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公开(公告)号:US12040294B2
公开(公告)日:2024-07-16
申请号:US18313560
申请日:2023-05-08
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ju-Il Choi , Un-Byoung Kang , Jin Ho An , Jongho Lee , Jeonggi Jin , Atsushi Fujisaki
IPC: H01L23/00
CPC classification number: H01L24/05 , H01L24/03 , H01L24/11 , H01L24/13 , H01L2224/0346 , H01L2224/03614 , H01L2224/0401 , H01L2224/05016 , H01L2224/0508 , H01L2224/05144 , H01L2224/05147 , H01L2224/05155 , H01L2224/11849 , H01L2224/13026 , H01L2224/13111 , H01L2224/13113 , H01L2224/13116 , H01L2224/13139 , H01L2224/13144 , H01L2224/13147 , H01L2224/13155
Abstract: Semiconductor devices are provided. A semiconductor device includes an insulating layer and a conductive element in the insulating layer. The semiconductor device includes a first barrier pattern in contact with a surface of the conductive element and a surface of the insulating layer. The semiconductor device includes a second barrier pattern on the first barrier pattern. Moreover, the semiconductor device includes a metal pattern on the second barrier pattern. Related semiconductor packages are also provided.
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公开(公告)号:US11967581B2
公开(公告)日:2024-04-23
申请号:US18110446
申请日:2023-02-16
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jinwoo Park , Unbyoung Kang , Jongho Lee , Teakhoon Lee
IPC: H01L23/16 , H01L23/00 , H01L23/31 , H01L23/367 , H01L25/065
CPC classification number: H01L25/0652 , H01L23/16 , H01L23/3128 , H01L23/3135 , H01L23/3675 , H01L23/562 , H01L2225/06513 , H01L2225/06541 , H01L2225/06586 , H01L2225/06589
Abstract: A package structure includes a lower substrate, substrate connection terminals on the lower substrate, a semiconductor package on the substrate connection terminals, the semiconductor package including a package substrate and a first encapsulant covering the package substrate, first underfills between the lower substrate and the semiconductor package, the first underfills covering corner portions of the semiconductor package, as viewed in a plan view, and covering at least one of the substrate connection terminals, and a second underfill between the lower substrate and the semiconductor package, the second underfill covering a side surface of the semiconductor package in a plan view.
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公开(公告)号:US11735494B2
公开(公告)日:2023-08-22
申请号:US17408988
申请日:2021-08-23
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hee-Jeong Kim , Juhyun Lyu , Un-Byoung Kang , Jongho Lee
IPC: H01L23/373 , H01L23/31 , H01L23/367
CPC classification number: H01L23/3735 , H01L23/3185 , H01L23/367
Abstract: Disclosed is a semiconductor package comprising first and second semiconductor structures spaced apart on a first substrate, a heat sink covering the first and second semiconductor structure and the first substrate, and a thermal interface material layer between the heat sink and the first and second semiconductor structures. The first semiconductor structure includes a first sidewall adjacent to the second semiconductor structure and a second sidewall opposite the first sidewall. The thermal interface material layer includes a first segment between the first and second semiconductor structures and a second segment protruding beyond the second sidewall. A first distance from a top surface of the first substrate to a lowest point of a bottom surface of the first segment is less than a second distance from the top surface of the first substrate to a lowest point of a bottom surface of the second segment.
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公开(公告)号:US20230207532A1
公开(公告)日:2023-06-29
申请号:US18176058
申请日:2023-02-28
Applicant: Samsung Electronics Co., Ltd.
Inventor: Joonho JUN , Un-Byoung Kang , Sunkyoung Seo , Jongho Lee , Young Kun Jee
IPC: H01L25/065 , H01L23/00
CPC classification number: H01L25/0657 , H01L24/14 , H01L24/06 , H01L2224/06181 , H01L2224/1451 , H01L2224/06515 , H01L2224/0401 , H01L2225/06513
Abstract: A semiconductor package may include first and second substrates, which are vertically stacked, a semiconductor device layer on a bottom surface of the second substrate to face a top surface of the first substrate, upper chip pads and an upper dummy pad on the top surface of the first substrate, penetration electrodes, which each penetrate the first substrate and are connected to separate, respective upper chip pads, lower chip pads on a bottom surface of the semiconductor device layer and electrically connected to separate, respective upper chip pads, and a lower dummy pad on the bottom surface of the semiconductor device layer and electrically isolated from the upper dummy pad. A distance between the upper and lower dummy pads in a horizontal direction that is parallel to the first substrate may be smaller than a diameter of the lower dummy pad.
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公开(公告)号:US20220319944A1
公开(公告)日:2022-10-06
申请号:US17573426
申请日:2022-01-11
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jinwoo Park , Jongho Lee , Yeongkwon Ko , Teakhoon Lee
IPC: H01L23/31 , H01L23/00 , H01L21/56 , H01L25/00 , H01L25/065 , H01L23/498
Abstract: A semiconductor package includes a package substrate, an interposer provided on the package substrate, a plurality of semiconductor devices on the interposer to be spaced apart from each other, the semiconductor devices being electrically connected to the package substrate through the interposer, and a molding layer on the interposer covering the semiconductor devices and exposing upper surfaces of the semiconductor devices, the molding layer including at least one groove extending in one direction between the semiconductor devices, the groove having a predetermined depth from an upper surface of the molding layer.
