Electrostatic discharge protection circuit
    52.
    发明授权
    Electrostatic discharge protection circuit 有权
    静电放电保护电路

    公开(公告)号:US07400480B2

    公开(公告)日:2008-07-15

    申请号:US11890933

    申请日:2007-08-07

    IPC分类号: H02H3/22

    CPC分类号: H01L27/0266 H01L27/0251

    摘要: Integrated circuits are provided that have sensitive circuitry such as programmable polysilicon fuses. Electrostatic discharge (ESD) protection circuitry is provided that prevents damage or undesired programming of the sensitive circuitry in the presence of an electrostatic discharge event. The electrostatic discharge protection circuitry may have a power ESD device that limits the voltage level across the sensitive circuitry to a maximum voltage and that draws current away from the sensitive circuitry when exposed to ESD signals. The electrostatic discharge protection circuitry may also have an ESD margin circuit that helps to prevent current flow through the sensitive circuitry when the maximum voltage is applied across the sensitive circuitry.

    摘要翻译: 提供具有诸如可编程多晶硅保险丝等敏感电路的集成电路。 提供静电放电(ESD)保护电路,防止在存在静电放电事件时敏感电路的损坏或不期望的编程。 静电放电保护电路可以具有电源ESD器件,其将敏感电路两端的电压电平限制到最大电压,并且当暴露于ESD信号时,其将电流从敏感电路吸取。 静电放电保护电路还可以具有ESD余量电路,当在敏感电路上施加最大电压时,该余量电路有助于防止电流流经敏感电路。

    Method and apparatus for reducing charge loss in a nonvolatile memory cell
    53.
    发明授权
    Method and apparatus for reducing charge loss in a nonvolatile memory cell 有权
    用于减少非易失性存储单元中的电荷损失的方法和装置

    公开(公告)号:US07291546B1

    公开(公告)日:2007-11-06

    申请号:US10872618

    申请日:2004-06-21

    IPC分类号: H01L21/8247

    摘要: A method of fabricating a non-volatile memory cell on a semiconductor substrate is disclosed. An area of a first region of the semiconductor substrate designated for a layer of floating polysilicon is blocked while a second region of the semiconductor substrate designated for a layer of non-floating polysilicon is exposed. Exposed regions of the semiconductor substrate are doped with charges.

    摘要翻译: 公开了一种在半导体衬底上制造非易失性存储单元的方法。 指定用于浮动多晶硅层的半导体衬底的第一区域的区域被封闭,而指定用于非浮动多晶硅层的第二半导体衬底的区域被暴露。 半导体衬底的暴露区域掺杂有电荷。

    Methods for optimizing programmable logic device performance by reducing congestion
    54.
    发明授权
    Methods for optimizing programmable logic device performance by reducing congestion 有权
    通过减少拥塞来优化可编程逻辑器件性能的方法

    公开(公告)号:US07210115B1

    公开(公告)日:2007-04-24

    申请号:US10884612

    申请日:2004-07-02

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5054 G06F17/5036

    摘要: Methods and apparatus for designing and producing programmable logic devices are provided. A logic design system may be used to analyze various implementations of a desired logic design for a programmable logic device integrated circuit. The logic design system may be used to produce configuration data for the programmable logic device in accordance with an optimized implementation. A logic circuit for a programmable logic device can be analyzed by taking into account the effects of hotspots, power supply voltage drops, and signal congestion on device performance. By modeling the performance of transistors and other components using position-dependent and signal-dependent variables such as temperature, voltage, and capacitance, the effects of congestion on device performance can be characterized and an optimum implementation of the logic design in a programmable logic device can be obtained.

