公开(公告)号：US11430772B2

公开(公告)日：2022-08-30

申请号：US17205659

申请日：2021-03-18

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Hyunsoo Chung ,  Taewon Yoo ,  Myungkee Chung

IPC: H01L25/10 ,  H01L23/31 ,  H01L23/538 ,  H01L23/00 ,  H01L21/48 ,  H01L21/56 ,  H01L25/00

Abstract: A semiconductor package includes a bottom package and an upper redistribution layer disposed on the bottom package. The bottom package includes a substrate and a semiconductor chip disposed on the substrate. A conductive pillar extends upwardly from the substrate and is spaced apart from the semiconductor chip. A mold layer is disposed on the substrate and encloses the semiconductor chip and lateral side surfaces of the conductive pillar. The conductive pillar includes a connection pillar configured to electrically connect the substrate to the upper redistribution layer and an alignment pillar that is spaced apart from the connection pillar. The upper redistribution layer includes a redistribution metal pattern configured to be electrically connected to the connection pillar. A first insulating layer is in direct contact with a top surface of the redistribution metal pattern. A top surface of the alignment pillar is in direct contact with the first insulating layer.

公开(公告)号：US20220230977A1

公开(公告)日：2022-07-21

申请号：US17715479

申请日：2022-04-07

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Hyunsoo Chung ,  Taewon Yoo ,  Myungkee Chung

IPC: H01L23/00

Abstract: A semiconductor package includes a chip including a pad; a first insulation pattern on the chip and exposing the pad; a redistribution layer (RDL) on an upper surface of the first insulation pattern and connected to the pad; a second insulation pattern on the upper surface of the first insulation pattern and including an opening exposing a ball land of the RDL and a patterned portion in the opening; an under bump metal (UBM) on upper surfaces of the second insulation pattern and patterned portion and filling the opening, the UBM including a first locking hole exposing an edge of an upper surface of the ball land; and a conductive ball on an upper surface of the UBM and including a first locking portion in the first locking hole. The first locking hole may be about 10% to about 50% of the area of the UBM upper surface.

公开(公告)号：US20170084559A1

公开(公告)日：2017-03-23

申请号：US15230889

申请日：2016-08-08

Applicant: Samsung Electronics Co., Ltd.

Inventor： Myeong Soon Park ,  Hyunsoo Chung ,  Won-young Kim ,  Ae-nee Jang ,  Chanho Lee

IPC: H01L23/00

CPC classification number: H01L23/50 ,  H01L24/02 ,  H01L24/06 ,  H01L24/13 ,  H01L24/14 ,  H01L2224/02371 ,  H01L2224/02372 ,  H01L2224/02375 ,  H01L2224/02377 ,  H01L2224/02379 ,  H01L2224/0401 ,  H01L2224/05 ,  H01L2224/05553 ,  H01L2224/05555 ,  H01L2224/06131 ,  H01L2224/06135 ,  H01L2224/06139 ,  H01L2224/06151 ,  H01L2224/06152 ,  H01L2224/06155 ,  H01L2224/06156 ,  H01L2224/06159 ,  H01L2224/0616 ,  H01L2224/06165 ,  H01L2224/06169 ,  H01L2224/06177 ,  H01L2224/06181 ,  H01L2224/13022 ,  H01L2224/131 ,  H01L2224/1403 ,  H01L2224/14181 ,  H01L2224/16227 ,  H01L2924/014 ,  H01L2924/00014 ,  H01L2924/00012 ,  H01L2224/0613

Abstract: Semiconductor devices with redistribution pads are disclosed. The semiconductor device includes a plurality of electric pads provided on a semiconductor substrate, and a plurality of redistribution pads electrically connected to the electric pads and an outer terminal. The plurality of redistribution pads includes a plurality of first redistribution pads constituting a transmission path for a first electrical signal and at least one second redistribution pad constituting a transmission path for a second electrical signal different from the first electrical signal. The first redistribution pads are arranged on the semiconductor substrate to form at least two rows, and the at least one second redistribution pad is disposed between the at least two rows of the first redistribution pads.

