Group III nitride semiconductor light emitting device
    41.
    发明授权
    Group III nitride semiconductor light emitting device 有权
    III族氮化物半导体发光器件

    公开(公告)号:US09231370B2

    公开(公告)日:2016-01-05

    申请号:US13453743

    申请日:2012-04-23

    摘要: A group III nitride semiconductor laser device includes a laser structure, an insulating layer, an electrode and dielectric multilayers. The laser structure includes a semiconductor region on a semi-polar primary surface of a hexagonal group III nitride semiconductor support base. The dielectric multilayers are on first and second end-faces for the laser cavity. The c-axis of the group III nitride tilts by an angle ALPHA from the normal axis of the primary surface in the waveguide axis direction from the first end-face to the second end-faces. A pad electrode has first to third portions provided on the first to third regions of the semiconductor regions, respectively. An ohmic electrode is in contact with the third region through an opening of the insulating layer. The first portion has a first arm, which extends to the first end-face edge. The third portion is away from the first end-face edge.

    摘要翻译: III族氮化物半导体激光器件包括激光器结构,绝缘层,电极和电介质多层。 激光器结构包括在六方晶III族氮化物半导体支撑基体的半极性主表面上的半导体区域。 电介质多层在激光腔的第一和第二端面上。 III族氮化物的c轴从第一端面到第二端面在波导轴线方向上从主面的法线倾斜角度ALPHA。 焊盘电极具有分别设置在半导体区域的第一至第三区域上的第一至第三部分。 欧姆电极通过绝缘层的开口与第三区域接触。 第一部分具有延伸到第一端面边缘的第一臂。 第三部分远离第一端面边缘。

    Nitride semiconductor laser and epitaxial substrate
    42.
    发明授权
    Nitride semiconductor laser and epitaxial substrate 有权
    氮化物半导体激光器和外延衬底

    公开(公告)号:US08718110B2

    公开(公告)日:2014-05-06

    申请号:US13366636

    申请日:2012-02-06

    IPC分类号: H01S5/00

    摘要: A nitride semiconductor laser includes an electrically conductive support substrate with a primary surface of a gallium nitride based semiconductor, an active layer provided above the primary surface, and a p-type cladding region provided above the primary surface. The primary surface is inclined relative to a reference plane perpendicular to a reference axis extending in a direction of the c-axis of the gallium nitride based semiconductor. The p-type cladding region includes first and second p-type Group III nitride semiconductor layers. The first p-type semiconductor layer comprises an InAlGaN layer including built-in anisotropic strain. The second p-type semiconductor layer comprises semiconductor different from material of the InAlGaN layer. The first nitride semiconductor layer is provided between the second p-type semiconductor layer and the active layer. The second p-type semiconductor layer has a resistivity lower than that of the first p-type semiconductor layer.

    摘要翻译: 氮化物半导体激光器包括具有氮化镓基半导体的主表面的导电支撑衬底,设置在主表面上方的有源层和设置在主表面上的p型覆层区域。 主表面相对于垂直于在氮化镓基半导体的c轴方向上延伸的参考轴的参考平面倾斜。 p型包层区域包括第一和第二p型III族氮化物半导体层。 第一p型半导体层包括包括内置各向异性应变的InAlGaN层。 第二p型半导体层包括与InAlGaN层的材料不同的半导体。 第一氮化物半导体层设置在第二p型半导体层和有源层之间。 第二p型半导体层的电阻率低于第一p型半导体层的电阻率。

    III-nitride semiconductor laser device and method for fabricating III-nitride semiconductor laser device
    44.
    发明授权
    III-nitride semiconductor laser device and method for fabricating III-nitride semiconductor laser device 有权
    III族氮化物半导体激光器件及其制造方法

    公开(公告)号:US08953656B2

    公开(公告)日:2015-02-10

    申请号:US13354053

    申请日:2012-01-19

    摘要: A Group III nitride semiconductor laser device includes a laser structure including a support substrate with a semipolar primary surface of a hexagonal Group III nitride semiconductor, and a semiconductor region thereon, and an electrode, provided on the semiconductor region, extending in a direction of a waveguide axis in the laser device. The c-axis of the nitride semiconductor is inclined at an angle ALPHA relative to a normal axis to the semipolar surface toward the waveguide axis direction. The laser structure includes first and second fractured faces intersecting with the waveguide axis. A laser cavity of the laser device includes the first and second fractured faces extending from edges of first and second faces. The first fractured face includes a step provided at an end face of an InGaN layer of the semiconductor region and extending in a direction from one side face to the other of the laser device.

    摘要翻译: III族氮化物半导体激光器件包括激光器结构,其包括具有六方晶III族氮化物半导体的半极性主表面的支撑衬底和其上的半导体区域,以及设置在半导体区域上的电极,沿着 波导轴在激光装置中。 氮化物半导体的c轴相对于朝向波导轴方向的半极性表面的法线轴线以一角度ALPHA倾斜。 激光器结构包括与波导轴相交的第一和第二断裂面。 激光装置的激光腔包括从第一和第二面的边缘延伸的第一和第二断裂面。 第一断裂面包括设置在半导体区域的InGaN层的端面并沿从激光器件的一个侧面到另一个的方向延伸的台阶。

    High electron mobility transistor, epitaxial wafer, and method of fabricating high electron mobility transistor
    48.
    发明授权
    High electron mobility transistor, epitaxial wafer, and method of fabricating high electron mobility transistor 失效
    高电子迁移率晶体管,外延晶片和制造高电子迁移率晶体管的方法

    公开(公告)号:US08183596B2

    公开(公告)日:2012-05-22

    申请号:US12846311

    申请日:2010-07-29

    摘要: A high electron mobility transistor includes a free-standing supporting base having a III nitride region, a first III nitride barrier layer which is provided on the first III nitride barrier layer, a III nitride channel layer which is provided on the first III nitride barrier layer and forms a first heterojunction with the first III nitride barrier layer, a gate electrode provided on the III nitride channel layer so as to exert an electric field on the first heterojunction, a source electrode on the III nitride channel layer and the first III nitride barrier, and a drain electrode on the III nitride channel layer and the first III nitride barrier. The III nitride channel layer has compressive internal strain, and the piezoelectric field of the III nitride channel layer is oriented in the direction from the supporting base towards the first III nitride barrier layer. The first heterojunction extends along a plane having a normal axis that is inclined at an inclination angle in the range of 40 degrees to 85 degrees or 140 degrees to 180 degrees with respect to the c-axis of the III nitride region.

    摘要翻译: 高电子迁移率晶体管包括具有III族氮化物区域的独立支撑基底,设置在第一III族氮化物阻挡层上的第一III族氮化物阻挡层,设置在第一III族氮化物阻挡层上的III族氮化物沟道层 并与第一III族氮化物阻挡层形成第一异质结,设置在III族氮化物沟道层上以在第一异质结上施加电场的栅电极,III族氮化物沟道层上的源极和第一III族氮化物势垒 ,以及在III族氮化物沟道层和第一III族氮化物屏障上的漏电极。 III族氮化物沟道层具有压缩内部应变,并且III族氮化物沟道层的压电场在从支撑基底朝向第一III族氮化物阻挡层的方向上取向。 第一异质结沿着具有相对于III族氮化物区域的c轴以40度至85度或140度至180度的范围内倾斜的倾斜角的平面延伸。