Memory architecture with segmented writing lines
    31.
    发明申请
    Memory architecture with segmented writing lines 有权
    具有分段写作线的内存架构

    公开(公告)号:US20050281090A1

    公开(公告)日:2005-12-22

    申请号:US11152033

    申请日:2005-06-14

    CPC classification number: G11C11/16

    Abstract: A memory device includes at least one segmented writing line formed by at least one writing segment. A programming circuit is controlled by a line address circuit in a writing mode of the memory device to program at least one memory cell coupled to the segmented writing line. A reading bit line is connected to a reading circuit for reading the contents of the cell in a reading mode of the memory device. The reading bit line cooperates in writing mode with the line address circuit to control the programming circuit of the segmented writing line.

    Abstract translation: 存储器件包括由至少一个写入段形成的至少一个分段写入线。 编程电路由存储器件的写入模式中的行地址电路控制,以对耦合到分段写入线的至少一个存储单元进行编程。 读取位线连接到用于在存储器件的读取模式下读取单元的内容的读取电路。 读取位线以写入模式与线路地址电路协作,以控制分段写入线的编程电路。

    FAMOS type non-volatile memory
    32.
    发明授权
    FAMOS type non-volatile memory 有权
    FAMOS型非易失性存储器

    公开(公告)号:US06707697B2

    公开(公告)日:2004-03-16

    申请号:US10126442

    申请日:2002-04-19

    CPC classification number: G11C16/0433 H01L27/115

    Abstract: An FAMOS memory includes memory cells, with each memory cell including an insulated gate transistor, and a first access transistor having a drain connected to a source of the insulated gate transistor. The FAMOS memory also includes an insulation transistor having a drain and a source respectively connected to the source of the insulated gate transistors of two adjacent cells of a same row. Each insulated gate transistor has a ring structure, and a ladder-shaped separation region insulates the cells of the same row.

    Abstract translation: FAMOS存储器包括存储器单元,其中每个存储单元包括绝缘栅极晶体管,以及具有连接到绝缘栅极晶体管的源极的漏极的第一存取晶体管。 FAMOS存储器还包括绝缘晶体管,其具有分别连接到同一行的两个相邻单元的绝缘栅极晶体管的源极的漏极和源极。 每个绝缘栅极晶体管具有环形结构,并且梯形分离区域使得同一行的单元绝缘。

    Integrated circuit and method of detecting a signal edge transition
    36.
    发明授权
    Integrated circuit and method of detecting a signal edge transition 有权
    检测信号边沿转换的集成电路和方法

    公开(公告)号:US07782093B2

    公开(公告)日:2010-08-24

    申请号:US11805305

    申请日:2007-05-23

    Applicant: Cyrille Dray

    Inventor: Cyrille Dray

    CPC classification number: G11C7/22 G11C7/222 G11C8/18 H03K5/1534

    Abstract: The invention relates to an edge transition detector, and a method of operating an edge transition detector. An integrated circuit includes an edge transition detector for producing an output signal at an output node in response to an input signal. The edge transition detector includes a switch coupled to the output node. The edge transition detector includes a logic device with a first input coupled to the input node and an output coupled to a control terminal of the switch to enable the switch to conduct, thereby effecting a transition of the output signal from a first logic level to a second logic level in response to the input signal. A feedback path is provided from the output node to a second input of the logic device to disable switch conductivity when the output signal completes the logic transition from the first logic level to the second logic level.

    Abstract translation: 本发明涉及一种边缘转换检测器,以及一种操作边缘转换检测器的方法。 集成电路包括用于响应于输入信号在输出节点产生输出信号的边沿转换检测器。 边缘转换检测器包括耦合到输出节点的开关。 边缘跃迁检测器包括具有耦合到输入节点的第一输入和耦合到开关的控制端的输出的逻辑器件,以使开关能导通,从而实现输出信号从第一逻辑电平到 响应于输入信号的第二逻辑电平。 当输出信号完成从第一逻辑电平到第二逻辑电平的逻辑转换时,反馈路径从输出节点提供给逻辑器件的第二输入,以禁止开关电导率。

    Memory device and testing with write completion detection
    37.
    发明授权
    Memory device and testing with write completion detection 有权
    内存设备和测试与写入完成检测

    公开(公告)号:US07630264B2

    公开(公告)日:2009-12-08

    申请号:US11782418

    申请日:2007-07-24

    CPC classification number: G11C29/50 G11C11/41 G11C29/24 G11C29/50012

    Abstract: An apparatus including a memory cell, a reference cell, a control unit, coupled to the memory cell and the reference cell, and configured to initiate write processes of the memory cell and the reference cell, and a detection unit, coupled to the reference cell, and configured to detect a write completion of the reference cell. Related methods are also disclosed.