公开(公告)号：US09287140B2

公开(公告)日：2016-03-15

申请号：US14264123

申请日：2014-04-29

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Hyunsoo Chung ,  Jongyeon Kim ,  In-Young Lee ,  Tae-Je Cho

IPC: H01L21/00 ,  H01L21/48 ,  H01L25/00 ,  H01L21/02 ,  H01L23/31 ,  H01L21/56 ,  H01L23/00 ,  H01L25/03 ,  H01L25/065 ,  H01L21/768

CPC classification number: H01L25/0657 ,  H01L21/02016 ,  H01L21/486 ,  H01L21/561 ,  H01L21/76898 ,  H01L23/3128 ,  H01L23/3135 ,  H01L24/16 ,  H01L24/92 ,  H01L24/94 ,  H01L24/97 ,  H01L25/03 ,  H01L25/50 ,  H01L2224/131 ,  H01L2224/16145 ,  H01L2224/16225 ,  H01L2224/16227 ,  H01L2224/17181 ,  H01L2224/9202 ,  H01L2224/94 ,  H01L2224/97 ,  H01L2225/06513 ,  H01L2225/06517 ,  H01L2225/06541 ,  H01L2924/12042 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2224/81 ,  H01L2224/03 ,  H01L2224/11 ,  H01L2924/00 ,  H01L2924/014 ,  H01L2924/00012

Abstract: Provided are semiconductor packages having through electrodes and methods of fabricating the same. The method may include may include forming a wafer-level package including first semiconductor chips stacked on a second semiconductor chip, forming a chip-level package including fourth semiconductor chips stacked on a third semiconductor chip stacking a plurality of the chip-level packages on a back surface of the second semiconductor substrate of the wafer-level package, polishing the first mold layer of the wafer-level package and the first semiconductor chips to expose a first through electrodes of the first semiconductor chip, and forming outer electrodes on the polished first semiconductor chips to be connected to the first through electrodes, respectively.

Abstract translation: 提供了具有通孔的半导体封装及其制造方法。 该方法可以包括形成包括层叠在第二半导体芯片上的第一半导体芯片的晶片级封装，形成芯片级封装，芯片级封装包括堆叠在堆叠多个芯片级封装上的第三半导体芯片上的第四半导体芯片 晶片级封装的第二半导体衬底的后表面，抛光晶片级封装的第一模具层和第一半导体芯片，以暴露第一半导体芯片的第一贯穿电极，并在第一半导体芯片上形成外部电极 半导体芯片分别连接到第一贯通电极。

公开(公告)号：US09245771B2

公开(公告)日：2016-01-26

申请号：US14264120

申请日：2014-04-29

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Hyunsoo Chung ,  Keum-Hee Ma ,  In-Young Lee ,  Moon Gi Cho ,  Chajea Jo ,  Taeje Cho

IPC: H01L21/56 ,  H01L23/31 ,  H01L23/00 ,  H01L25/03 ,  H01L25/065 ,  H01L25/00 ,  H01L21/683

CPC classification number: H01L21/561 ,  H01L21/6836 ,  H01L23/3128 ,  H01L23/3135 ,  H01L24/03 ,  H01L24/05 ,  H01L24/11 ,  H01L24/13 ,  H01L24/81 ,  H01L24/92 ,  H01L24/94 ,  H01L24/97 ,  H01L25/03 ,  H01L25/0657 ,  H01L25/50 ,  H01L2221/68327 ,  H01L2221/6834 ,  H01L2224/0345 ,  H01L2224/03462 ,  H01L2224/0401 ,  H01L2224/05009 ,  H01L2224/05548 ,  H01L2224/05568 ,  H01L2224/0557 ,  H01L2224/11462 ,  H01L2224/11464 ,  H01L2224/119 ,  H01L2224/13017 ,  H01L2224/13018 ,  H01L2224/13022 ,  H01L2224/13082 ,  H01L2224/16146 ,  H01L2224/16148 ,  H01L2224/16225 ,  H01L2224/17051 ,  H01L2224/17181 ,  H01L2224/32145 ,  H01L2224/4824 ,  H01L2224/73204 ,  H01L2224/73257 ,  H01L2224/81005 ,  H01L2224/81007 ,  H01L2224/92 ,  H01L2224/92227 ,  H01L2224/94 ,  H01L2224/97 ,  H01L2225/0651 ,  H01L2225/06513 ,  H01L2225/06541 ,  H01L2225/06568 ,  H01L2924/00014 ,  H01L2924/12042 ,  H01L2924/18161 ,  H01L2224/81 ,  H01L2224/11 ,  H01L2224/03 ,  H01L21/568 ,  H01L21/78 ,  H01L2224/1191 ,  H01L2924/00 ,  H01L2224/13099 ,  H01L2924/00012

