SEMICONDUCTOR DEVICE INCLUDING ESD DIODE AND METHOD FOR MANUFACTURING THE SAME

    公开(公告)号:US20240332431A1

    公开(公告)日:2024-10-03

    申请号:US18497363

    申请日:2023-10-30

    CPC classification number: H01L29/8611 H01L27/0248

    Abstract: A semiconductor device according to an embodiment of the present inventive concept comprises: a first power supply pad configured to receive a first power supply voltage; a second power supply pad configured to receive a second power supply voltage, the second power supply voltage having a level lower than a level of the first power supply voltage; a signal pad configured to exchange a signal; and a first electrostatic discharge (ESD) diode comprising a first impurity region doped with impurities of a first conductivity type and connected to the first power supply pad, and a second impurity region doped with impurities of a second conductivity type different from the first conductivity type and connected to the signal pad, wherein a lower surface of at least one of the first impurity region and the second impurity region has an uneven structure.

    SEMICONDUCTOR DEVICE HAVING METAL BUMP AND METHOD OF MANUFACTURING THE SAME

    公开(公告)号:US20200343204A1

    公开(公告)日:2020-10-29

    申请号:US16923406

    申请日:2020-07-08

    Abstract: Provided are a semiconductor device and a method of manufacturing the same. The semiconductor device includes a metal line layer on a semiconductor substrate, and a metal terminal on the metal line layer. The metal line layer includes metal lines, and a passivation layer having a non-planarized top surface including flat surfaces on the metal lines and a concave surface between the metal lines. The metal terminal is provided on the passivation layer. Opposite lateral surfaces of the metal terminal facing each other are provided on the flat surfaces of the passivation layer.

    MEMORY DEVICE INCLUDING MULTI-BIT CELL AND OPERATING METHOD THEREOF

    公开(公告)号:US20230352068A1

    公开(公告)日:2023-11-02

    申请号:US18124094

    申请日:2023-03-21

    CPC classification number: G11C7/1096 G11C7/1087 G11C7/1069 G11C8/08

    Abstract: A memory device includes a plurality of multi-bit cells, wherein each of the plurality of multi-bit cells includes a plurality of bit cells commonly connected to a column selection line, respectively connected to a plurality of write word lines, and respectively connected to a plurality of read word lines and an input circuit configured to provide a first signal corresponding to a bit to be written, to the plurality of bit cells, wherein each of the plurality of bit cells includes a latch circuit configured to receive the first signal in response to a write word line being activated and latch the first signal in response to the write word line being deactivated or a column selection line being deactivated, and a read circuit configured to output the first signal stored in the latch circuit to a bit line in response to a read word line being activated.

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