NON-VOLATILE MEMORY DEVICE AND METHOD FOR PROGRAMMING THE DEVICE, AND MEMORY SYSTEM
    81.
    发明申请
    NON-VOLATILE MEMORY DEVICE AND METHOD FOR PROGRAMMING THE DEVICE, AND MEMORY SYSTEM 有权
    非易失性存储器件和用于编程器件和存储器系统的方法

    公开(公告)号:US20120039120A1

    公开(公告)日:2012-02-16

    申请号:US13157344

    申请日:2011-06-10

    IPC分类号: G11C16/10 G11C16/04

    摘要: A non-volatile memory device comprises a memory cell array comprising memory cells arranged in rows connected to corresponding word lines and columns connected to corresponding bit lines, a page buffer that stores a program data, a read-write circuit that programs and re-programs the program data into selected memory cells of the memory cell array and reads stored data from the programmed memory cells, and a control circuit that controls the page buffer and the read-write circuit to program the selected memory cells by loaded the program data from in page buffer and to re-program the selected memory cells by re-loaded the program data in the page buffer.

    摘要翻译: 一种非易失性存储器件包括存储单元阵列,该存储单元阵列包括连接到相应的字线和连接到相应位线的列的行中的存储单元,存储程序数据的页缓冲器,用于编程和重新编程的读写电路 将程序数据写入到存储单元阵列的选择的存储单元中,并从编程的存储器单元中读取存储的数据;以及控制电路,其控制页面缓冲器和读写电路,以通过从其中加载程序数据对所选存储单元进行编程 页面缓冲区,并通过重新加载页面缓冲区中的程序数据来重新编程所选择的存储单元。

    Sense Amplifiers Including Multiple Precharge Circuits and Associated Memory Devices and Sensing Methods
    82.
    发明申请
    Sense Amplifiers Including Multiple Precharge Circuits and Associated Memory Devices and Sensing Methods 有权
    包括多个预充电电路和相关存储器件和检测方法的检测放大器

    公开(公告)号:US20080112229A1

    公开(公告)日:2008-05-15

    申请号:US11563746

    申请日:2006-11-28

    IPC分类号: G11C16/06 G11C7/00 G11C11/34

    摘要: A sense amplifier of a flash memory device maintains a bit line precharge level before a memory cell is sensed. The sense amplifier maintains the voltage of a bias signal sufficiently high using a second precharging circuit in a precharging operation to stably maintain the bit line precharge level set by a first precharging circuit. Accordingly, the sense amplifier can correctly sense an OFF cell using the stabilized bit line precharge voltage. Related methods and memory devices are also disclosed.

    摘要翻译: 闪速存储器件的读出放大器在感测存储器单元之前保持位线预充电电平。 读出放大器在预充电操作中使用第二预充电电路来保持偏置信号的电压足够高以稳定地维持由第一预充电电路设置的位线预充电电平。 因此,读出放大器可以使用稳定的位线预充电电压来正确地感测OFF单元。 还公开了相关方法和存储器件。

    Flash memory device and voltage generating circuit for the same
    83.
    发明授权
    Flash memory device and voltage generating circuit for the same 有权
    闪存器件和电压发生电路相同

    公开(公告)号:US07372747B2

    公开(公告)日:2008-05-13

    申请号:US11482447

    申请日:2006-07-07

    IPC分类号: G11C5/14

    CPC分类号: G11C8/08 G11C16/08 G11C16/12

    摘要: A flash memory device and a voltage generating circuit for the same. The flash memory includes a memory cell array configured with a plurality of memory cells, a voltage generating circuit for generating a plurality of constant voltages to be applied to the memory cell array, and a selection circuit for selecting one constant voltage among the plurality of the constant voltages and applying the selected one constant voltage to the memory cell array. The voltage generating circuit discharges a leakage current input by the selection circuit through a voltage division path, which generates the constant voltages.

    摘要翻译: 一种闪存器件及其电压产生电路。 闪存包括配置有多个存储单元的存储单元阵列,用于产生施加到存储单元阵列的多个恒定电压的电压产生电路,以及用于选择多个存储单元中的一个恒定电压的选择电路 将所选择的一个恒定电压施加到存储单元阵列。 电压产生电路通过分压路径对由选择电路输入的漏电流进行放电,产生恒定电压。

    NOR flash memory device with a serial sensing operation and method of sensing data bits in a NOR flash memory device

    公开(公告)号:US20070201277A1

    公开(公告)日:2007-08-30

    申请号:US11789624

    申请日:2007-04-25

    IPC分类号: G11C16/04 G11C16/06 G11C11/34

    CPC分类号: G11C16/26

    摘要: In a NOR flash memory device with a serial sensing operation, and method of sensing data bits in a NOR flash memory device, the device includes a multilevel cell, a sense amplifying circuit, a data buffer, a data latch circuit, and a control logic circuit. The sense amplifying circuit serially detects plural data bits stored in the multilevel cell. The data buffer is provided to buffer the data bit detected by the sense amplifier. The data latch circuit stores an output value of the data buffer for a time. The control logic circuit regulates the sense amplifying circuit to detect a lower data bit stored in the multilevel cell in response to a higher data bit held in the data latch. Here, the control logic circuit initializes an output terminal of the data buffer before or while sensing each of the plural data bits by the sense amplifier. According to the invention, a stabilized serial sensing operation can be conducted because the data line is conditioned to a uniform charge level regardless of the level of the data bit previously sensed.

