ASYNCRONOUS RESETTING INTEGRATED CIRCUITS

    公开(公告)号:US20240429904A1

    公开(公告)日:2024-12-26

    申请号:US18826526

    申请日:2024-09-06

    Abstract: A plurality of flip-flops of an integrated circuit (IC) (e.g., an ASIC) are electrically connected in a predefined series. The scan input gate of any give flip-flop in the predefined series is electrically connected to one of a Q output gate or a Q-bar output gate of an adjacent flip-flop in the predefined series. A reset operation for the IC occurs by feeding a bit string of identical bits (e.g., all zeros) through the scan input gate of a first flip-flop of the plurality of flip-flops to reset the plurality of flip-flops without the need for resetting circuitry and accompanying power savings for the IC.

    Command timer interrupt
    33.
    发明授权

    公开(公告)号:US12073121B2

    公开(公告)日:2024-08-27

    申请号:US18048292

    申请日:2022-10-20

    CPC classification number: G06F3/0659 G06F3/0604 G06F3/0631 G06F3/0673

    Abstract: Methods, systems, and devices for command timer interrupt are described. In some cases, a memory system having a host-driven logical block interface may maintain a timer to measure processing of commands. For example, upon receiving a command and storing the command in a command queue, a protocol controller of the memory system may issue the command to a command controller of the memory system and initiate the timer. Upon receiving a response for the command from the command controller, the protocol controller may reset or stop the timer, depending on whether the command queue is empty. If the timer expires prior to receiving a response for the command, the protocol controller may issue an interrupt signal to the command controller.

    VOLTAGE DETECTION FOR MANAGED MEMORY SYSTEMS
    34.
    发明公开

    公开(公告)号:US20240274211A1

    公开(公告)日:2024-08-15

    申请号:US18583510

    申请日:2024-02-21

    CPC classification number: G11C29/021 G11C5/144 G11C29/028

    Abstract: Methods, systems, and devices for voltage detection for managed memory systems are described. In some cases, a memory system may include circuitry to monitor one or more supply voltages to the memory system or voltages generated by the memory system to determine whether a voltage rises above an operational range. In some cases, an overvoltage detector may include an undervoltage detector that has been tuned or manufactured to have a higher threshold than an undervoltage detector used to determine whether a voltage has fallen below the operational range. Accordingly, the memory system may monitor a voltage using an undervoltage detector having a threshold corresponding to a lower bound or lower operation point of the operational range of the monitored voltage and an overvoltage detectors having a threshold corresponding to the upper bound or upper operational point of the operational range.

    COMMAND AND DATA PATH ERROR PROTECTION
    35.
    发明公开

    公开(公告)号:US20240134746A1

    公开(公告)日:2024-04-25

    申请号:US18048283

    申请日:2022-10-19

    CPC classification number: G06F11/108 G06F11/106

    Abstract: Methods, systems, and devices for command and data path error protection are described. In some examples, a memory system may receive data units from a host device. The data units may include respective sets of parity bits, and the memory system may perform an error detection operation on the data units. A first controller of the memory system may generate a protocol unit using data (e.g., a subset of data) from the data units. The protocol unit may include a set of parity bits (e.g., a different set of parity bits), and a second controller of the memory system may perform an error detection operation on the protocol unit. The second controller of the memory system may generate a data storage unit using data (e.g., a subset of data) from the protocol unit, and may store the data unit and another set of parity bits to a memory device.

    INTERNAL REFERENCE RESISTOR FOR NON-VOLATILE MEMORY

    公开(公告)号:US20230395146A1

    公开(公告)日:2023-12-07

    申请号:US17831414

    申请日:2022-06-02

    CPC classification number: G11C13/004 G11C2013/0054 G11C13/0038 G11C13/0069

    Abstract: An example apparatus include an array of memory cells. The example apparatus includes a memory controller coupled to the array. The memory controller can include an internal reference resistor. The memory controller can be configured to monitor memory characteristics for the array and the memory controller. The memory controller can be configured to trim the internal reference resistor to result in a target resistance value based on the memory characteristics.

    Almost ready memory management
    39.
    发明授权

    公开(公告)号:US11636904B2

    公开(公告)日:2023-04-25

    申请号:US17229476

    申请日:2021-04-13

    Abstract: A method includes determining, via status polling at a first interval, an indicator of an almost ready status of a set of memory cells of a memory device, based on the indicator of the almost ready status, determining the set of memory cells of the memory device is almost ready to complete execution of an operation on the set of memory cells of the memory device, and responsive to determining the set of memory cells of the memory device is almost ready to complete execution of the operation, performing status polling at a second interval.

Patent Agency Ranking