    摘要翻译: 提供了设计和制造可编程逻辑器件的方法和设备。 可以使用逻辑设计系统来分析用于可编程逻辑器件集成电路的期望逻辑设计的各种实现。 逻辑设计系统可以用于根据优化的实现来产生可编程逻辑器件的配置数据。 可以通过考虑热点,电源电压降和信号拥塞对器件性能的影响来分析可编程逻辑器件的逻辑电路。 通过使用位置相关和信号相关变量(如温度,电压和电容)对晶体管和其他组件的性能进行建模,可以对设备性能拥塞的影响进行表征,并在可编程逻辑器件中实现逻辑设计 可以获得。

    High performance lateral bipolar transistor
    56.
    发明授权
    High performance lateral bipolar transistor 有权
    高性能横向双极晶体管

    公开(公告)号:US07173320B1

    公开(公告)日:2007-02-06

    申请号:US10427777

    申请日:2003-04-30

    申请人: Irfan Rahim

    发明人: Irfan Rahim

    摘要: A lateral bipolar transistor includes an emitter region, a base region, a collector region, and a gate disposed over the base region. A bias line is connected to the gate for applying a bias voltage thereto during operation of the transistor. The polarity of the bias voltage is such as to create an accumulation layer in the base under the gate. The accumulation layer provides a low-resistance path for the transistor base current, thus reducing the base resistance of the transistor.

    摘要翻译: 横向双极晶体管包括发射极区域,基极区域,集电极区域和设置在基极区域上的栅极。 偏置线连接到栅极,以在晶体管的工作期间施加偏置电压。 偏置电压的极性使得在栅极下方的基极中产生积聚层。 累积层为晶体管基极电流提供低电阻通路,从而降低晶体管的基极电阻。

    Electrically-programmable integrated circuit fuses and sensing circuits
    57.
    发明授权
    Electrically-programmable integrated circuit fuses and sensing circuits 失效
    电子可编程集成电路保险丝和感应电路

    公开(公告)号:US06933591B1

    公开(公告)日:2005-08-23

    申请号:US10687199

    申请日:2003-10-16

    IPC分类号: H01L23/525 H01L23/58

    摘要: Programmable fuses for integrated circuits are provided. The fuses may be based on polysilicon or crystalline silicon fuse links coated with silicide or other conductive thin films. Fuses may be formed on silicon-on-insulator (SOI) substrates. A fuse may be blown by applying a programming current to the fuse link. The silicon or polysilicon in the fuses may be provided with a p-n junction. When a fuse is programmed, the silicide or other conductive film forms an open circuit. This forces current though the underlying p-n junction. Unlike conventional silicided polysilicon fuses, fuses with p-n junctions change their qualitative behavior when programmed. Unprogrammed fuses behave like resistors, while programmed fuses behave like diodes. The presence of the p-n junction allows sensing circuitry to determine in a highly accurate qualitative fashion whether a given fuse has been programmed.

    摘要翻译: 提供集成电路的可编程保险丝。 保险丝可以基于涂覆有硅化物或其它导电薄膜的多晶硅或晶体硅熔丝链。 可以在绝缘体上硅(SOI)衬底上形成保险丝。 通过向熔丝链路施加编程电流可能会熔断保险丝。 保险丝中的硅或多晶硅可以设置有p-n结。 当熔丝被编程时,硅化物或其它导电膜形成开路。 这通过下面的p-n结强迫电流。 与传统的硅化多晶硅保险丝不同,p-n结的保险丝在编程时会改变其定性行为。 未编程的保险丝与电阻器类似,而编程的保险丝就像二极管。 p-n结的存在允许感测电路以高度精确的定性方式确定给定的保险丝是否已被编程。

    Integrated non-volatile and CMOS memories having substantially the same thickness gates and methods of forming the same
    58.
    发明授权
    Integrated non-volatile and CMOS memories having substantially the same thickness gates and methods of forming the same 失效
    集成的非易失性和CMOS存储器具有基本相同的厚度栅极及其形成方法

    公开(公告)号:US06207991B1

    公开(公告)日:2001-03-27

    申请号:US09045269

    申请日:1998-03-20

    申请人: Irfan Rahim

    发明人: Irfan Rahim

    IPC分类号: H01L29792

    摘要: A method of forming non-volatile memory (e.g., an EEPROM device) and a CMOS device (e.g., a RAM), on a single die or chip, and a structure formed by the method. In one embodiment, the control gate of the storage transistor as well as the isolation gate of the isolation transistor may be formed during the same manufacturing process step, and thus may be formed of the same gate poly material and may have similar thickness.

