SEMICONDUCTOR DEVICE
    81.
    发明公开

    公开(公告)号:US20230412169A1

    公开(公告)日:2023-12-21

    申请号:US18331381

    申请日:2023-06-08

    Inventor: Koji TAKAYANAGI

    CPC classification number: H03K17/56

    Abstract: A first P-type transistor and a second P-type transistor are connected in series between a power supply terminal and an output terminal. A first N-type transistor and a second N-type transistor are connected between a ground terminal and a power supply terminal. The second N-type transistor and the second P-type transistor are complementarily turned on and off in accordance with an input signal. A gate voltage control circuit changes at least one of the gate voltage of the P-type transistor whose drain is electrically connected to the output terminal and the gate voltage of the N-type transistor by following the output voltage VOUT of the output terminal while keeping the P-type transistor or the N-type transistor on-states.

    SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

    公开(公告)号:US20230402494A1

    公开(公告)日:2023-12-14

    申请号:US18194802

    申请日:2023-04-03

    Abstract: A semiconductor device includes a wiring layer, a dielectric layer covering the wiring layer, a thin film resistor provided on the dielectric layer, and a plug electrode connecting the thin film resistor to the wiring layer. The plug electrode includes a barrier layer and a buried layer. The buried layer is configured by the filling portion filling a region surrounded by a first incline surface, and an extension portion extending from the filling portion along a second incline surface. The thin film resistor is in contact with the filling portion and the extension portion of the plug electrode. A second incline angle between the second incline surface and a main surface of a semiconductor substrate is smaller than a first incline angle between the first incline surface and the main surface of the semiconductor substrate.

    SEMICONDUCTOR DEVICE
    83.
    发明公开

    公开(公告)号:US20230402081A1

    公开(公告)日:2023-12-14

    申请号:US18313684

    申请日:2023-05-08

    Inventor: Koichi TAKEDA

    CPC classification number: G11C11/1697 G11C5/08 G11C7/06

    Abstract: A semiconductor device capable of increasing readout margin in a nonvolatile resistive random access memory is provided. A clamping circuit applies fixed potential to each of a memory element and a reference resistive element. A pre-charge circuit pre-charges first and second nodes to power-source potential. A sense amplifier amplifies the potential difference between the potential of the first node and the potential of the second node generated after a discharge period based on cell current and reference current after pre-charging made by the pre-charge circuit. A third node is coupled to the first and second nodes through a capacitor. An electric-charge supply circuit is connected to the third node, and supplies electric charge to the third node in the discharge period.

    SEMICONDUCTOR DEVICE
    85.
    发明公开

    公开(公告)号:US20230387924A1

    公开(公告)日:2023-11-30

    申请号:US18307475

    申请日:2023-04-26

    CPC classification number: H03L7/0998 H03L7/1974

    Abstract: A semiconductor device includes a phase interpolation circuit including an N-bit current digital-analog conversion circuit, a switch circuit, a capacitive element, an inverter, and a control logic circuit. The control logic circuit detects an end of a phase interpolation operation by using an output result of the inverter and outputs a first control signal for turning off the current digital-analog conversion circuit. Also, the control logic circuit detects the end of the phase interpolation operation by using the output result of the inverter and outputs a second control signal for turning off the inverter.

    SEMICONDUCTOR DEVICE
    86.
    发明公开

    公开(公告)号:US20230387901A1

    公开(公告)日:2023-11-30

    申请号:US18303960

    申请日:2023-04-20

    Inventor: Takayuki OOTANI

    CPC classification number: H03K5/131 G06F11/1641 G06F11/1695

    Abstract: A technique for enhancing reliability is provided. A semiconductor device includes a main device which operates in a delayed lockstep mode, a sub device which operates in parallel to the main device in a delayed lockstep mode, a delay circuit which delays an output of the main device, a switching circuit which switches the main device to the sub device according to failure information of the main device.

    SEMICONDUCTOR DEVICE AND CONTROL METHOD FOR THE SAME

    公开(公告)号:US20230376334A1

    公开(公告)日:2023-11-23

    申请号:US17748725

    申请日:2022-05-19

    CPC classification number: G06F9/45558 G06F12/0802 G06F2009/45583

    Abstract: A semiconductor device includes a plurality of processors capable of executing a plurality of virtual machines and a cache memory. Each of the plurality of virtual machines executes a different operating system from each other. A hypervisor sets allocation information so as to allocate ways of the cache memory which can be used by the virtual machine. When outputting a memory access request, each of the processors outputs virtual machine identification in association with the information memory access request. When the memory access request is not a cache hit, the cache memory selects a way to be replaced data based on the virtual machine identification information and the allocation information.

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