality of addressable memory tiles each comprise one or more cross-point arrays. Each array comprises a plurality of non-volatile resistance-change memory cells. A controller is configured to couple to the array and to a host system. The controller is configured to perform receiving, from the host system, one or more data objects each having a size equal to a predetermined logical block size, and storing the one or more data objects in a corresponding integer number of one or more of the memory tiles.
Abstract:
A data storage device may generally be constructed and operated with at least a controller configured to identify a variance from a predetermined threshold in at least one variable resistance memory cell and upgrade a first error correction code (ECC) level to a second ECC level for the at least one variable resistance memory cell.
Abstract:
A memory unit includes a giant magnetoresistance cell electrically coupled between a write bit line and a write source line. The giant magnetoresistance cell includes a free magnetic layer. A magnetic tunnel junction data cell is electrically coupled between a read bit line and a read source line. The magnetic tunnel junction data cell includes the free magnetic layer. A write current passes through the giant magnetoresistance cell to switch the giant magnetoresistance cell between a high resistance state and a low resistance state. The magnetic tunnel junction data cell is configured to switch between a high resistance state and a low resistance state by magnetostatic coupling with the giant magnetoresistance cell, and be read by a read current passing though the magnetic tunnel junction data cell.