Abstract: Semiconductor packages having through electrodes and methods for fabricating the same are provided. The method may comprise providing a first substrate including a first circuit layer, forming a front mold layer on a front surface of the first substrate, grinding a back surface of the first substrate, forming a first through electrode that penetrates the first substrate to be electrically connected to the first circuit layer, providing a second substrate on the back surface of the first substrate, the second substrate including a second circuit layer that is electrically connected to the first through electrode, forming a back mold layer on the back surface of the first substrate, the back mold layer encapsulating the second substrate, and removing the front mold layer.

Abstract translation: 提供了具有通过电极的半导体封装及其制造方法。 该方法可以包括提供包括第一电路层的第一衬底，在第一衬底的前表面上形成前模层，研磨第一衬底的后表面，形成穿透第一衬底的第一贯穿电极以电 连接到第一电路层，在第一衬底的背表面上提供第二衬底，第二衬底包括电连接到第一贯通电极的第二电路层，在第一衬底的后表面上形成后模层 衬底，封装第二衬底的后模层，以及去除前模层。

公开(公告)号：US09165916B2

公开(公告)日：2015-10-20

申请号：US14326631

申请日：2014-07-09

Applicant: Samsung Electronics Co., Ltd

Inventor： Hyunsoo Chung ,  Seungduk Baek ,  In-Young Lee ,  Tae-Je Cho

IPC: H01L21/44 ,  H01L21/48 ,  H01L25/00 ,  H01L25/065 ,  H01L23/48 ,  H01L23/29 ,  H01L21/56 ,  H01L23/00 ,  H01L23/31

CPC classification number: H01L25/50 ,  H01L21/563 ,  H01L23/295 ,  H01L23/3128 ,  H01L23/3135 ,  H01L23/481 ,  H01L24/05 ,  H01L24/06 ,  H01L24/13 ,  H01L24/16 ,  H01L24/32 ,  H01L24/73 ,  H01L24/81 ,  H01L24/83 ,  H01L24/92 ,  H01L24/94 ,  H01L24/97 ,  H01L25/0657 ,  H01L2224/0401 ,  H01L2224/0557 ,  H01L2224/06181 ,  H01L2224/131 ,  H01L2224/16146 ,  H01L2224/16225 ,  H01L2224/32145 ,  H01L2224/32225 ,  H01L2224/73104 ,  H01L2224/73204 ,  H01L2224/81005 ,  H01L2224/81815 ,  H01L2224/83191 ,  H01L2224/83192 ,  H01L2224/92125 ,  H01L2224/94 ,  H01L2224/97 ,  H01L2225/06513 ,  H01L2225/06517 ,  H01L2225/06541 ,  H01L2225/06565 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2224/81 ,  H01L2924/014 ,  H01L2224/83 ,  H01L2924/00

Abstract: A semiconductor package and a method of fabricating the same. The method may include mounting a lower stack including a plurality of lower semiconductor chips on a substrate and mounting an upper stack including a plurality of upper semiconductor chips on the lower stack. According to example embodiments of the inventive concept, the semiconductor package can be easily fabricated.

Abstract translation: 一种半导体封装及其制造方法。 该方法可以包括将包括多个下半导体芯片的下堆叠安装在基板上，并且在下堆叠上安装包括多个上半导体芯片的上堆叠。 根据本发明构思的示例实施例，可以容易地制造半导体封装。