摘要:
An array of transistor memory cells of a type in which each cell has a transistor, a ground select switch and a sense amplifier coupling switch. A bias voltage line on which there is established a voltage V.sub.BIAS is coupled to each bit line by a bit line transistor whose gate during a read mode is at least about a voltage V.sub.T above V.sub.BIAS. Similarly, the source of each transistor is coupled to the bias voltage line by a source line transistor whose gate is more than about a voltage V.sub.T about V.sub.BIAS. The foregoing arrangement ensures that for every non-selected transistor that transistor's source voltage will be equal to its drain voltage so that all non-selected transistors will be substantially non-conducting.
摘要:
Circuits, integrated circuits, and methods are disclosed for bimodal disable circuits. In one such example method, a counter is maintained, with the counter indicating a logic level at which an output signal will be disabled during at least a portion of one of a plurality of disable cycles. The logic level indicated by the counter is transitioned. An input signal is provided as the output signal responsive to the enable signal indicating that the output signal is to be enabled, and the output signal is disabled at the logic level indicated by the counter responsive to the enable signal indicating that the output signal is to be disabled.
摘要:
Various embodiments include apparatus, methods, and systems that operate to extend the processes of reading, modifying, and writing data stored in or being provided to a memory array without interrupting a continual stream of data to be written into the memory array. Embodiments may include an apparatus comprising a memory array, and an error code module coupled to the memory array with a data buffer having a plurality of data burst registers operable to receive a plurality of data bursts to be written to the memory array on a corresponding plurality of consecutive clock cycles. The error code module is operable to perform a read/modify/write process on each of the plurality of data bursts within a time period no longer than a period of two consecutive cycles of the plurality of consecutive clock cycles.
摘要:
An asynchronous address interface circuit and method for converting unrestricted randomly scheduled address transitions of memory address signals into scheduled address events from which initiation of a sequence of memory access events can be based. The address interface circuit initiates a delay sequence based on a address transition detection pulse. In the event a new address transition detection pulse is received prior to completion of the delay sequence, the delay sequence is reset and restarted based on the new address transition detection pulse. The sequence of memory access events is initiated in response to the completion of the delay sequence.
摘要:
A test circuit for determining whether or not fuse-links of an integrated circuit have been opened or closed properly by, for example, a laser device. The test circuit of this invention, in one embodiment, includes a variable impedance, such as a P-channel transistor, connected between a voltage source and an output terminal, the impedance having one value with a first input applied to the variable impedance control terminal and having a second, larger value in response to a second input applied to the variable impedance control terminal. At least one programmable fuse-link and a gate are connected in series between the output terminal and a source of reference potential. A means for providing control inputs to the variable impedance is connected between a test mode input signal and the control terminal of the variable impedance. The means for providing control inputs to the P-channel transistor may include a second, current-mirror-connected P-channel transistor.
摘要:
Apparatus for verifying the state of a plurality of electrically programmable memory cells (30-70) includes first and second memory cells (36, 38) each having current paths with first and second ends. A memory cell state sense node (BL2) is coupled to the first ends. A first array source node (82) is coupled to a second end of the current path of the first cell (36). A second array source node (84) is coupled to a second end of the current path of the second cell (38). First circuitry (160-198) is provided for sensing a program verify state (DATA, WE). Decoded ground circuitry (150, 144, 142) couples a selected one of the first and second array source nodes (140) to a low voltage source (Vss) in response to the first circuitry sensing a program verify state (DATA, WE). Second circuitry (130, 138, 134) selectively isolates at least a nonselected one of the first and second array source nodes (82, 84) from the voltage bias source in response to the first circuitry (160-198 ) sensing a program verify state (DATA, WE).
摘要:
Resistors are used as controlling devices to control the rate at which output buffer transistors are turned OFF and ON to control transient noise. In one form the output buffer circuit comprises a NOR circuit having a first input coupled to a data input and a second input to an enable input, a NAND circuit having a first input coupled to the data input and a second input coupled to an enable input, a first inverter transistor pair having gates coupled to the output of the NOR circuit and having source-drain paths in series coupled to a reference, a second inverter transistor pair having gates coupled to the output of the NAND circuit and having source-drain paths coupled in series to a supply, a resistor coupled between in series between the source-drain paths of the first transistor pair and the supply, a resistor coupled in series between the second transistor pair and the reference, and a third inverter transistor pair with each gate of the third transistor pair coupled to one of the outputs of the first and second inverter transistor pairs and with the output of the third transistor pair coupled to the output of the buffer circuit.
摘要:
The memory array circuit this invention provides connection of segmented bitlines to bitline decoding circuitry while, at the same time, providing connection of combined wordlines wordline decoding circuitry. The segmentation and decoding connections permit faster speed of operation with minimal or no area penalty. The area penalty is avoided by driving common wordlines in each of the segments, effectively increasing the wordline pitch at the wordline decoder, while at the same time decreasing the number of wordline decodes required. The segmentation also permits location of the decoder circuit away from the signal and routing decode outputs.
摘要:
A driver circuit for applying both read and program voltages to a wordline of an integrated-circuit memory-cell logic array. The driver circuit is comprised of a series driver transistor pair, of a driver enabling means for enabling and disenabling one of the transistors of the driver transistor pair, and of a latching means. The driver transistor used during read operation may be constructed with a relatively short source-drain channel, permitting faster access speed during read operation of the circuit.
摘要:
A memory array having two separate sets of parallel bit lines, and a word line intersecting the sets of bit lines. The memory cells are floating-gate MOS transistors having gates coupled to associated ones of the word lines and source-to-drain paths connected between alternating ones of the sets of bit lines and ground lines.