公开(公告)号：US20240104164A1

公开(公告)日：2024-03-28

申请号：US18080545

申请日：2022-12-13

Applicant: Silicon Storage Technology, Inc.

Inventor： HIEU VAN TRAN ,  STEPHEN TRINH ,  STANLEY HONG ,  THUAN VU ,  DUC NGUYEN ,  HIEN HO PHAM

IPC: G06F17/16 ,  G06N3/063

CPC classification number: G06F17/16 ,  G06N3/063

Abstract: Numerous examples are disclosed of verification circuitry and associated methods in an artificial neural network. In one example, a system comprises a vector-by-matrix multiplication array comprising a plurality of non-volatile memory cells arranged in rows and columns, the non-volatile memory cells respectively capable of storing one of N possible levels corresponding to one of N possible currents, and a plurality of output blocks to receive current from respective columns of the vector-by-matrix multiplication array and generate voltages during a verify operation of the vector-by-matrix multiplication and generate digital outputs during a read operation of the vector-by-matrix multiplication.

公开(公告)号：US20240095509A1

公开(公告)日：2024-03-21

申请号：US18520500

申请日：2023-11-27

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  STANLEY HONG ,  ANH LY ,  THUAN VU ,  HIEN PHAM ,  KHA NGUYEN ,  HAN TRAN

IPC: G06N3/065 ,  G06F17/16 ,  G06N3/04

CPC classification number: G06N3/065 ,  G06F17/16 ,  G06N3/04

Abstract: In one example, a neural network device comprises a first plurality of synapses configured to receive a first plurality of inputs and to generate therefrom a first plurality of outputs, wherein the first plurality of synapses comprises a plurality of memory cells, each of the plurality of memory cells configured to store a weight value corresponding to a number of electrons on its floating gate and the plurality of memory cells are configured to generate the first plurality of outputs based upon the first plurality of inputs and the stored weight values.

公开(公告)号：US20240079064A1

公开(公告)日：2024-03-07

申请号：US18139908

申请日：2023-04-26

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Stanley Hong ,  Stephen Trinh ,  Thuan Vu ,  Steven Lemke ,  Vipin Tiwari ,  Nhan Do

IPC: G11C16/10 ,  G06N3/065 ,  G11C11/56 ,  G11C16/04 ,  G11C16/14 ,  G11C16/34

CPC classification number: G11C16/10 ,  G06N3/065 ,  G11C11/5628 ,  G11C16/0425 ,  G11C16/0433 ,  G11C16/14 ,  G11C16/3459

Abstract: In one example, a system comprises a neural network array of non-volatile memory cells arranged in rows and columns; and a logical cell comprising a first plurality of non-volatile memory cells in a first row of the array and a second plurality of non-volatile memory cells in a second row adjacent to the first row; wherein the first plurality of non-volatile memory cells and the second plurality of non-volatile memory cells are configured as one or more coarse cells and one or more fine cells.

公开(公告)号：US20240062813A1

公开(公告)日：2024-02-22

申请号：US18385281

申请日：2023-10-30

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran

IPC: G11C11/54 ,  G06N3/063 ,  G11C16/04 ,  G11C16/10 ,  G11C16/24 ,  G11C16/26

CPC classification number: G11C11/54 ,  G06N3/063 ,  G11C16/0425 ,  G11C16/10 ,  G11C16/24 ,  G11C16/26 ,  H10B41/30

Abstract: A first example comprises programming a memory cell to store a value; applying a series of currents of increasing size to a bit line of the memory cell; and measuring a voltage of a control gate terminal of the memory cell to determine a bias. A second example comprises programming a memory cell to store a value; applying a predetermined current to a bit line of the memory cell; and measuring a voltage of a control gate terminal of the memory cell to determine a bias.

公开(公告)号：US20240062812A1

公开(公告)日：2024-02-22

申请号：US18385256

申请日：2023-10-30

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran

IPC: G11C11/54 ,  G06N3/063 ,  G11C16/04 ,  G11C16/10 ,  G11C16/24 ,  G11C16/26

CPC classification number: G11C11/54 ,  G06N3/063 ,  G11C16/0425 ,  G11C16/10 ,  G11C16/24 ,  G11C16/26 ,  H10B41/30

Abstract: In one example, a method comprises programming a memory cell capable of storing any of N values with 1 of the N values; applying a series of currents of increasing size to a bit line of the memory cell; comparing a voltage of the bit line to a reference voltage to generate a comparison output; and when the comparison output changes value, measuring a voltage of a control gate terminal of the memory cell and storing the voltage in a bias lookup table.

