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公开(公告)号:US20190164881A1
公开(公告)日:2019-05-30
申请号:US16264195
申请日:2019-01-31
Applicant: INTEL CORPORATION
Inventor: Mathew J. MANUSHAROW , Dustin P. WOOD , Debendra MALLIK
IPC: H01L23/50 , H01L23/00 , H01L23/522 , G06F17/50 , H01L23/528
CPC classification number: H01L23/50 , G06F17/5068 , H01L23/5226 , H01L23/525 , H01L23/5283 , H01L23/5286 , H01L24/02 , H01L24/06 , H01L24/13 , H01L24/14 , H01L24/16 , H01L24/32 , H01L24/48 , H01L24/73 , H01L24/81 , H01L2224/02311 , H01L2224/02373 , H01L2224/02375 , H01L2224/02381 , H01L2224/0401 , H01L2224/131 , H01L2224/14133 , H01L2224/16227 , H01L2224/32225 , H01L2224/48227 , H01L2224/73204 , H01L2224/81191 , H01L2924/10252 , H01L2924/10253 , H01L2924/10329 , H01L2924/10335 , H01L2924/14 , H01L2924/1431 , H01L2924/1433 , H01L2924/1434 , H01L2924/15311 , H01L2924/15313 , H01L2924/157 , H01L2924/15787 , H01L2924/15788 , H01L2924/1579 , H01L2924/014 , H01L2924/00014 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
Abstract: Embodiments of the present disclosure are directed towards techniques and configurations for designing and assembling a die capable of being adapted to a number of different packaging configurations. In one embodiment an integrated circuit (IC) die may include a semiconductor substrate. The die may also include an electrically insulative material disposed on the semiconductor substrate; a plurality of electrical routing features disposed in the electrically insulative material to route electrical signals through the electrically insulative material; and a plurality of metal features disposed in a surface of the electrically insulative material. In embodiments, the plurality of metal features may be electrically coupled with the plurality of electrical routing features. In addition, the plurality of metal features may have an input/output (I/O) density designed to enable the die to be integrated with a plurality of different package configurations. Other embodiments may be described and/or claimed.
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公开(公告)号:US20180083569A1
公开(公告)日:2018-03-22
申请号:US15270787
申请日:2016-09-20
Applicant: Intel Corporation
Inventor: Joshua HEPPNER , Debendra MALLIK
CPC classification number: H02S30/20 , H02J7/355 , H02S40/36 , H02S40/38 , H05K1/028 , H05K1/181 , H05K2201/10143
Abstract: A solar cell assembly includes a bendable substrate and multiple solar cells to be mounted over different surfaces of an electronic device. The bendable substrate includes an electrical contact to couple to an electrical contact on one of the surfaces of the electronic device. Thus, the electronic device only needs an electrical connection on one surface, and the solar cell assembly can mount solar cells on multiple surfaces to couple to the one electrical connection.
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公开(公告)号:US20250096009A1
公开(公告)日:2025-03-20
申请号:US18961031
申请日:2024-11-26
Applicant: Intel Corporation
Inventor: Omkar G. KARHADE , Nitin A. DESHPANDE , Debendra MALLIK , Bassam M. ZIADEH , Yoshihiro TOMITA
Abstract: Embodiments of the invention include device packages and methods of forming such packages. In an embodiment, the method of forming a device package may comprise forming a reinforcement layer over a substrate. One or more openings may be formed through the reinforcement layer. In an embodiment, a device die may be placed into one of the openings. The device die may be bonded to the substrate by reflowing one or more solder bumps positioned between the device die and the substrate. Embodiments of the invention may include a molded reinforcement layer. Alternative embodiments include a reinforcement layer that is adhered to the surface of the substrate with an adhesive layer.
