Abstract:
According to one mode of implementation it is proposed to automatically accelerate the write operation by deleting on the basis of the values of the data to be written and optionally on the basis of the values of the data present in the memory the erasure step or the programming step, so doing while optionally using a conventional write command. When the memory is equipped with an error-correcting code based on a Hamming code, a property of the latter makes it possible readily to implement this possible acceleration of the cycles of writings within the memory. This property is that according to which when all the bits of the bytes of a digital word grouping together n bytes are equal to zero, the check bits associated with these bytes are also all equal to zero.
Abstract:
A memory device includes an input/output interface, a bus of SPI type coupled to the input/output interface, and a plurality of individual non-volatile memory devices connected to the bus of SPI type. The chip select inputs of each individual memory device are all connected to one and the same chip select wire of the SPI bus. The individual memory devices are further configured and controllable so as to behave, as seen by the input/output interface, as a single non-volatile memory device, the total memory space of which has a total memory capacity equal to the sum of the individual memory capacities of the individual devices.
Abstract:
A semiconductor structure includes first and second source/drain region disposed in a semiconductor body and spaced from each other by a channel region. A gate electrode overlies the channel region and a capacitor electrode is disposed between the gate electrode and the channel region. A first gate dielectric is disposed between the gate electrode and the capacitor electrode and a second gate dielectric disposed between the capacitor electrode and the channel region. A first electrically conductive contact region is in electrical contact with the gate electrode and a second electrically conductive contact region in electrical contact with the capacitor electrode. The first and second contact regions are electrically isolated from one another.
Abstract:
One embodiment provides a method for reading a memory cell of a memory plane of a memory of the erasable electrically-programmable ROM type. The word line and of the bit line to which the memory cell belongs are selected and the content of the cell is read via a read amplifier. One input of the read amplifier is connected to the bit line and pre-charged at a pre-charge voltage. During the read operation, a source voltage higher than the pre-charge voltage is applied to the source of the floating-gate transistor of the cell. A read current flows from the cell towards the input of the read amplifier and then flows through a programmed cell.
Abstract:
According to one mode of implementation it is proposed to automatically accelerate the write operation by deleting on the basis of the values of the data to be written and optionally on the basis of the values of the data present in the memory the erasure step or the programming step, so doing while optionally using a conventional write command. When the memory is equipped with an error-correcting code based on a Hamming code, a property of the latter makes it possible readily to implement this possible acceleration of the cycles of writings within the memory. This property is that according to which when all the bits of the bytes of a digital word grouping together n bytes are equal to zero, the check bits associated with these bytes are also all equal to zero.
Abstract:
An electromagnetic transponder including a resonant circuit; a rectifying bridge having input terminals connected across the resonant circuit and having rectified output terminals providing an electronic circuit power supply voltage; and a device for limiting the voltage across the resonant circuit, connected between the input terminals of the rectifying bridge.
Abstract:
An electromagnetic transponder including a resonant circuit; a rectifying bridge having input terminals connected across the resonant circuit and having rectified output terminals providing an electronic circuit power supply voltage; and a device for limiting the voltage across the resonant circuit, connected between the input terminals of the rectifying bridge.
Abstract:
A semiconductor structure includes first and second source/drain region disposed in a semiconductor body and spaced from each other by a channel region. A gate electrode overlies the channel region and a capacitor electrode is disposed between the gate electrode and the channel region. A first gate dielectric is disposed between the gate electrode and the capacitor electrode and a second gate dielectric disposed between the capacitor electrode and the channel region. A first electrically conductive contact region is in electrical contact with the gate electrode and a second electrically conductive contact region in electrical contact with the capacitor electrode. The first and second contact regions are electrically isolated from one another.
Abstract:
A method can be used for managing the operation of a memory cell that includes an SRAM elementary memory cell and a non-volatile elementary memory cell coupled to one another. A data bit is transferred between the SRAM elementary memory cell and the non-volatile elementary memory cell. A control datum is stored in a control memory cell that is functionally analogous to and associated with the memory cell. The data bit is read from the SRAM elementary memory cell and a corresponding read of the control datum is performed. The data bit read from the SRAM elementary memory cell is inverted if the control datum has a first value but the data bit read from the SRAM elementary memory cell is not inverted if the control datum has a second value.
Abstract:
Some embodiments include a method for addressing an integrated circuit for a non-volatile memory of the EEPROM type on a bus of the I2C type. The memory includes J hardware-identification pins, with J being an integer lying between 1 and 3, which are assigned respective potentials defining an assignment code on J bits. The method includes a first mode of addressing used selectively when the assignment code is equal to a fixed reference code on J bits, and a second mode of addressing used selectively when the assignment code is different from the reference code. In the first mode, the memory plane of the non-volatile memory is addressed by a memory address contained in the last low-order bits of the slave address and in the first N bytes received. In the second mode, the memory plane is addressed by a memory address contained in the first N+1 bytes received.