公开(公告)号：US11847556B2

公开(公告)日：2023-12-19

申请号：US17875281

申请日：2022-07-27

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Steven Lemke ,  Vipin Tiwari ,  Nhan Do ,  Mark Reiten

IPC: G06N3/065 ,  G11C11/54 ,  G06F1/03 ,  G06F17/16 ,  G11C11/56 ,  G06F11/16 ,  G11C13/00 ,  G11C29/44 ,  G06F7/78

CPC classification number: G06N3/065 ,  G06F1/03 ,  G06F7/78 ,  G06F11/1666 ,  G06F17/16 ,  G11C11/54 ,  G11C11/5635 ,  G11C13/0021 ,  G11C29/44

Abstract: Numerous examples of a precision programming apparatus are disclosed for precisely and quickly depositing the correct amount of charge on the floating gate of a non-volatile memory cell within a vector-by-matrix multiplication (VMM) array in an artificial neural network. In one example, a neuron output circuit for providing a current to program as a weight value in a selected memory cell in a vector-by-matrix multiplication array is disclosed, the neuron output circuit comprising a first adjustable current source to generate a scaled current in response to a neuron current to implement a positive weight, and a second adjustable current source to generate a scaled current in response to a neuron current to implement a negative weight.

公开(公告)号：US11798644B2

公开(公告)日：2023-10-24

申请号：US17669793

申请日：2022-02-11

Applicant: Silicon Storage Technology, Inc.

Inventor： Xiaozhou Qian ,  Yaohua Zhu

IPC: G11C7/00 ,  G11C29/04 ,  G11C8/10

CPC classification number: G11C29/04 ,  G11C8/10

Abstract: Various embodiments are disclosed for performing address fault detection in a memory system using a hierarchical ROM encoding system. In one embodiment, a hierarchical ROM encoding system comprises two levels of ROM encoders that are used to detect an address fault. In another embodiment, a hierarchical ROM encoding system comprises three levels of ROM encoders that are used to detect an address fault.

公开(公告)号：US11797834B2

公开(公告)日：2023-10-24

申请号：US17885431

申请日：2022-08-10

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Vipin Tiwari ,  Nhan Do

IPC: G06N3/065 ,  G11C11/56 ,  G06F3/06 ,  G06F17/16 ,  G06N3/08 ,  G11C13/00 ,  G11C16/04 ,  G11C16/28 ,  G06N3/048

CPC classification number: G06N3/065 ,  G06F3/061 ,  G06F3/0688 ,  G06F17/16 ,  G06N3/048 ,  G06N3/08 ,  G11C11/5642 ,  G11C13/004 ,  G11C16/0425 ,  G11C16/28 ,  G11C2211/563 ,  G11C2213/15

Abstract: Numerous embodiments are disclosed for compensating for differences in the slope of the current-voltage characteristic curve among reference transistors, reference memory cells, and flash memory cells during a read operation in an analog neural memory in a deep learning artificial neural network. In one embodiment, a method comprises receiving a first voltage, multiplying the first voltage by a coefficient to generate a second voltage, applying the first voltage to a gate of one of a reference transistor and a selected memory cell, applying the second voltage to a gate of the other of a reference transistor and a selected memory cell, and using the reference transistor in a sense operation to determine a value stored in the selected memory cell.

公开(公告)号：US11769558B2

公开(公告)日：2023-09-26

申请号：US17482095

申请日：2021-09-22

Applicant: Silicon Storage Technology, Inc.

Inventor： Viktor Markov ,  Alexander Kotov

IPC: G11C16/34 ,  G11C16/10 ,  G11C16/26 ,  G11C16/14

CPC classification number: G11C16/3427 ,  G11C16/10 ,  G11C16/14 ,  G11C16/26 ,  G11C2216/04

Abstract: A method of programing a memory device having a plurality of memory cell groups where each of the memory cell group includes N non-volatile memory cells, where N is an integer greater than or equal to 2. For each memory cell group, the method includes programming each of the non-volatile memory cells in the memory cell group to a particular program state, performing multiple read operations on each of the non-volatile memory cells in the memory cell group, identifying one of the non-volatile memory cells in the memory cell group that exhibits a lowest read variance during the multiple read operations, deeply programming all of the non-volatile memory cells in the memory cell group except the identified non-volatile memory cell, and programming the identified non-volatile memory cell in the memory cell group with user data.

公开(公告)号：US11729970B2

公开(公告)日：2023-08-15

申请号：US17121555

申请日：2020-12-14

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Steven Lemke ,  Vipin Tiwari ,  Nhan Do ,  Mark Reiten

IPC: H01L27/11531 ,  G06N3/08 ,  G11C16/04 ,  H01L29/788 ,  H10B41/42

CPC classification number: H10B41/42 ,  G06N3/08 ,  G11C16/0425 ,  H01L29/7883

Abstract: Numerous embodiments for reading a value stored in a selected memory cell in a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. In one embodiment, an input comprises a set of input bits that result in a series of input pulses applied to a terminal of the selected memory cell, further resulting in a series of output signals that are summed to determine the value stored in the selected memory cell. In another embodiment, an input comprises a set of input bits, where each input bit results in a single pulse or no pulse being applied to a terminal of the selected memory cell, further resulting in a series of output signals which are then weighted according to the binary bit location of the input bit, and where the weighted signals are then summed to determine the value stored in the selected memory cell.