ILLUMINATION SYSTEM FOR RECOGNIZING MATERIAL AND METHOD OF RECOGNIZING MATERIAL USING THE SAME

    公开(公告)号:US20190120759A1

    公开(公告)日:2019-04-25

    申请号:US16229356

    申请日:2018-12-21

    Inventor: Jang-Il SER

    Abstract: An illumination system includes a measurement stage on which a measurement target is located, a light-providing part having illumination sections providing multi-directional incident lights to the measurement target, a light-receiving part receiving single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights, and a processing part that performs acquiring a first distribution of intensities the single-directional reflection lights with respect to the multi-directional incident lights, acquiring, from the first distribution, a second distribution of intensities of multi-directional reflections lights with respect to a single-directional incident light, and determining material of the measurement target based on parameters of the second distribution. A method of recognizing material using the illumination system and a computer readable non-transitory recording medium recording a program embodying the method are provided.

    Method and system for two-dimensional and three-dimensional inspection of a workpiece
    76.
    发明授权
    Method and system for two-dimensional and three-dimensional inspection of a workpiece 有权
    对工件二维和三维检查的方法和系统

    公开(公告)号:US09052294B2

    公开(公告)日:2015-06-09

    申请号:US11421273

    申请日:2006-05-31

    Inventor: Steven R. Walton

    Abstract: A system and method for inspecting a workpiece are provided. According to one embodiment, the system includes a plurality of illumination sources positioned proximate to the workpiece and each operable to generate at least one respective illumination beam to illuminate at least a portion of the workpiece, wherein each beam has a different respective color. The system also includes at least one camera positioned proximate to the workpiece and operable to capture at least one image of at least a portion of the workpiece including the illumination beams incident thereon. In addition, the system includes a data system capable of providing simultaneous two-dimensional and three-dimensional information indicative of the workpiece based on the image acquired by the camera.

    Abstract translation: 提供了一种用于检查工件的系统和方法。 根据一个实施例,系统包括靠近工件定位的多个照明源,每个照明源可操作以产生至少一个相应的照明光束以照亮工件的至少一部分,其中每个光束具有不同的相应颜色。 该系统还包括位于工件附近的至少一个摄像机,其可操作以捕获包括入射在其上的照明光束的工件的至少一部分的至少一个图像。 此外,该系统包括能够基于由照相机获取的图像提供表示工件的同时二维和三维信息的数据系统。

    UNIFORM EPI-ILLUMINATION OF PLANAR SAMPLES
    79.
    发明申请
    UNIFORM EPI-ILLUMINATION OF PLANAR SAMPLES 有权
    平面图的均匀平面图

    公开(公告)号:US20130223056A1

    公开(公告)日:2013-08-29

    申请号:US13740590

    申请日:2013-01-14

    Abstract: A planar sample, particularly of the type used in biological laboratories for detection and sometimes analysis of two-dimensional arrays of proteins, nucleic acids, or other biological species, is illuminated by epi-illumination using optically filtered line lights that are arranged along opposing parallel sides of a rectangle in which the sample array resides, with two coaxial line lights on each side of the rectangle, and the two on any given side being separated by a gap whose optimal width depends on the wavelength band transmitted by the optical filter. Surprisingly, the gap eliminates the peak in intensity at the center of the sample area and the decrease that occurs from the center outward that would otherwise occur with a single continuous filtered line light, producing instead a substantially uniform intensity along the direction parallel to the line lights.

    Abstract translation: 平面样品,特别是用于生物实验室中用于检测和有时分析蛋白质,核酸或其他生物物种的二维阵列的类型的样品,通过使用沿着相对的平行排列的光学滤波的线光照射外照射 样品阵列所在的矩形的边,在矩形的每一侧上具有两根同轴线灯,并且任意给定侧上的两根被间隔开,该间隙的最佳宽度取决于由滤光器传输的波长带。 令人惊奇的是,间隙消除了样品区域中心处的强度峰值以及从中心向外发生的减少,否则会出现与单个连续过滤线条光线相反的方向,沿着平行于该线条的方向产生基本均匀的强度 灯光

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