Abstract:
A method for testing an electrically programmable non-volatile memory including a cell matrix and an internal state machine which governs the succession and timing of the memory programming phases includes excluding the internal state machine, modifying at least one of the control signals to program the cell matrix, and verifying programming correctness.
Abstract:
While employing the same number of dedicated pins of an IC, a self-configurable interface circuit between a control bus and the IC recognizes whether the IC is being used in a system employing an SPI or a I2CBUS protocol for the transmission to the IC of control signals through the bus. The interface circuit employs an "inner" SPI interface standard block, to a third input of which either a true CE (chip-enable) signal coming from a third wire of the bus or a virtual CE signal that is self-generated by the interface circuit in case of operation in an I2CBUS environment, is fed. The third (ADDR) pin of the IC may be connected to the CE wire of the bus in case of an SPI application or it may be biased at the supply or ground voltage for selecting one or the other of two internal addresses of the IC, when functioning in an I2CBUS environment.
Abstract:
Non-volatile memory cell with double level of polycrystalline silicon has a source region (38), a drain region (31), a channel region (34) between said source and drain regions, a floating gate (33), and a control gate (32) in which the channel region area extends into two lateral zones beneath the two gates and perpendicular to the source-drain direction.
Abstract:
To reduce read and write errors caused by depleted memory array cells being turned on even when not selected, the nonselected memory cells are so biased as to present a floating terminal and a terminal at a positive voltage with respect to the substrate region. The threshold voltage of nonselected cells (i.e., the minimum voltage between the gate and source terminals for the cell to be turned on) increases due to a "body effect", whereby the threshold voltage depends on the voltage drop between the source terminal and the substrate. The source line of a selected cell is biased to a positive value greater than that of the bit line of the selected cell. Methods for reading, writing and erasing cells using certain voltage levels are disclosed.
Abstract:
A circuit for detecting a reduction below a threshold value in a supply voltage provided to storage devices integrated into a semiconductor. A comparator is coupled between a voltage supply line and a signal ground and has a first or reference input and a second or test-signal input. A generator of a stable voltage reference has an output coupled to the first input and a divider of the supply voltage coupled to the second input of the comparator. A circuit means is arranged to feed the voltage supply line with the higher of the supply voltage and a programming voltage also provided to the storage devices.
Abstract:
A double-row address decoding and selection circuitry for an electrically erasable and programmable non-volatile memory device with redundancy comprises a plurality of identical circuit blocks supplied with address signals and each one generating a respective selection signal which is activated by a particular logic configuration of said address signals for the selection of a particular row of the matrix; each one of said circuit blocks also generates a carry-out signal which is supplied to a carry-in input of a following circuit block and is activated when the respective selection signal is activated; a first circuit block of said plurality of circuit blocks has the respective carry-in input connected to a reference voltage; each of said circuit blocks is also supplied with a control signal, which is activated by a control circuitry of the memory device when, during a preprogramming operation preceding an electrical erasure of the memory device, a defective row is addressed, to enable the activation of the respective selection signal if the carry-out signal supplying the respective carry-in input is activated, so that two adjacent rows can be simultaneously selected.
Abstract:
A BiCMOS capacitive charge pump circuit for low supply voltage has a bipolar part, functionally reproducing a basic charge pump circuit and a CMOS part that comprises MOS transistors functionally connected in parallel with the driving switch toward ground potential of the charge transfer capacitance and in parallel with the output diode for substantially nullifying voltage drops on the respective bipolar components. A special driving circuit (T8, R2, I2), powered at the boosted output voltage (VOUT) responds to the rise of the voltage on the output node above a minimum level, as ensured by the bipolar part of the charge pump circuit, to drive said MOS transistors (M1, M2), thus allowing the output voltage to reach a level that is substantially double the supply voltage (Vs), even when the latter is exceptionally low, for reliably ensuring switching of the CMOS part of the circuit.
Abstract:
The filter comprises at least one completely differential operational amplifier having two inputs and two outputs and at least one pair of feedback circuits connecting said outputs with respective inputs of said amplifier outside of same. The operational amplifier has no common-mode feedback circuit, whose functions are performed by said feedback circuits external to the amplifier.
Abstract:
A circuit for controlled discharge of energy stored in an inductive load, comprising an active semiconductor device (T) connected serially with the inductive load (L) between first and second terminals of a voltage supply source and having a control terminal for connection to a driver circuit (C), and a control circuit (R1, R2, COMP) connected between the inductive load and said control terminal. The control circuit comprises a voltage divider (R1, R2) connected between the inductive load (L) and the first terminal of the voltage supply source, and a comparator (COMP) having first and second input terminals respectively connected to the voltage divider and to a voltage reference and an output terminal which is coupled to the control terminal of the active element (T).
Abstract:
A high-resolution digital filter including a memory structure receiving as input a sampled digital signal, and an adder chain with delay blocks connected between the adder chain and the memory structure. The adders are connected to memory outputs to convert the input signal into an output signal having predetermined frequency response characteristics. The memory structure includes at least one pair of non-volatile memory elements, each memory element being input one portion only of the sampled signal.