公开(公告)号：US20140117999A1

公开(公告)日：2014-05-01

申请号：US14125145

申请日：2012-06-05

申请人： Toshiyuki Shigemura ,  Shigenori Matsuo ,  Hiroyuki Yamashita ,  Hiroshi Date

发明人： Toshiyuki Shigemura ,  Shigenori Matsuo ,  Hiroyuki Yamashita ,  Hiroshi Date

IPC分类号： G01R31/26

CPC分类号： H02S50/10 ,  G01R31/11

摘要： A fault diagnosis method utilizing a fault diagnosis system for diagnosing a photovoltaic module by estimating a fault location, the fault diagnosis system including a signal generator for generating and inputting an input signal into a positive terminal or a negative terminal of the photovoltaic module, a waveform observer for observing a reflected output signal from an open end or the fault location, a diagnosis unit for estimating the fault location based on the output signal, a conductive body, and an alignment unit for controlling the positions of the conductive body and/or the photovoltaic module. The diagnosis method includes controlling the positions of the conductive body and/or the photovoltaic module, observing the output signal of the input signal, and estimating the fault location based on two reflected output signals of input signals inputted into the positive terminal and the negative terminal of the photovoltaic module.

摘要翻译： 一种利用故障诊断系统通过估计故障位置诊断光伏模块的故障诊断方法，所述故障诊断系统包括用于产生并输入到所述光伏模块的正极端子或负极端子的输入信号的信号发生器，波形 用于观察来自开放端或故障位置的反射输出信号的观测器，用于基于输出信号估计故障位置的诊断单元，导电体和用于控制导电体和/或 光伏组件。 诊断方法包括控制导电体和/或光伏模块的位置，观察输入信号的输出信号，并且基于输入到正极端子和负极端子的输入信号的两个反射输出信号来估计故障位置 的光伏组件。

公开(公告)号：US08593625B2

公开(公告)日：2013-11-26

申请号：US13202717

申请日：2009-11-19

申请人： Kazumasa Tanaka ,  Hiroyuki Yamashita

发明人： Kazumasa Tanaka ,  Hiroyuki Yamashita

IPC分类号： G01N21/00

CPC分类号： G01N21/00 ,  G01N21/9501 ,  G01N21/95607

摘要： When examination at a scan speed equal to or higher than the line rate of the sensor such as a TDI sensor is carried out, the line rate of the TDI sensor is asynchronous with the scan speed, and the image is blurred. Therefore, a TDI sensor cannot be used at a scan speed equal to or higher than the line rate of the TDI sensor. This problem has not been considered. To solve the problem, high-speed examination irrespective of the line rate of the TDI sensor is enabled. To control the line rate of the TDI sensor and stage scan speed asynchronously and to solve the problem of the image addition variation due to the charge accumulation of the TDI sensor, the object to be examined is irradiated with thin-line illumination, and only a given pixel line of the TDI sensor is made to receive light scattered by the object to be examined. The aspect ratio of the detection pixel size can be controlled by the speed ratio between the line rate of the TDI sensor and the stage scan speed.

摘要翻译： 当扫描速度等于或高于诸如TDI传感器的传感器的线路速率进行检查时，TDI传感器的线路速率与扫描速度异步，图像模糊。 因此，TDI传感器不能以等于或高于TDI传感器的线路速率的扫描速度使用。 这个问题还没有被考虑。 为了解决这个问题，无论TDI传感器的线路速率如何，都可以进行高速检查。 为了异步地控制TDI传感器的线路速率和级扫描速度，并且为了解决由于TDI传感器的电荷累积引起的图像增加变化的问题，用细线照明照射被检查对象，只有 使TDI传感器的给定像素线接收被被检体散射的光。 检测像素尺寸的宽高比可以通过TDI传感器的线路速率与平台扫描速度之间的速度比来控制。

公开(公告)号：US20130243587A1

公开(公告)日：2013-09-19

申请号：US13989842

申请日：2011-12-06

申请人： Hiroyuki Yamashita ,  Hiroharu Oyama ,  Takashi Maruyama ,  Yuki Yamamoto ,  Shohei Danno

发明人： Hiroyuki Yamashita ,  Hiroharu Oyama ,  Takashi Maruyama ,  Yuki Yamamoto ,  Shohei Danno

IPC分类号： F01D25/00

CPC分类号： F01D25/00 ,  F01D5/16 ,  F01D9/041 ,  F01D25/06 ,  F05D2300/501

摘要： The invention includes vane members that have a space formed therein and a plate spring member that is disposed inside the space of the vane members and elastically contacts inner surfaces of the vane members. The plate spring member includes a positioning portion, an elastic contact portion, and a connection portion. The elastic contact portion is divided into plural numbers in the length direction of the vane members. As a result, in the invention, the elastic contact portion elastically contacts the inner surfaces of the vane members without any partial contact throughout the entire surface thereof. Accordingly, the elastic contact area between the elastic contact portion and the inner surfaces of the vane members is widened, so that self-excited vibration generated in a turbine vane may be reliably suppressed.

