Abstract:
Apparatuses and methods for controlling timing circuit locking and/or latency during a change in clock frequency (e.g. gear down mode) are described herein. An example apparatus may include a timing circuit. The timing circuit may be configured to provide a clock signal to the forward path, adjust a rate of the clock signal responsive to receipt of a command to adjust the rate of the clock signal, select a feedback clock signal responsive to a loop delay of the timing circuit, and provide a control signal to an adjustable delay circuit of the forward path circuit. Another example apparatus may include a forward path configured to delay a signal based at least in part on a loop delay and a latency value, and a latency control circuit configured to provide an adjusted latency value as the latency value responsive to receipt of a command, wherein the forward path is configured to operate at least in part at an adjusted clock rate responsive to receipt of the command.
Abstract:
A clock generator having a delay locked loop and a delay control circuit. The delay locked loop receives an input clock signal and adjusts an adjustable delay circuit to generate an output clock signal that is synchronized with received input clock signal. The delay control circuit coupled to the delay locked loop generates a control signal to initialize the delay measure operation to adjust the adjustable delay circuit, after comparing the phase difference of the input clock signal and the output clock signal. The delay control circuit further generates a start measure control signal to start measuring a delay applied to the measurement signal propagating through the adjustable delay circuit, and generates a stop measure control signal to stop the delay measurement of the measurement signal. The delay adjustment of the delay locked loop is then adjusted to apply the delay measurement when synchronizing the input and output clock signals.
Abstract:
A clock generator having a delay locked loop and a delay control circuit. The delay locked loop receives an input clock signal and adjusts an adjustable delay circuit to generate an output clock signal that is synchronized with received input clock signal. The delay control circuit coupled to the delay locked loop generates a control signal to initialize the delay measure operation to adjust the adjustable delay circuit, after comparing the phase difference of the input clock signal and the output clock signal. The delay control circuit further generates a start measure control signal to start measuring a delay applied to the measurement signal propagating through the adjustable delay circuit, and generates a stop measure control signal to stop the delay measurement of the measurement signal. The delay adjustment of the delay locked loop is then adjusted to apply the delay measurement when synchronizing the input and output clock signals.
Abstract:
A clock synchronization system and method avoids output clock jitter at high frequencies and also achieves a smooth phase transition at the boundary of the coarse and fine delays. The system may use a single coarse delay line configured to generate two intermediate clocks from the input reference clock and having a fixed phase difference therebetween. The coarse delay line may have a hierarchical or a non-hierarchical structure. A phase mixer receives these two intermediate clocks and generates the final output clock having a phase between the phases of the intermediate clocks. The coarse shifting in the delay line at high clock frequencies does not affect the phase relationship between the intermediate clocks fed into the phase mixer. The output clock from the phase mixer is time synchronized with the input reference clock and does not exhibit any jitter or noise even at high clock frequency inputs. Because of the rules governing abstracts, this abstract should not be used to construe the claims.
Abstract:
A semiconductor device may include a serializer circuit configured to generate an output clock signal for serialization. The serializer circuit may include a clock generator circuit configured to generate the output clock signal based on an input clock signal. Both the input and output clock signals may be multi-phase clock signals. The clock generator circuit may include an input clock buffer circuit, inverter circuits, a clock pulse circuit (e.g., a plurality of NAND gates in a configuration), and phase splitter circuits arranged in a configuration so as to reduce current leakage and allow for a smaller footprint, among other benefits. The clock generator circuit may provide the output clock signal to a serializer included in the serializer circuit for serialization.
Abstract:
Methods, systems, and devices for divided clock control are described. An even clock signal associated with transitioning edges of even-indexed pulses of a global clock signal and an odd clock signal associated with transitioning edges of odd-indexed pulses of a global clock signal may be received. An indication of whether a received command was received on a transitioning edge of an even-indexed pulse may be received. Based on the indication, whether to enable a propagation of the even clock signal to a first delay logic associated with even-indexed pulses or a second delay logic associated with odd-indexed pulses may be determined. Based on the determining, whether to delay a propagation of the command using the first delay logic and the even clock signal or the second delay logic and the odd clock signal may be determined.
Abstract:
Methods, systems, and devices for operating a memory device are described. An error correction bit flipping scheme may include methods, systems, and devices for performing error correction of one or more bits (e.g., a flip bit) and for efficiently communicating error correction information. The data bits and the flip bit (e.g., an error corrected flip bit) may be directly transmitted (e.g., to a flip decision component). The flip bit may be transmitted to the flip decision component over a dedicated and/or unidirectional line that is different from one or more other lines that carry data bits (e.g., to the flip decision component).
Abstract:
Methods, systems, and devices for an error correcting code scrub scheme are described. A memory device may correct an error associated with a first data bit or a first parity bit of a plurality of data bits and a plurality of parity bits, respectively. The memory device may correct the error by reading each of the plurality of data bits and the plurality of parity bits from a memory array, and determining that an error associated with a single bit exists. The memory device may then correct the determined single-bit error, and may write the corrected bit directly back to the memory array.
Abstract:
Apparatuses and methods for error correction coding and data bus inversion for semiconductor memories are described. An example apparatus includes an I/O circuit configured to receive first data and first ECC data associated with the first data, a memory array, and a control circuit. The control circuit is coupled between the I/O circuit and the memory array. The control circuit is configured to execute first ECC-decoding to produce corrected first data and corrected first ECC data responsive, at least in part, to the first data and the first ECC data. The control circuit is further configured to store both the corrected first data and the corrected first ECC data into the memory array.
Abstract:
A read latency control circuit is described having a clock synchronization circuit and a read latency control circuit. The clock synchronization circuit includes an adjustable delay line to generate an output clock signal whose phase is synchronized with the phase of the input clock signal. The read latency control circuit captures a read command signal relative to the timing of the input clock signal and outputs the read command signal relative to the timing of the output clock signal such that the read command signal is outputted indicative of a specified read latency.