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公开(公告)号:US20220293566A1
公开(公告)日:2022-09-15
申请号:US17552614
申请日:2021-12-16
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sang-Sick Park , Un-Byoung Kang , Jongho Lee , Teak-Hoon Lee
IPC: H01L25/065 , H01L23/00
Abstract: Disclosed is a semiconductor package with increased thermal radiation efficiency, which includes: a first die having signal and dummy regions and including first vias in the signal region, a second die on the first die and including second vias in the signal region, first die pads on a top surface of the first die and coupled to the first vias, first connection terminals on the first die pads which couple the second vias to the first vias, second die pads in the dummy region and on the top surface of the first die, and second connection terminals on the second die pads and electrically insulated from the first vias and the second vias. Each of the second die pads has a rectangular planar shape whose major axis is provided along a direction that leads away from the signal region.
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公开(公告)号:US11312639B2
公开(公告)日:2022-04-26
申请号:US17003205
申请日:2020-08-26
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jungha Park , Jongho Lee , Yeonwoo Cho , Sungpil Choi
Abstract: A water purifier and a filter for the water purifier are provided. The water purifier includes a raw water flow path formed to bring in raw water from the outside, a purified water flow path connected to the raw water flow path for the raw water to flow in a first direction, a filter located in the purified water flow path to filter the raw water, a bypass flow path branched from the purified water flow path for the raw water to bypass the filter and connected to the purified water flow path on a downstream side of the filter in the first direction, a washing flow path branched from the bypass flow path and connected to the purified water flow path on a downstream side of the filter in the first direction, and a drain flow path connected to the filter to guide the raw water flowing into the filter to a second direction. The filter includes a raw water inlet through which raw water flowing in the first direction is introduced, a purified water outlet through which purified water filtered is released, and a drain outlet through which wash water having washed the filter is discharged.
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公开(公告)号:US11302660B2
公开(公告)日:2022-04-12
申请号:US16803529
申请日:2020-02-27
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ju-Il Choi , Un-Byoung Kang , Jin Ho An , Jongho Lee , Jeonggi Jin , Atsushi Fujisaki
IPC: H01L23/00
Abstract: Semiconductor devices are provided. A semiconductor device includes an insulating layer and a conductive element in the insulating layer. The semiconductor device includes a first barrier pattern in contact with a surface of the conductive element and a surface of the insulating layer. The semiconductor device includes a second barrier pattern on the first barrier pattern. Moreover, the semiconductor device includes a metal pattern on the second barrier pattern. Related semiconductor packages are also provided.
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公开(公告)号:US10109631B2
公开(公告)日:2018-10-23
申请号:US15438113
申请日:2017-02-21
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sung-Dae Suk , Jongho Lee , Geumjong Bae
IPC: H01L27/092 , H01L23/535 , H01L29/78 , H01L29/417
Abstract: A semiconductor device includes an insulating layer on a substrate, a channel region on the insulating layer, a gate structure on the insulating layer, the gate structure crossing the channel region, source/drain regions on the insulating layer, the source/drain regions being spaced apart from each other with the gate structure interposed therebetween, the channel region connecting the source/drain regions to each other, and contact plugs connected to the source/drain regions, respectively. The channel region includes a plurality of semiconductor patterns that are vertically spaced apart from each other on the insulating layer, the insulating layer includes first recess regions that are adjacent to the source/drain regions, respectively, and the contact plugs include lower portions provided into the first recess regions, respectively.
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公开(公告)号:US10008488B2
公开(公告)日:2018-06-26
申请号:US15489031
申请日:2017-04-17
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yongkwan Lee , Kundae Yeom , Jongho Lee , Hogeon Song
IPC: H01L25/18 , H01L21/48 , H01L23/00 , H01L23/498 , H01L23/538 , H01L25/065 , H01L25/10
CPC classification number: H01L25/18 , H01L21/4853 , H01L21/4857 , H01L23/49811 , H01L23/49816 , H01L23/49827 , H01L23/49833 , H01L23/5384 , H01L23/5385 , H01L24/13 , H01L24/16 , H01L24/32 , H01L24/48 , H01L24/49 , H01L24/81 , H01L25/0652 , H01L25/0655 , H01L25/105 , H01L2224/16141 , H01L2224/16145 , H01L2224/16227 , H01L2224/32225 , H01L2224/48227 , H01L2224/4911 , H01L2224/73204 , H01L2224/97 , H01L2225/06517 , H01L2225/06572 , H01L2924/15311 , H01L2924/181 , H01L2224/81 , H01L2924/00012
Abstract: In one embodiment, the semiconductor module includes a module substrate and a first substrate mounted on and electrically connected to a first surface of the module substrate. The first substrate has one or more first electrical connectors of the semiconductor module, and the first substrate electrically connecting the first electrical connector to the module substrate.
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