摘要翻译： 本发明包括在其中形成有空间的叶片构件和设置在叶片构件的空间内并弹性地接触叶片构件的内表面的板簧构件。 板簧构件包括定位部，弹性接触部和连接部。 弹性接触部分在叶片构件的长度方向上分成多个。 结果，在本发明中，弹性接触部分在叶片构件的内表面弹性地接触，而在其整个表面上没有任何部分接触。 因此，弹性接触部与叶片构件的内表面之间的弹性接触面积变宽，能够可靠地抑制在涡轮叶片中产生的自激振动。

公开(公告)号：US08525984B2

公开(公告)日：2013-09-03

申请号：US13469071

申请日：2012-05-10

申请人： Hiroyuki Yamashita ,  Yukihisa Mohara ,  Eiji Imai

发明人： Hiroyuki Yamashita ,  Yukihisa Mohara ,  Eiji Imai

IPC分类号： G01N21/00

CPC分类号： H01L21/67288 ,  G01N21/94 ,  G01N21/9501 ,  G01N21/9503 ,  G01N21/95607 ,  G01N2021/95615

摘要： An inspection apparatus includes a wafer stage for carrying a wafer, an illumination module which irradiates an inspection beam on the wafer carried on the wafer stage, a detection module which detects scattering rays or reflection rays from the wafer on the wafer stage and outputs an image signal, a coordinates control module which stores information about the arrangement of individual inspection areas on the wafer, and an imperfect area recognition module which recognizes, on the basis of the inspection area arrangement information stored in the coordinates control module, an imperfect inspection area interfering with a wafer edge.

摘要翻译： 检查装置包括用于承载晶片的晶片台，在晶片载物台上承载的晶片上照射检查光束的照明模块，检测来自晶片台上的晶片的散射光线或反射光线的检测模块，并输出图像 信号，存储关于晶片上的各个检查区域的布置的信息的坐标控制模块，以及不完备区域识别模块，其基于存储在坐标控制模块中的检查区域布置信息识别出不完美的检查区域干扰 具有晶片边缘。

公开(公告)号：US20130175260A1

公开(公告)日：2013-07-11

申请号：US13808416

申请日：2011-06-08

申请人： Masao Saiki ,  Hiroyuki Yamashita ,  Yosihide Oti

发明人： Masao Saiki ,  Hiroyuki Yamashita ,  Yosihide Oti

IPC分类号： H05B6/40 ,  H05B6/36 ,  C21D1/10

CPC分类号： H05B6/40 ,  C21D1/10 ,  C21D1/42 ,  C21D1/667 ,  C21D9/085 ,  C21D9/32 ,  C21D9/40 ,  H05B6/101 ,  H05B6/362 ,  Y02P10/253

摘要： A high frequency heating coil is provided in which a main body part of a workpiece is surrounded by a loop part of the high frequency heating coil and subjected to high frequency heating, and a flange part of the workpiece is sandwiched by first and second lead-out parts of the high frequency heating coil and subjected to high frequency heating. The first and second lead-out parts oppose the flange part and are offset in the axial direction of the workpiece, thereby preventing eddy currents in opposite directions to each other from being generated in the flange part and preventing the flange part from being more difficult to heat than the main body part. The high frequency heating coil can uniformly heat a pipe-shaped workpiece having a flange part projecting radially outward from an outer peripheral face of a main body part.

摘要翻译： 提供了一种高频加热线圈，其中工件的主体部分被高频加热线圈的环形部分包围并进行高频加热，并且工件的凸缘部分被第一和第二引出线夹持， 外加部分高频加热线圈并进行高频加热。 第一和第二引出部分相对于凸缘部分并在工件的轴向方向上偏移，从而防止在凸缘部分中产生彼此相反方向的涡流，并且防止凸缘部分更难以 热量比主体部分。 高频加热线圈可以均匀地加热具有从主体部的外周面径向向外突出的凸缘部的管状工件。

公开(公告)号：US20100181686A1

公开(公告)日：2010-07-22

申请号：US11887235

申请日：2007-05-15

申请人： Mitsuo Sugino ,  Satoru Katsurayama ,  Hiroyuki Yamashita

发明人： Mitsuo Sugino ,  Satoru Katsurayama ,  Hiroyuki Yamashita

IPC分类号： H01L23/538 ,  H01L23/28

CPC分类号： H01L23/145 ,  H01L23/3735 ,  H01L23/3737 ,  H01L24/45 ,  H01L24/48 ,  H01L24/73 ,  H01L25/105 ,  H01L2224/16225 ,  H01L2224/32145 ,  H01L2224/32225 ,  H01L2224/45139 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/73203 ,  H01L2224/73204 ,  H01L2224/73265 ,  H01L2225/1023 ,  H01L2225/1058 ,  H01L2924/00011 ,  H01L2924/00014 ,  H01L2924/01019 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/12042 ,  H01L2924/15311 ,  H01L2924/15331 ,  H01L2924/181 ,  H01L2924/30107 ,  H01L2924/3511 ,  H01L2924/00012 ,  H01L2924/00 ,  H01L2224/45099 ,  H01L2924/01049