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公开(公告)号:US20250087548A1
公开(公告)日:2025-03-13
申请号:US18955613
申请日:2024-11-21
Applicant: Intel Corporation
Inventor: Debendra MALLIK , Ravindranath MAHAJAN , Digvijay RAORANE
IPC: H01L23/367 , H01L21/48 , H01L21/56 , H01L23/00 , H01L23/31 , H01L23/495 , H01L23/538
Abstract: A multi-chip unit suitable for chip-level packaging may include multiple IC chips that are interconnected through a metal redistribution structure, and that are directly bonded to an integrated heat spreader. Bonding of the integrated heat spreader to the multiple IC chips may be direct so that no thermal interface material (TIM) is needed, resulting in a reduced bond line thickness (BLT) and lower thermal resistance. The integrated heat spreader may further serve as a structural member of the multi-chip unit, allowing a second side of the redistribution structure to be further interconnected to a host by solder interconnects. The redistribution structure may be fabricated on a sacrificial interposer that may facilitate planarizing IC chips of differing thickness prior to bonding the heat spreader. The sacrificial interposer may be removed to expose the RDL for further interconnection to a substrate without the use of through-substrate vias.
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公开(公告)号:US20240234225A1
公开(公告)日:2024-07-11
申请号:US18611534
申请日:2024-03-20
Applicant: Intel Corporation
Inventor: Srinivas PIETAMBARAM , Robert L. SANKMAN , Rahul MANEPALLI , Gang DUAN , Debendra MALLIK
IPC: H01L23/15 , H01L23/31 , H01L23/495 , H01L23/498 , H01L23/538
CPC classification number: H01L23/15 , H01L23/3121 , H01L23/49503 , H01L23/49827 , H01L23/5381
Abstract: Embodiments disclosed herein include electronic packages and methods of forming such packages. In an embodiment, the electronic package comprises a glass substrate, with a plurality of first pads on a first surface of the glass substrate, a plurality of second pads on a second surface of the glass substrate that is opposite from the first surface, a plurality of through glass vias (TGVs), wherein each TGV electrically couples a first pad to a second pad, wherein the plurality of first pads have a first pitch, and wherein the plurality of second pads have a second pitch that is greater than the first pitch, a bridge substrate over the glass substrate, a first die electrically coupled to first pads and the bridge substrate, and a second die electrically coupled to first pads and the bridge substrate, wherein the bridge substrate electrically couples the first die to the second die.
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公开(公告)号:US20240038687A1
公开(公告)日:2024-02-01
申请号:US18380022
申请日:2023-10-13
Applicant: Intel Corporation
Inventor: Debendra MALLIK , Ravindranath MAHAJAN , Robert SANKMAN , Shawna LIFF , Srinivas PIETAMBARAM , Bharat PENMECHA
IPC: H01L23/00 , H01L21/48 , H01L21/56 , H01L23/31 , H01L23/538
CPC classification number: H01L23/562 , H01L21/4853 , H01L21/4857 , H01L21/486 , H01L21/565 , H01L21/568 , H01L23/3128 , H01L23/5381 , H01L23/5384 , H01L23/5385 , H01L23/5386 , H01L24/16 , H01L2224/16227 , H01L2924/3511
Abstract: Embodiments disclosed herein include electronic packages and methods of fabricating electronic packages. In an embodiment, an electronic package comprises an interposer, where a cavity passes through the interposer, and a nested component in the cavity. In an embodiment, the electronic package further comprises a die coupled to the interposer by a first interconnect and coupled to the nested component by a second interconnect. In an embodiment, the first and second interconnects comprise a first bump, a bump pad over the first bump, and a second bump over the bump pad.