    Abstract translation: 一种装置,包括耦合到存储单元和参考单元的存储单元,参考单元,控制单元,并且被配置为启动存储单元和参考单元的写入处理;以及检测单元,耦合到参考单元 并且被配置为检测参考单元的写入完成。 还公开了相关方法。

    Device for setting up a write current in an MRAM type memory and memory comprising
    38.
    发明授权
    Device for setting up a write current in an MRAM type memory and memory comprising 有权
    用于在MRAM型存储器和存储器中设置写入电流的装置,包括

    公开(公告)号:US07545686B2

    公开(公告)日:2009-06-09

    申请号:US11083112

    申请日:2005-03-17

    Abstract: The invention relates to a device for setting up a write current on at least one write conducting line in an MRAM type integrated circuit memory, including a current mirror composed of a first stage acting as the reference regulated cascode stage receiving all or part of the write current on its input and a second stage acting as the copy regulated cascode stage copying the write current onto the write line.

    Abstract translation: 本发明涉及一种用于在MRAM型集成电路存储器中的至少一个写入导线上建立写入电流的装置,该器件包括电流镜,该电流镜由作为参考调节共源共栅级的第一级构成,该级用于接收全部或部分写入 其输入电流和作为复制调制共源共栅级的第二级将写入电流复制到写入线上。

    Recursive device for switching over a high potential greater than a nominal potential of a technology in which the device is made and related system and method
    39.
    发明授权
    Recursive device for switching over a high potential greater than a nominal potential of a technology in which the device is made and related system and method 有权
    用于切换高于设备制造技术的标称电位的高电位的递归设备及相关系统和方法

    公开(公告)号:US07489559B2

    公开(公告)日:2009-02-10

    申请号:US11643009

    申请日:2006-12-19

    CPC classification number: H03K17/102 H03K17/693

    Abstract: An embodiment of the invention pertains to an nth order selector switch device comprising: a first arm comprising n transistors series-connected between a first input to which a 0-ranking potential is applied, and an output; and a second arm comprising n transistors series-connected between a second input to which a 0-ranking potential is applied, and the output. The device according to the invention also comprises: a means to produce n−1 potentials ranked 1 to n−1 included between the potential ranked 0 and the potential ranked n; and a driving means for the production, from the n+1 potentials ranked 0 to n, of control signals suited to driving the gates of the transistors of the first arm and the gates of the transistors of the second arm so that the transistors of one of the arms are on and the transistors of the other arm are off depending on the value of the n-ranking potential relative to the value of the 0-ranking potential.

    Abstract translation: 本发明的实施例涉及一种第n级选择器开关装置,包括:第一臂,包括串联连接在施加0级电位的第一输入端和输出端之间的n个晶体管; 以及第二臂,包括串联连接在施加0级电位的第二输入和输出之间的n个晶体管。 根据本发明的装置还包括:产生潜在排名0和潜在等级为n之间的包括1至n-1的n-1个电位的装置; 以及用于从适于驱动第一臂的晶体管的栅极和第二臂的晶体管的栅极的控制信号产生从0到n的n + 1个电位的驱动装置,使得一个晶体管 根据相对于0级电位值的n级势的值,另一臂的晶体管截止。

    SRAM MEMORY DEVICE WITH IMPROVED WRITE OPERATION AND METHOD THEREOF
    40.
    发明申请
    SRAM MEMORY DEVICE WITH IMPROVED WRITE OPERATION AND METHOD THEREOF 有权
    具有改进的写操作的SRAM存储器件及其方法

    公开(公告)号:US20080159014A1

    公开(公告)日:2008-07-03

    申请号:US11617336

    申请日:2006-12-28

    CPC classification number: G11C11/413

    Abstract: The invention relates to a device, and also to a corresponding method of implementation, for SRAM memory information storage, powered by a voltage VDD and comprising: an array of base cells organised in base columns, and at least one mirror column of mirror cells, liable to simulate the behaviour of the cells in a base column, The invention is characterised in that the device further comprises: Emulation means, in a mirror column, of the most restricting cell in a base column, Means for varying the mirror power supply voltage (VDDMMOCK) for the mirror column, and Means for copying the mirror power supply voltage in the emulated base column.

    Abstract translation: 本发明涉及一种由电压VDD供电的SRAM存储器信息存储器的器件以及相应的实现方法,包括:组合在基本列中的基本单元阵列,以及镜像单元的至少一个反射镜列, 本发明的特征在于,该装置还包括:在反射镜列中的仿真装置,其是基极柱中最大限制电池的装置,用于改变反射镜电源电压的装置 (VDDMMOCK),以及用于复制仿真基列中的反射镜电源电压的装置。

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