摘要： A semiconductor device 1 is equipped with a first substrate 3 on which a first semiconductor chip 2 is mounted, a second substrate 5 on which a second semiconductor chip 4 is mounted, and connecting sections 6 that electrically connect the first substrate 3 and the second substrate 5. The first substrate 3 has build-up layers 31A and 31B in each of which an insulating layer 311 containing a resin and conductor interconnect layers 312 and 313 are laminated alternately, and the respective conductor interconnect layers 312 are connected by a conductive layer 314 provided in via holes of the insulating layers 311. The second substrate 5 also has build-up layers 31A and 31B. In the insulating layers 311 of the build-up layers in at least one substrate of the first substrate 3 and the second substrate 5, the average coefficient of thermal expansion of at least one insulating layer along the substrate inplane direction at from 25 degrees centigrade to the glass transition point is 35 ppm/degrees centigrade or less, and the average coefficient of thermal expansion along the substrate thickness direction is 35 ppm/degrees centigrade or less.

摘要翻译： 半导体器件1配备有安装有第一半导体芯片2的第一基板3，安装有第二半导体芯片4的第二基板5和将第一基板3与第二基板电连接的连接部6 第一基板3具有堆积层31A和31B，每个层叠有包含树脂和导体互连层312和313的绝缘层311交替层叠，并且各个导体互连层312通过导电层314连接 设置在绝缘层311的通孔中。第二基板5还具有堆积层31A和31B。 在第一基板3和第二基板5的至少一个基板中的堆积层的绝缘层311中，沿着基板面内方向的至少一个绝缘层的平均热膨胀系数在25摄氏度到 玻璃化转变温度为35ppm /摄氏度以下，沿着基板厚度方向的平均热膨胀系数为35ppm /摄氏度以下。

公开(公告)号：US07672799B2

公开(公告)日：2010-03-02

申请号：US11846829

申请日：2007-08-29

申请人： Kei Shimura ,  Minori Noguchi ,  Masaaki Ito ,  Kenji Aiko ,  Shuichi Chikamatsu ,  Shigeo Otsuki ,  Shigeru Abe ,  Masayuki Ochi ,  Takuaki Sekiguchi ,  Hiroyuki Yamashita

发明人： Kei Shimura ,  Minori Noguchi ,  Masaaki Ito ,  Kenji Aiko ,  Shuichi Chikamatsu ,  Shigeo Otsuki ,  Shigeru Abe ,  Masayuki Ochi ,  Takuaki Sekiguchi ,  Hiroyuki Yamashita

IPC分类号： G06F19/00 ,  G01N21/00

CPC分类号： G01N21/9501 ,  G01N21/94 ,  G01N21/95607 ,  G01N21/95623 ,  G06K9/2036 ,  G06K2209/19 ,  G06T7/0006 ,  G06T2207/30148

摘要： A defect inspection apparatus includes: stages each mounting an inspecting object on which a circuit pattern having a group of parallel lines is formed, and each running perpendicular or parallel to the group of lines; an illumination optical system which illuminating a surface of the inspecting object with a slit beam being slit light so that a longitudinal direction of the slit beam is substantially perpendicular to the running directions of the stages, and which has a first inclined angle formed by the direction of the group of lines and a projection line, of an optical axis of the slit beam, to the inspecting object; a spatial filter that shields or transmits reflected and scattered light of the inspecting object according to a difference in distribution of orientation; and a detection optical system that detects the reflected and scattered light transmitted through the spatial filter by image sensors. Moreover, the illumination optical system illuminates the inspecting object with another slit beam from a direction opposite to an incident direction of the slit beam on a plane.