    摘要翻译: 在单个芯片或芯片上形成非易失性存储器(例如,EEPROM器件)和CMOS器件(例如,RAM)的方法以及通过该方法形成的结构。 在一个实施例中,存储晶体管的控制栅极以及隔离晶体管的隔离栅极可以在相同的制造工艺步骤期间形成,并且因此可以由相同的栅极多晶材料形成并且可以具有类似的厚度。

    Circuit and method of reducing cross-talk in an integrated circuit
substrate
    59.
    发明授权
    Circuit and method of reducing cross-talk in an integrated circuit substrate 失效
    降低集成电路基板串扰的电路及方法

    公开(公告)号:US5900763A

    公开(公告)日:1999-05-04

    申请号:US317673

    申请日:1994-10-11

    摘要: An integrated circuit (10) provides analog and digital circuitry on a common substrate (12). A first digital circuit (14) operates in combination with an analog circuit (18) to perform a useful function. A second duplicate digital circuit (26) is disposed adjacent to the first digital circuit and operates out-of-phase with respect to the first digital circuit. The second duplicate digital circuit introduces voltage spikes equal and opposite to the voltage spikes introduced into the substrate by the first digital circuit. The equal and opposite voltage spikes tend to cancel and thereby minimize cross-talk between the digital and analog circuits. A guard ring (16,28) surrounds each of the first and second digital circuits and the analog circuit to reduce voltage spikes into the substrates. By minimizing cross-talk, the analog circuit operates without interference from the digital circuits.

    摘要翻译: 集成电路(10)在公共基板(12)上提供模拟和数字电路。 第一数字电路(14)与模拟电路(18)组合工作以执行有用的功能。 第二重复数字电路(26)被布置为与第一数字电路相邻并且相对于第一数字电路进行异相操作。 第二重复数字电路引入与由第一数字电路引入衬底的电压尖峰相等和相反的电压尖峰。 相等和相反的电压尖峰趋于抵消,从而最小化数字和模拟电路之间的串扰。 保护环(16,28)围绕第一和第二数字电路和模拟电路中的每一个以减少到基板的电压尖峰。 通过最小化串扰,模拟电路在数字电路没有干扰的情况下工作。

    Memory elements with increased write margin and soft error upset immunity
    60.
    发明授权
    Memory elements with increased write margin and soft error upset immunity 有权
    存储器元件具有增加的写入裕度和软错误失真的抗扰度

    公开(公告)号:US08711614B1

    公开(公告)日:2014-04-29

    申请号:US13052374

    申请日:2011-03-21

    IPC分类号: G11C11/34

    CPC分类号: G11C8/10

    摘要: Memory elements are provided that exhibit immunity to soft error upset events when subjected to radiation strikes such as high-energy atomic particle strikes. The memory elements may each have four inverter-like transistor pairs that form a bistable element and a pair of address transistors. There may be four nodes in the transistor each of which is associated with a respective one of the four inverter-like transistor pairs. There may be two control transistors each of which is coupled between the transistors in a respective one of the inverter-like transistor pairs. During data writing operations, the two control transistors may be turned off to temporarily decouple the transistors in two of the four inverter-like transistor pairs.

    摘要翻译: 提供了存储器元件,当受到诸如高能量原子粒子撞击的辐射攻击时,其表现出对软错误失调事件的抗扰性。 存储器元件可以各自具有形成双稳态元件和一对地址晶体管的四个反相器状晶体管对。 晶体管中可能存在四个节点,每个节点与四个逆变器状晶体管对中的相应一个相关联。 可以存在两个控制晶体管,每个控制晶体管耦合在逆变器状晶体管对的相应一个中的晶体管之间。 在数据写入操作期间,可以关闭两个控制晶体管,以暂时将四个反相器状晶体管对中的两个中的晶体管去耦。