Abstract:
A memory device includes at least one segmented writing line formed by at least one writing segment. A programming circuit is controlled by a line address circuit in a writing mode of the memory device to program at least one memory cell coupled to the segmented writing line. A reading bit line is connected to a reading circuit for reading the contents of the cell in a reading mode of the memory device. The reading bit line cooperates in writing mode with the line address circuit to control the programming circuit of the segmented writing line.
Abstract:
An FAMOS memory includes memory cells, with each memory cell including an insulated gate transistor, and a first access transistor having a drain connected to a source of the insulated gate transistor. The FAMOS memory also includes an insulation transistor having a drain and a source respectively connected to the source of the insulated gate transistors of two adjacent cells of a same row. Each insulated gate transistor has a ring structure, and a ladder-shaped separation region insulates the cells of the same row.
Abstract:
Described is an apparatus which comprises: a first power supply node to provide a first power supply, a second power supply node, and a third power supply node; a first transistor which is operable to couple the first and second power supply nodes; and a charge pump circuit to provide a boosted voltage to the third power supply node in one mode, and to recover charge from the second power node in another mode. Described is a memory unit which comprises: a DRAM which is operable to be refreshed; a gated power supply node coupled to the DRAM to provide a gated power supply to the DRAM; and a charge recycling circuit to recover charge from the gated power supply node after the DRAM is refreshed.
Abstract:
A sense amplifier system includes a first path, a second path, a memory cell, a first reference cell, a second reference cell, and a switch component. The switch component is configured to switch connections between the first and second reference cells and the first and second paths according to a sampling phase and an amplification phase.
Abstract:
Representative implementations of memory devices have transistors between memory cells of a memory device. Memory devices may be arranged in memory arrays. The use of transistors may include alternately providing electrical isolation or current paths between pairs or groups of memory cells in a memory array.
Abstract:
The invention relates to an edge transition detector, and a method of operating an edge transition detector. An integrated circuit includes an edge transition detector for producing an output signal at an output node in response to an input signal. The edge transition detector includes a switch coupled to the output node. The edge transition detector includes a logic device with a first input coupled to the input node and an output coupled to a control terminal of the switch to enable the switch to conduct, thereby effecting a transition of the output signal from a first logic level to a second logic level in response to the input signal. A feedback path is provided from the output node to a second input of the logic device to disable switch conductivity when the output signal completes the logic transition from the first logic level to the second logic level.
Abstract:
An apparatus including a memory cell, a reference cell, a control unit, coupled to the memory cell and the reference cell, and configured to initiate write processes of the memory cell and the reference cell, and a detection unit, coupled to the reference cell, and configured to detect a write completion of the reference cell. Related methods are also disclosed.
Abstract:
The invention relates to a device for setting up a write current on at least one write conducting line in an MRAM type integrated circuit memory, including a current mirror composed of a first stage acting as the reference regulated cascode stage receiving all or part of the write current on its input and a second stage acting as the copy regulated cascode stage copying the write current onto the write line.
Abstract:
An embodiment of the invention pertains to an nth order selector switch device comprising: a first arm comprising n transistors series-connected between a first input to which a 0-ranking potential is applied, and an output; and a second arm comprising n transistors series-connected between a second input to which a 0-ranking potential is applied, and the output. The device according to the invention also comprises: a means to produce n−1 potentials ranked 1 to n−1 included between the potential ranked 0 and the potential ranked n; and a driving means for the production, from the n+1 potentials ranked 0 to n, of control signals suited to driving the gates of the transistors of the first arm and the gates of the transistors of the second arm so that the transistors of one of the arms are on and the transistors of the other arm are off depending on the value of the n-ranking potential relative to the value of the 0-ranking potential.
Abstract:
The invention relates to a device, and also to a corresponding method of implementation, for SRAM memory information storage, powered by a voltage VDD and comprising: an array of base cells organised in base columns, and at least one mirror column of mirror cells, liable to simulate the behaviour of the cells in a base column, The invention is characterised in that the device further comprises: Emulation means, in a mirror column, of the most restricting cell in a base column, Means for varying the mirror power supply voltage (VDDMMOCK) for the mirror column, and Means for copying the mirror power supply voltage in the emulated base column.