    NOR flash memory device with a serial sensing operation and method of sensing data bits in a NOR flash memory device
    85.
    发明申请
    NOR flash memory device with a serial sensing operation and method of sensing data bits in a NOR flash memory device 失效
    具有串行感测操作的NOR闪存器件和用于检测NOR闪存器件中的数据位的方法

    公开(公告)号:US20060215449A1

    公开(公告)日:2006-09-28

    申请号:US11263716

    申请日:2005-11-01

    IPC分类号: G11C16/04

    CPC分类号: G11C16/26

    摘要: In a NOR flash memory device with a serial sensing operation, and method of sensing data bits in a NOR flash memory device, the device includes a multilevel cell, a sense amplifying circuit, a data buffer, a data latch circuit, and a control logic circuit. The sense amplifying circuit serially detects plural data bits stored in the multilevel cell. The data buffer is provided to buffer the data bit detected by the sense amplifier. The data latch circuit stores an output value of the data buffer for a time. The control logic circuit regulates the sense amplifying circuit to detect a lower data bit stored in the multilevel cell in response to a higher data bit held in the data latch. Here, the control logic circuit initializes an output terminal of the data buffer before or while sensing each of the plural data bits by the sense amplifier. According to the invention, a stabilized serial sensing operation can be conducted because the data line is conditioned to a uniform charge level regardless of the level of the data bit previously sensed.

    摘要翻译: 在具有串行感测操作的NOR闪存器件中,以及在NOR闪存器件中检测数据位的方法,该器件包括多电平单元,读出放大电路,数据缓冲器,数据锁存电路和控制逻辑 电路。 感测放大电路串行地检测存储在多电平单元中的多个数据位。 提供数据缓冲器以缓冲由读出放大器检测到的数据位。 数据锁存电路一次存储数据缓冲器的输出值。 控制逻辑电路调节感测放大电路,以响应于数据锁存器中保持的较高数据位来检测存储在多电平单元中的较低数据位。 这里,控制逻辑电路在感测放大器感测每个多个数据位之前或期间初始化数据缓冲器的输出端。 根据本发明,可以进行稳定的串行感测操作,因为无论前面感测到的数据位的电平如何,数据线被调节到均匀的电荷电平。

    Memory devices using tri-state buffers to discharge data lines, and methods of operating same
    86.
    发明申请
    Memory devices using tri-state buffers to discharge data lines, and methods of operating same 失效
    使用三态缓冲器来释放数据线的存储器件,以及操作方法

    公开(公告)号:US20060092716A1

    公开(公告)日:2006-05-04

    申请号:US11153508

    申请日:2005-06-15

    IPC分类号: G11C7/10

    摘要: A memory device includes a sense amplifier circuit, a tri-state buffer, a data latch circuit and a data line. The sense amplifier circuit senses and amplifies a current of a memory cell. The tri-state buffer receives an output of the sense amplifier circuit. The data latch circuit latches an output of the tri-state buffer. The data line connects the tri-state buffer and the data latch circuit. The memory device removes charge on the data line using a latch enable signal, which is applied to the tri-state buffer before a read operation.

    摘要翻译: 存储器件包括读出放大器电路,三态缓冲器,数据锁存电路和数据线。 感测放大器电路感测并放大存储器单元的电流。 三态缓冲器接收读出放大器电路的输出。 数据锁存电路锁存三态缓冲器的输出。 数据线连接三态缓冲器和数据锁存电路。 存储器件使用锁存使能信号去除数据线上的电荷,该信号在读取操作之前被施加到三态缓冲器。

    Nonvolatile memory device and method of reading the same

    公开(公告)号:US10043583B2

    公开(公告)日:2018-08-07

    申请号:US15447357

    申请日:2017-03-02

    摘要: Provided are a nonvolatile memory device and a method of performing a sensing operation on the nonvolatile memory device. The nonvolatile memory device includes a control logic coupled to a memory cell array including strings. The control logic is configured to control a first weak-on voltage applied to an unselected string selection line and a second weak-on voltage applied to an unselected ground selection line during a setup interval of the sensing operation for sensing data from a selected string. The unselected string selection line and ground selection line are connected to a string selection transistor and a ground selection transistor, respectively, of a same unselected string. The selected string and the unselected string are connected to a same bit line. The first weak-on voltage and second weak-on voltage are respectively less than a threshold voltage of the string selection transistor and the ground selection transistor in the unselected string.