摘要翻译： 缺陷检查装置包括：各自安装检查对象的阶段，在其上形成具有一组平行线的电路图案，并且每个行与该组线垂直或平行; 照明光学系统，其利用狭缝光照射被检查物体的表面，使得狭缝光束的纵向方向基本上垂直于台阶的行进方向，并且具有由方向形成的第一倾斜角 并且将所述狭缝光束的光轴的投影线和所述检查对象的投影线， 空间滤波器，根据取向分布的差异来屏蔽或发射检测对象的反射和散射光; 以及检测光学系统，其通过图像传感器检测透过空间滤波器的反射和散射光。 此外，照明光学系统在与平面上的狭缝光束的入射方向相反的方向上用另一个狭缝光照射检查对象。

公开(公告)号：US20090328026A1

公开(公告)日：2009-12-31

申请号：US12556168

申请日：2009-09-09

申请人： Hiroyuki Yamashita ,  Takahiro Fujino

发明人： Hiroyuki Yamashita ,  Takahiro Fujino

IPC分类号： G06F9/44

CPC分类号： G06F8/65

摘要： A version table (11a) recording therein information indicative of an execution program (22a) and version number information indicative of a version number of a version of the updatable execution program (22a) in association with each other is provided in a central device (1). In a terminal device (2), an instruction accepted for the execution program (22a) is detected, the version number of the version of the execution program (22a) as the target of the instruction is detected, the version number indicated by the version number information of the execution program (22a) is read from the version table (11a), and the execution program (22a) is updated when it is determined that the detected version number and the read version number are different from each other.

摘要翻译： 在其中记录指示执行程序的信息的版本表（11a）和表示可更新执行程序（22a）的版本的版本号的版本号信息彼此相关联地设置在中央设备（1）中 ）。 在终端装置（2）中，检测到执行程序（22a）接受的指令，检测作为指示对象的执行程序（22a）的版本号，版本号 从版本表（11a）读取执行程序（22a）的号码信息，并且当确定检测到的版本号和读取版本号彼此不同时，执行程序（22a）被更新。

公开(公告)号：US07555195B2

公开(公告)日：2009-06-30

申请号：US10414988

申请日：2003-04-16

申请人： Hiroyuki Yamashita ,  Hiroshi Fujii ,  Hideki Sakamoto ,  Takao Nakamura

发明人： Hiroyuki Yamashita ,  Hiroshi Fujii ,  Hideki Sakamoto ,  Takao Nakamura

IPC分类号： H04N9/79 ,  H04N5/00

CPC分类号： H04N21/44012 ,  G06F17/30017 ,  G06Q20/1235 ,  H04N7/163 ,  H04N21/2543 ,  H04N21/458 ,  H04N21/4622 ,  H04N21/8352 ,  H04N21/84

摘要： Content data and metadata are obtained and reproduced, and combination interface information defining information necessary for executing combination operation on the contents is generated. The combination operation on the contents is controlled by following combination data definition based on the combination interface information and, as necessary, by using external input information entered from an external unit. The combination feedback information for controlling the reproduction operation of the contents and metadata is generated, and the reproduction operation on the contents is controlled based on the combination feedback information.

摘要翻译： 获取并再现内容数据和元数据，并且生成用于对内容执行组合操作所必需的定义信息的组合接口信息。 内容的组合操作通过以下组合数据定义为基础，根据组合界面信息，根据需要，通过使用从外部单元输入的外部输入信息进行控制。 产生用于控制内容和元数据的再现操作的组合反馈信息，并且基于组合反馈信息来控制关于内容的再现操作。

公开(公告)号：US07553797B2

公开(公告)日：2009-06-30

申请号：US11172712

申请日：2005-07-01

申请人： Kaori Ono ,  Takatugu Suzuki ,  Kazuya Yoshida ,  Hiroyuki Yamashita

发明人： Kaori Ono ,  Takatugu Suzuki ,  Kazuya Yoshida ,  Hiroyuki Yamashita

IPC分类号： B41M5/035 ,  B41M5/50

CPC分类号： B41M5/3854 ,  B41M5/39

摘要： A thermal transfer recording material contains at least one colorant represented by the following general formula (I): wherein R1 represents a trifluoromethyl, alkyl, aryl, alkoxy, alkoxycarbonyl, acyl, acyloxy, amide, carbamoyl, amino, or cyano group; R2 represents alkyl, acyl, carbamoyl, or alkoxycarbonyl group; R3 represents alkyl, alkenyl or aryl group; a total number of carbon atoms in R1 and R2 is 3 or more; X represents —CR4R5—, —S—, —O— or —NR6—; R4 and R5 respectively represent hydrogen, halogen, or a substituent; R6 represents hydrogen or a substituent; and Y represents an atom group required for forming a 5- to 6-memberd ring.

摘要翻译： 热转印记录材料含有至少一种由以下通式（I）表示的着色剂：其中R1表示三氟甲基，烷基，芳基，烷氧基，烷氧基羰基，酰基，酰氧基，酰胺，氨基甲酰基，氨基或氰基。 R 2表示烷基，酰基，氨基甲酰基或烷氧基羰基; R3表示烷基，烯基或芳基; R1和R2中的碳原子总数为3以上; X表示-CR4R5-，-S-，-O-或-NR6-; R4和R5分别表示氢，卤素或取代基; R6表示氢或取代基; Y表示形成5-6元环所需的原子团。