Abstract:
Embodiments of the present disclosure provide an approach for monitoring the health and predicting the failure of dynamic random-access memory (DRAM) devices with embedded error-correcting code (ECC). Additional registers are embedded on the DRAM device to store information about the DRAM, such as the number and location of soft errors detected by the device. When the DRAM device detects a soft error, it will update the information stored in the additional registers. A controller compares the information stored in the additional registers to associated thresholds. In some embodiments, after comparing the information to the associated thresholds, the controller may determine whether to schedule a repair action. In other embodiments, the controller may determine whether to alert the memory controller that the DRAM may be failing.
Abstract:
An aspect includes a method for auto-disabling dynamic random access memory (DRAM) error checking based on a threshold. A method includes receiving data at a DRAM from a memory controller and executing error checking logic based on the data. The error checking logic detects an error condition in the data and it is determined, at the DRAM, whether detecting the error condition in the data causes an error threshold to be reached. The error checking logic is disabled at the DRAM in response to determining that detecting the error condition in the data causes the error the error threshold to be reached. The error condition is communicated to the memory controller in response to determining that detecting the error condition does not cause the error threshold to be reached.
Abstract:
Embodiments of the present disclosure provide a method, computer program product, and system for monitoring a dynamic random-access memory (DRAM) device to detect and respond to a cryogenic attack. A processor receives a set of memory information about a DRAM device. The processor then determines a set of error indicators by processing the memory information using a set of decision parameters. The error indicators are then compared to an attack syndrome to determine if the DRAM is experiencing a cryogenic attack. If the DRAM is experiencing a cryogenic attack, access to the DRAM device is disabled.
Abstract:
A system and method for efficient data eye training reduces the time and resources spent calibrating one or more memory devices. A temporal calibration mechanism reduces the time and resources for calibration by reducing the number tests needed to sufficiently determine the boundaries of the data eye of the memory device. For one or more values of the voltage reference, the temporal calibration mechanism performs a minimal number of tests to find the edges of the data eye for the hold and setup times.
Abstract:
A memory management system and method of managing output data resulting from a memory device storing raw data and error correction coding (ECC) bits are described. The system includes a controller to receive a read command and control a memory device based on the read command, the memory device to store raw data and error correction coding (ECC) bits and output the raw data and the ECC bits corresponding with memory addresses specified in the read command, and an ECC decoder to output an error vector associated with the memory addresses based on the raw data and the ECC bits corresponding with the memory addresses output by the memory device, the error vector associated with the memory addresses indicating errors in the raw data corresponding with the memory addresses. The system also includes a multiplexer (MUX) to output the error vector based on a selection indicated in the read command.
Abstract:
A correctable memory error may be identified at a first address within a memory device. Based on at least the identifying, a first correctable memory error count may be updated from a first quantity to a second quantity. The second quantity may be determined to exceed or not exceed a threshold. In response to the determining, the first correctable memory error count of the second quantity may be: converted to a third quantity and reported to a host device accordingly, reported to a host device, or not reported to a host device.
Abstract:
Classifying memory errors may include accessing data from a location within a memory array of a memory device. The memory array may include at least one bit field to store memory error classification information. One or more memory errors in the data may be determined. One or more memory errors may further be classified. In response to the classifying, memory error classification information may be stored as one or more bit values within the bit field.
Abstract:
Error checking and correcting (ECC) may be performed in an on-chip memory where an error is corrected by a controller and not the on-chip memory. The controller may be flagged to show that an error has occurred and where it has occurred in the memory. The controller may access ECC bits associated with the error and may fix incorrect data. The error checking may be done in parallel with read operations of the memory so as to lower latency.
Abstract:
According to one aspect, a method for adaptive error correction in a memory system includes reading data from a memory array of a non-volatile memory device in the memory system. Error correcting logic checks the data for at least one error condition stored in the memory array. Based on determining that the at least one error condition exists, a write-back indicator is asserted by the error correcting logic to request correction of the at least one error condition. Based on determining that the at least one error condition does not exist, accesses of the memory array continue without asserting the write-back indicator.
Abstract:
Embodiments of the present disclosure describe a device and methods of accessing the device. The device can include a plurality of memory cells, each cell including a plurality of resistive memory components each designed to store data as resistance and an access transistor configured to control access to the plurality of resistive memory components. A wordline is configured to enable access to the set of resistor memory components by enabling the access transistor. A plurality of bitlines are each connected to a respective and different set of resistive memory components from each of the plurality of memory cells. A bitline controller is configured to access the plurality of resistive memory components by applying a first voltage to a first set of the plurality of bitlines and a second voltage to a second set of bitlines.