Abstract:
A system may include acquisition of a supply voltage information representing past supply voltages supplied to an electrical component, acquisition of a temperature information representing past temperatures of the electrical component, and control of a performance characteristic of the electrical component based on the supply voltage information and the temperature information. Some embodiments may further include determination of a reliability margin based on the supply voltage information, the temperature information, and on a reliability specification of the electrical component, and change of the performance characteristic based on the reliability margin.
Abstract:
In some embodiments, a memory array is provided with cells that when written to or read from, can have modified supplies to enhance their read stability and/or write margin performance. Other embodiments may be disclosed and/or claimed.
Abstract:
In one embodiment, a memory array is provided comprising one or more columns each comprising a plurality of bit cells divided into groups of bit cells with each group of bit cells controllably coupled to a separate bit line.
Abstract:
Some embodiments provide a memory cell comprising a body region doped with charge carriers of a first type, a source region disposed in the body region and doped with charge carriers of a second type, and a drain region disposed in the body region and doped with charge carriers of the second type. According to some embodiments, the body region, the source region, and the drain region are oriented in a first direction, the body region and the source region form a first junction, and the body region and the drain region form a second junction. Moreover, a conductivity of the first junction from the body region to the source region in a case that the first junction is unbiased is substantially less than a conductivity of the second junction from the body region to the drain region in a case that the second junction is unbiased. Some embodiments further include a transistor oriented in a second direction, wherein the second direction is not parallel to the first direction.
Abstract:
A method is described that induced dielectric breakdown within a capacitor's dielectric material while driving a current through the capacitor. The current is specific to data that is being written into the capacitor. The method also involves reading the data by interpreting behavior of the capacitor that is determined by the capacitor's resistance, where, the capacitor's resistance is a consequence of the inducing and the driving.
Abstract:
A radiation measuring technique includes adjusting a threshold level of a radiation sensor in a radiation-measuring circuit and obtaining an output signal based on radiation dose sensed by the radiation sensor.
Abstract:
Apparatus and systems, as well as methods and articles, may operate to select a microprocessor clock frequency responsive to a desired voltage and/or a desired temperature of operation.
Abstract:
Some embodiments provide reception of a clock signal, reception of a gating signal, and output of a gated clock signal to a dual edge-triggered-clocked circuit. The gated clock signal is based on the clock signal and on the gating signal.
Abstract:
A transformer is provided that includes a plurality of metal lines and a magnetic material provided about the plurality of metal lines. The magnetic material may include a structure to reduce Eddy currents flowing in the magnetic material. This structure may be a plurality of slots extending perpendicular to the metal lines. This structure may also be a laminated structure.
Abstract:
In some embodiments, a method includes providing an integrated circuit (IC) die in a package. The IC die may have a metal layer on a back surface of the IC die. The method may also include applying a bias signal to the IC die via the metal layer.