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公开(公告)号:US20230260914A1
公开(公告)日:2023-08-17
申请号:US18139275
申请日:2023-04-25
Applicant: Intel Corporation
Inventor: Sanka GANESAN , Kevin MCCARTHY , Leigh M. TRIBOLET , Debendra MALLIK , Ravindranath V. MAHAJAN , Robert L. SANKMAN
IPC: H01L23/538 , H01L21/48 , H01L21/56 , H01L21/683 , H01L23/31 , H01L23/367 , H01L23/498 , H01L23/00 , H01L25/065 , H01L25/00
CPC classification number: H01L23/5381 , H01L21/4853 , H01L21/486 , H01L21/561 , H01L21/568 , H01L21/6835 , H01L23/3128 , H01L23/3675 , H01L23/49816 , H01L23/5384 , H01L23/5386 , H01L24/16 , H01L24/17 , H01L24/32 , H01L24/73 , H01L24/97 , H01L25/0655 , H01L25/50 , H01L2221/68345 , H01L2221/68359 , H01L2224/16227 , H01L2224/16238 , H01L2224/1703 , H01L2224/32225 , H01L2224/73204
Abstract: Embodiments include semiconductor packages and methods to form the semiconductor packages. A semiconductor package includes a bridge over a glass patch. The bridge is coupled to the glass patch with an adhesive layer. The semiconductor package also includes a high-density packaging (HDP) substrate over the bridge and the glass patch. The HDP substrate is conductively coupled to the glass patch with a plurality of through mold vias (TMVs). The semiconductor package further includes a plurality of dies over the HDP substrate, and a first encapsulation layer over the TMVs, the bridge, the adhesive layer, and the glass patch. The HDP substrate includes a plurality of conductive interconnects that conductively couple the dies to the bridge and glass patch. The bridge may be an embedded multi-die interconnect bridge (EMIB), where the EMIB is communicatively coupled to the dies, and the glass patch includes a plurality of through glass vias (TGVs).
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公开(公告)号:US20230197636A1
公开(公告)日:2023-06-22
申请号:US18112431
申请日:2023-02-21
Applicant: Intel Corporation
Inventor: Debendra MALLIK , Digvijay A. RAORANE
CPC classification number: H01L23/562 , H01L23/16 , H01L23/3121 , H01L25/0657 , H01L25/16 , H01L25/50 , H01L2225/06513 , H01L2225/06555 , H01L2225/06582
Abstract: An electronic package technology is disclosed. A first active die can be mountable to and electrically coupleable to a package substrate. A second active die can be disposed on a top side of the first active die, the second active die being electrically coupleable to one or both of the first active die and the package substrate. At least one open space can be available on the top side of the first active die. At least a portion of a stiffener can substantially fill the at least one open space available on the top side of the first active die.
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公开(公告)号:US20230138543A1
公开(公告)日:2023-05-04
申请号:US18091982
申请日:2022-12-30
Applicant: Intel Corporation
Inventor: Debendra MALLIK , Robert L. SANKMAN , Robert NICKERSON , Mitul MODI , Sanka GANESAN , Rajasekaran SWAMINATHAN , Omkar KARHADE , Shawna M. LIFF , Amruthavalli ALUR , Sri Chaitra J. CHAVALI
IPC: H01L23/498 , H01L23/31 , H01L23/538 , H01L23/00
Abstract: Ultra-thin, hyper-density semiconductor packages and techniques of forming such packages are described. An exemplary semiconductor package is formed with one or more of: (i) metal pillars having an ultra-fine pitch (e.g., a pitch that is greater than or equal to 150 μm, etc.); (ii) a large die-to-package ratio (e.g., a ratio that is equal to or greater than 0.85, etc.); and (iii) a thin pitch translation interposer. Another exemplary semiconductor package is formed using coreless substrate technology, die back metallization, and low temperature solder technology for ball grid array (BGA) metallurgy. Other embodiments are described.
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公开(公告)号:US20230133429A1
公开(公告)日:2023-05-04
申请号:US18089535
申请日:2022-12-27
Applicant: Intel Corporation
Inventor: Ravindranath MAHAJAN , Debendra MALLIK , Sujit SHARAN , Digvijay RAORANE
IPC: H01L23/48 , H01L21/56 , H01L21/768 , H01L23/31 , H01L23/34 , H01L23/538 , H01L23/00 , H01L25/18
Abstract: Embodiments disclosed herein include electronic packages and methods of forming such electronic packages. In an embodiment, the electronic package comprises a base substrate. The base substrate may have a plurality of through substrate vias. In an embodiment, a first die is over the base substrate. In an embodiment a first cavity is disposed into the base substrate. In an embodiment, the first cavity is at least partially within a footprint of the first die. In an embodiment, a first component is in the first cavity.
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